{"id":"https://openalex.org/W2078981755","doi":"https://doi.org/10.1109/isscc.2008.4523166","title":"Multi-Slew-Rate Output Driver and Optimized Impedance-Calibration Circuit for 66nm 3.0Gb/s/pin DRAM Interface","display_name":"Multi-Slew-Rate Output Driver and Optimized Impedance-Calibration Circuit for 66nm 3.0Gb/s/pin DRAM Interface","publication_year":2008,"publication_date":"2008-02-01","ids":{"openalex":"https://openalex.org/W2078981755","doi":"https://doi.org/10.1109/isscc.2008.4523166","mag":"2078981755"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2008.4523166","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2008.4523166","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101886189","display_name":"Dong Uk Lee","orcid":"https://orcid.org/0000-0003-4921-0386"},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dong Uk Lee","raw_affiliation_strings":["Hynix Semiconductor Company Limited, Icheon, South Korea","Hynix Semicond., Icheon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hynix Semiconductor Company Limited, Icheon, South Korea","institution_ids":[]},{"raw_affiliation_string":"Hynix Semicond., Icheon","institution_ids":["https://openalex.org/I10654025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049518348","display_name":"Shin Deok Kang","orcid":null},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shin Deok Kang","raw_affiliation_strings":["Hynix Semiconductor Company Limited, Icheon, South Korea","Hynix Semicond., Icheon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hynix Semiconductor Company Limited, Icheon, South Korea","institution_ids":[]},{"raw_affiliation_string":"Hynix Semicond., Icheon","institution_ids":["https://openalex.org/I10654025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011953945","display_name":"Nak Kyu Park","orcid":null},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nak Kyu Park","raw_affiliation_strings":["Hynix Semiconductor Company Limited, Icheon, South Korea","Hynix Semicond., Icheon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hynix Semiconductor Company Limited, Icheon, South Korea","institution_ids":[]},{"raw_affiliation_string":"Hynix Semicond., Icheon","institution_ids":["https://openalex.org/I10654025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100607085","display_name":"Hyun\u2010Woo Lee","orcid":"https://orcid.org/0000-0002-1648-8093"},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hyun Woo Lee","raw_affiliation_strings":["Hynix Semiconductor Company Limited, Icheon, South Korea","Hynix Semicond., Icheon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hynix Semiconductor Company Limited, Icheon, South Korea","institution_ids":[]},{"raw_affiliation_string":"Hynix Semicond., Icheon","institution_ids":["https://openalex.org/I10654025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048059999","display_name":"Young Kyoung Choi","orcid":null},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Young Kyoung Choi","raw_affiliation_strings":["Hynix Semiconductor Company Limited, Icheon, South Korea","Hynix Semicond., Icheon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hynix Semiconductor Company Limited, Icheon, South Korea","institution_ids":[]},{"raw_affiliation_string":"Hynix Semicond., Icheon","institution_ids":["https://openalex.org/I10654025"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Jung Woo Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jung Woo Lee","raw_affiliation_strings":["Hynix Semiconductor Company Limited, Icheon, South Korea","Hynix Semicond., Icheon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hynix Semiconductor Company Limited, Icheon, South Korea","institution_ids":[]},{"raw_affiliation_string":"Hynix Semicond., Icheon","institution_ids":["https://openalex.org/I10654025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082728276","display_name":"Seung Wook Kwack","orcid":null},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Seung Wook Kwack","raw_affiliation_strings":["Hynix Semiconductor Company Limited, Icheon, South Korea","Hynix Semicond., Icheon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hynix Semiconductor Company Limited, Icheon, South Korea","institution_ids":[]},{"raw_affiliation_string":"Hynix Semicond., Icheon","institution_ids":["https://openalex.org/I10654025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025543356","display_name":"Hyeong Ouk Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hyeong Ouk Lee","raw_affiliation_strings":["Hynix Semiconductor Company Limited, Icheon, South Korea","Hynix Semicond., Icheon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hynix Semiconductor Company Limited, Icheon, South Korea","institution_ids":[]},{"raw_affiliation_string":"Hynix Semicond., Icheon","institution_ids":["https://openalex.org/I10654025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063330598","display_name":"Won Joo Yun","orcid":null},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Won Joo Yun","raw_affiliation_strings":["Hynix Semiconductor Company Limited, Icheon, South Korea","Hynix Semicond., Icheon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hynix Semiconductor Company Limited, Icheon, South Korea","institution_ids":[]},{"raw_affiliation_string":"Hynix Semicond., Icheon","institution_ids":["https://openalex.org/I10654025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110223567","display_name":"Sang Hoon Shin","orcid":null},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sang Hoon Shin","raw_affiliation_strings":["Hynix Semiconductor Company Limited, Icheon, South Korea","Hynix Semicond., Icheon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hynix Semiconductor Company Limited, Icheon, South Korea","institution_ids":[]},{"raw_affiliation_string":"Hynix Semicond., Icheon","institution_ids":["https://openalex.org/I10654025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037420672","display_name":"Kwan Weon Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kwan Weon Kim","raw_affiliation_strings":["Hynix Semiconductor Company Limited, Icheon, South Korea","Hynix Semicond., Icheon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hynix Semiconductor Company Limited, Icheon, South Korea","institution_ids":[]},{"raw_affiliation_string":"Hynix Semicond., Icheon","institution_ids":["https://openalex.org/I10654025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101084996","display_name":"Young Jung Choi","orcid":null},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Young Jung Choi","raw_affiliation_strings":["Hynix Semiconductor Company Limited, Icheon, South Korea","Hynix Semicond., Icheon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hynix Semiconductor Company Limited, Icheon, South Korea","institution_ids":[]},{"raw_affiliation_string":"Hynix Semicond., Icheon","institution_ids":["https://openalex.org/I10654025"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008814619","display_name":"Ye Seok Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ye Seok Yang","raw_affiliation_strings":["Hynix Semiconductor Company Limited, Icheon, South Korea","Hynix Semicond., Icheon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hynix Semiconductor Company Limited, Icheon, South Korea","institution_ids":[]},{"raw_affiliation_string":"Hynix Semicond., Icheon","institution_ids":["https://openalex.org/I10654025"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":13,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3392,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.64510166,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/slew-rate","display_name":"Slew rate","score":0.8868640661239624},{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.8770768642425537},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.685552179813385},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6734374761581421},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.5272504091262817},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49296998977661133},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4403068721294403},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3771279454231262},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3692413568496704},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2213398516178131},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17735928297042847},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17433354258537292},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16872769594192505},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.08973613381385803}],"concepts":[{"id":"https://openalex.org/C82517063","wikidata":"https://www.wikidata.org/wiki/Q1591315","display_name":"Slew rate","level":3,"score":0.8868640661239624},{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.8770768642425537},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.685552179813385},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6734374761581421},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.5272504091262817},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49296998977661133},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4403068721294403},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3771279454231262},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3692413568496704},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2213398516178131},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17735928297042847},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17433354258537292},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16872769594192505},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.08973613381385803},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2008.4523166","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2008.4523166","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8199999928474426,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2108900661","https://openalex.org/W2169676602","https://openalex.org/W2176596933","https://openalex.org/W2243540610"],"related_works":["https://openalex.org/W3120961607","https://openalex.org/W2098207691","https://openalex.org/W3148568549","https://openalex.org/W2029904754","https://openalex.org/W2014419659","https://openalex.org/W1648516568","https://openalex.org/W170188723","https://openalex.org/W361036515","https://openalex.org/W4211178602","https://openalex.org/W2269474412"],"abstract_inverted_index":{"In":[0],"this":[1],"work,":[2],"a":[3,61,87],"multi-slew-rate":[4],"output":[5,56,77],"driver":[6,78],"is":[7,35,67,84],"developed":[8],"to":[9,37,47],"cope":[10],"with":[11],"the":[12,17,39,43,54,70,76],"supply":[13],"voltage":[14],"variation":[15],"and":[16,46,69,79],"different":[18],"I/O":[19],"component":[20],"capacitance":[21],"(denoted":[22],"by":[23],"C":[24,49],"<sub":[25,50],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[26,51],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">IO</sub>":[27,52],")":[28],"condition.":[29],"For":[30],"accurate":[31],"data":[32,62],"transfer,":[33],"it":[34],"necessary":[36],"reduce":[38],"design":[40],"loss":[41],"in":[42,53,86],"impedance-calibration":[44],"circuit":[45],"minimize":[48],"coded":[55],"driver.":[57],"With":[58],"these":[59],"methods,":[60],"rate":[63],"of":[64,75],"3":[65],"Gb/s/pin":[66],"achieved":[68],"shmoo":[71],"plot.":[72],"The":[73],"micrograph":[74],"impedance":[80],"calibration":[81],"circuit,":[82],"which":[83],"implemented":[85],"66":[88],"nm":[89],"512":[90],"Mb":[91],"GDDR3":[92],"SDRAM.":[93]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}