{"id":"https://openalex.org/W2026991888","doi":"https://doi.org/10.1109/isscc.2009.4977430","title":"A fully integrated 24GHz UWB radar sensor for automotive applications","display_name":"A fully integrated 24GHz UWB radar sensor for automotive applications","publication_year":2009,"publication_date":"2009-02-01","ids":{"openalex":"https://openalex.org/W2026991888","doi":"https://doi.org/10.1109/isscc.2009.4977430","mag":"2026991888"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2009.4977430","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2009.4977430","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056497899","display_name":"Egidio Ragonese","orcid":"https://orcid.org/0000-0001-6893-7076"},"institutions":[{"id":"https://openalex.org/I39063666","display_name":"University of Catania","ror":"https://ror.org/03a64bh57","country_code":"IT","type":"education","lineage":["https://openalex.org/I39063666"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"E. Ragonese","raw_affiliation_strings":["Universit\u00e0 di Catania, Catania, Italy","Universita di Catania, Italy,"],"affiliations":[{"raw_affiliation_string":"Universit\u00e0 di Catania, Catania, Italy","institution_ids":["https://openalex.org/I39063666"]},{"raw_affiliation_string":"Universita di Catania, Italy,","institution_ids":["https://openalex.org/I39063666"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022255983","display_name":"A. Scuderi","orcid":"https://orcid.org/0000-0003-0811-7361"},"institutions":[{"id":"https://openalex.org/I39063666","display_name":"University of Catania","ror":"https://ror.org/03a64bh57","country_code":"IT","type":"education","lineage":["https://openalex.org/I39063666"]},{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH","IT"],"is_corresponding":false,"raw_author_name":"A. Scuderi","raw_affiliation_strings":["Universit\u00e0 di Catania, Catania, Italy","STMicroelectronics, Catania Italy"],"affiliations":[{"raw_affiliation_string":"Universit\u00e0 di Catania, Catania, Italy","institution_ids":["https://openalex.org/I39063666"]},{"raw_affiliation_string":"STMicroelectronics, Catania Italy","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021098232","display_name":"Vittorio Giammello","orcid":null},"institutions":[{"id":"https://openalex.org/I39063666","display_name":"University of Catania","ror":"https://ror.org/03a64bh57","country_code":"IT","type":"education","lineage":["https://openalex.org/I39063666"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"V. Giammello","raw_affiliation_strings":["Universit\u00e0 di Catania, Catania, Italy","Universita di Catania, Italy,"],"affiliations":[{"raw_affiliation_string":"Universit\u00e0 di Catania, Catania, Italy","institution_ids":["https://openalex.org/I39063666"]},{"raw_affiliation_string":"Universita di Catania, Italy,","institution_ids":["https://openalex.org/I39063666"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019522836","display_name":"Ettore Messina","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]},{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH","IT"],"is_corresponding":false,"raw_author_name":"E. Messina","raw_affiliation_strings":["STMicroelectronics, Catania, Italy","STMicroelectronics, Catania Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Catania, Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Catania Italy","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019846727","display_name":"Giovanni Palmisano","orcid":"https://orcid.org/0000-0001-9838-6252"},"institutions":[{"id":"https://openalex.org/I39063666","display_name":"University of Catania","ror":"https://ror.org/03a64bh57","country_code":"IT","type":"education","lineage":["https://openalex.org/I39063666"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"G. Palmisano","raw_affiliation_strings":["Universit\u00e0 di Catania, Catania, Italy","Universita di Catania, Italy,"],"affiliations":[{"raw_affiliation_string":"Universit\u00e0 di Catania, Catania, Italy","institution_ids":["https://openalex.org/I39063666"]},{"raw_affiliation_string":"Universita di Catania, Italy,","institution_ids":["https://openalex.org/I39063666"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5056497899"],"corresponding_institution_ids":["https://openalex.org/I39063666"],"apc_list":null,"apc_paid":null,"fwci":4.7852,"has_fulltext":false,"cited_by_count":41,"citation_normalized_percentile":{"value":0.94982967,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11932","display_name":"Wireless Body Area Networks","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6739284992218018},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.6443288922309875},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5521791577339172},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5520294308662415},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.5117464065551758},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.45038583874702454},{"id":"https://openalex.org/keywords/automotive-electronics","display_name":"Automotive electronics","score":0.42742544412612915},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.40559494495391846},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3758879005908966},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3064350485801697},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.18402785062789917}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6739284992218018},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.6443288922309875},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5521791577339172},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5520294308662415},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.5117464065551758},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.45038583874702454},{"id":"https://openalex.org/C2778520156","wikidata":"https://www.wikidata.org/wiki/Q449343","display_name":"Automotive electronics","level":3,"score":0.42742544412612915},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.40559494495391846},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3758879005908966},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3064350485801697},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.18402785062789917},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2009.4977430","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2009.4977430","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1979308383","https://openalex.org/W2057297332","https://openalex.org/W2112012840"],"related_works":["https://openalex.org/W2132658806","https://openalex.org/W2758348730","https://openalex.org/W3210666397","https://openalex.org/W2350662357","https://openalex.org/W2160915513","https://openalex.org/W3036272329","https://openalex.org/W2378051443","https://openalex.org/W2769711664","https://openalex.org/W1995990341","https://openalex.org/W2885986920"],"abstract_inverted_index":{"Radar-based":[0],"advanced":[1],"safety":[2],"systems":[3],"are":[4],"crucial":[5],"to":[6,40,107],"reduce":[7],"road":[8],"accidents":[9],"caused":[10],"by":[11],"driver":[12],"inattention.":[13],"An":[14],"actual":[15],"and":[16,32],"pervasive":[17],"adoption":[18],"of":[19,25,53,68,96],"radar":[20,81],"technology":[21],"requires":[22],"the":[23,50,112],"development":[24],"low-cost":[26],"Silicon-integrated":[27],"sensors,":[28],"including":[29],"microwave,":[30],"analog,":[31],"digital":[33],"blocks":[34],"on":[35,46],"a":[36,65,76,85,97],"single":[37],"chip,":[38],"able":[39],"replace":[41],"existing":[42],"discrete":[43],"electronics":[44],"based":[45],"compound":[47],"semiconductors.":[48],"Indeed,":[49],"considerable":[51],"advantage":[52,95],"silicon":[54],"lies":[55],"in":[56,70,84],"its":[57],"natural":[58],"capability":[59],"for":[60],"integration":[61],"that":[62],"will":[63],"enable":[64],"higher":[66],"level":[67],"complexity":[69],"such":[71],"sensors.":[72],"This":[73],"paper":[74],"presents":[75],"fully":[77],"integrated":[78],"24GHz":[79],"UWD":[80],"sensor":[82,109,115],"implemented":[83],"0.13mum":[86],"SiGe":[87],"BiCMOS":[88],"process.":[89],"The":[90,99],"UWB":[91],"signal":[92],"generation":[93],"takes":[94],"PLL.":[98],"produced":[100],"24.125GHz":[101],"carrier":[102],"is":[103],"properly":[104],"BPSK":[105],"modulated":[106],"increase":[108],"robustness":[110],"within":[111],"entire":[113],"SRR":[114],"network.":[116]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}