{"id":"https://openalex.org/W2078717740","doi":"https://doi.org/10.1109/isscc.2010.5433830","title":"A 12b 22.5/45MS/s 3.0mW 0.059mm<sup>2</sup> CMOS SAR ADC achieving over 90dB SFDR","display_name":"A 12b 22.5/45MS/s 3.0mW 0.059mm<sup>2</sup> CMOS SAR ADC achieving over 90dB SFDR","publication_year":2010,"publication_date":"2010-02-01","ids":{"openalex":"https://openalex.org/W2078717740","doi":"https://doi.org/10.1109/isscc.2010.5433830","mag":"2078717740"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2010.5433830","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2010.5433830","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100330680","display_name":"Wenbo Liu","orcid":"https://orcid.org/0000-0002-2304-7616"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Wenbo Liu","raw_affiliation_strings":["University of Illinois at Urbana-Champaign, Urbana, IL","University of Illinois at Urbana\u2013Champaign, USA"],"affiliations":[{"raw_affiliation_string":"University of Illinois at Urbana-Champaign, Urbana, IL","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"University of Illinois at Urbana\u2013Champaign, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104031015","display_name":"Pingli Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pingli Huang","raw_affiliation_strings":["University of Illinois at Urbana-Champaign, Urbana, IL","University of Illinois at Urbana\u2013Champaign, USA"],"affiliations":[{"raw_affiliation_string":"University of Illinois at Urbana-Champaign, Urbana, IL","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"University of Illinois at Urbana\u2013Champaign, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5047697146","display_name":"Yun Chiu","orcid":"https://orcid.org/0000-0001-5239-4417"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yun Chiu","raw_affiliation_strings":["University of Illinois at Urbana-Champaign, Urbana, IL","University of Illinois at Urbana\u2013Champaign, USA"],"affiliations":[{"raw_affiliation_string":"University of Illinois at Urbana-Champaign, Urbana, IL","institution_ids":["https://openalex.org/I157725225"]},{"raw_affiliation_string":"University of Illinois at Urbana\u2013Champaign, USA","institution_ids":["https://openalex.org/I157725225"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100330680"],"corresponding_institution_ids":["https://openalex.org/I157725225"],"apc_list":null,"apc_paid":null,"fwci":8.6565,"has_fulltext":false,"cited_by_count":97,"citation_normalized_percentile":{"value":0.98278802,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"380","last_page":"381"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9934999942779541,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.9386686086654663},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.8176507949829102},{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.6983770132064819},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6223828792572021},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.6187453269958496},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5565763115882874},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5283097624778748},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.4630812108516693},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4555895924568176},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45513948798179626},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.44359901547431946},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3949539065361023},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35856491327285767},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2603694498538971},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24679863452911377},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.08043026924133301}],"concepts":[{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.9386686086654663},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.8176507949829102},{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.6983770132064819},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6223828792572021},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.6187453269958496},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5565763115882874},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5283097624778748},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.4630812108516693},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4555895924568176},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45513948798179626},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.44359901547431946},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3949539065361023},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35856491327285767},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2603694498538971},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24679863452911377},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.08043026924133301},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2010.5433830","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2010.5433830","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2071865194","https://openalex.org/W2103655129","https://openalex.org/W2167728023","https://openalex.org/W3148484537","https://openalex.org/W6684329464"],"related_works":["https://openalex.org/W2904640696","https://openalex.org/W2752640128","https://openalex.org/W2278942241","https://openalex.org/W2568520569","https://openalex.org/W4206356469","https://openalex.org/W2345299457","https://openalex.org/W2942561789","https://openalex.org/W2418527074","https://openalex.org/W2997894768","https://openalex.org/W2533361262"],"abstract_inverted_index":{"CMOS":[0],"technology":[1],"scaling":[2],"has":[3],"opened":[4],"a":[5,59,65,122,130,137],"pathway":[6],"to":[7,82,110,141],"high-performance":[8],"analog-to-digital":[9],"conversion":[10,27,87],"in":[11],"the":[12,26,32,86,104,111,117],"nanometer":[13],"regime,":[14],"where":[15],"switching":[16,34,114],"is":[17,23,40,126],"preferred":[18],"over":[19],"amplifying.":[20],"Successive-approximation-register":[21],"(SAR)":[22],"one":[24],"of":[25,36,116,144],"architectures":[28],"that":[29],"rely":[30],"on":[31],"high":[33,112],"speed":[35,115],"process":[37],"technology,":[38],"and":[39,52,80,136],"thus":[41],"distinctively":[42],"known":[43],"for":[44,92],"its":[45],"superior":[46],"energy":[47],"efficiency,":[48],"small":[49],"chip":[50],"area,":[51],"good":[53],"digital":[54,132],"compatibility.":[55],"When":[56],"properly":[57],"implemented,":[58],"SAR":[60,93,124],"ADC":[61,94,125],"also":[62],"benefits":[63],"from":[64],"potential":[66],"rail-to-rail":[67],"input":[68,74],"swing,":[69],"100%":[70],"capacitance":[71],"utilization":[72],"during":[73,85],"sampling":[75,98],"(thus":[76],"low":[77],"kT/C":[78],"noise),":[79],"insensitivity":[81],"comparator":[83],"offsets":[84],"process.":[88],"The":[89],"linearity-limiting":[90],"factors":[91],"are":[95],"capacitor":[96],"mismatch,":[97],"switch":[99],"non-idealities,":[100],"as":[101,103],"well":[102],"reference":[105],"voltage":[106],"settling":[107],"issue":[108],"due":[109],"internal":[113],"DAC.":[118],"In":[119],"this":[120],"work,":[121],"sub-radix-2":[123],"presented,":[127],"which":[128],"employs":[129],"perturbation-based":[131],"background":[133],"calibration":[134],"scheme":[135],"dynamic-threshold-comparison":[138],"(DTC)":[139],"technique":[140],"overcome":[142],"some":[143],"these":[145],"performance-limiting":[146],"factors.":[147]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":11},{"year":2014,"cited_by_count":7},{"year":2013,"cited_by_count":16},{"year":2012,"cited_by_count":14}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}