{"id":"https://openalex.org/W2153419022","doi":"https://doi.org/10.1109/isscc.2006.1696271","title":"A 1ps-Resolution Jitter-Measurement Macro Using Interpolated Jitter Oversampling","display_name":"A 1ps-Resolution Jitter-Measurement Macro Using Interpolated Jitter Oversampling","publication_year":2006,"publication_date":"2006-01-01","ids":{"openalex":"https://openalex.org/W2153419022","doi":"https://doi.org/10.1109/isscc.2006.1696271","mag":"2153419022"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2006.1696271","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2006.1696271","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111797901","display_name":"Keisuke Nose","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Nose","raw_affiliation_strings":["NEC Limited, Kanagawa, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC Limited, Kanagawa, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020286425","display_name":"M. Kajita","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Kajita","raw_affiliation_strings":["NEC Limited, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC Limited, Tokyo, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045168120","display_name":"Masayuki Mizuno","orcid":"https://orcid.org/0000-0002-1924-9856"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Mizuno","raw_affiliation_strings":["NEC Limited, Kanagawa, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NEC Limited, Kanagawa, Japan","institution_ids":["https://openalex.org/I118347220"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":7.6686,"has_fulltext":false,"cited_by_count":71,"citation_normalized_percentile":{"value":0.9755398,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"2112","last_page":"2121"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.965587854385376},{"id":"https://openalex.org/keywords/oversampling","display_name":"Oversampling","score":0.8616231679916382},{"id":"https://openalex.org/keywords/vernier-scale","display_name":"Vernier scale","score":0.609500527381897},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5594571828842163},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.4483819305896759},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.15260618925094604},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13517609238624573},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.12921249866485596},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1251809298992157},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.06456604599952698},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.05163782835006714}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.965587854385376},{"id":"https://openalex.org/C197323446","wikidata":"https://www.wikidata.org/wiki/Q331222","display_name":"Oversampling","level":3,"score":0.8616231679916382},{"id":"https://openalex.org/C69710193","wikidata":"https://www.wikidata.org/wiki/Q14946576","display_name":"Vernier scale","level":2,"score":0.609500527381897},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5594571828842163},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.4483819305896759},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.15260618925094604},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13517609238624573},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.12921249866485596},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1251809298992157},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.06456604599952698},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.05163782835006714}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2006.1696271","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2006.1696271","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1504521093","https://openalex.org/W1581372012","https://openalex.org/W2062952706","https://openalex.org/W2117917559","https://openalex.org/W2124256021","https://openalex.org/W2130122989","https://openalex.org/W2152259598","https://openalex.org/W6630130485"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2766503024","https://openalex.org/W2781247653","https://openalex.org/W4206637278","https://openalex.org/W4386005305","https://openalex.org/W4386214543","https://openalex.org/W2107482880","https://openalex.org/W2119823365"],"abstract_inverted_index":{"An":[0],"in-field":[1],"real-time":[2],"successive":[3],"jitter-measurement":[4,25],"macro":[5],"is":[6],"developed.":[7],"It":[8],"features":[9],"interpolated":[10],"jitter":[11,35],"oversampling":[12],"and":[13,21,33],"feedforward":[14],"calibration":[15],"that":[16,27],"help":[17],"attain":[18],"1ps":[19],"resolution":[20],"a":[22],"hierarchical":[23],"Vernier":[24],"technique":[26],"exploits":[28],"the":[29],"trade-off":[30],"between":[31],"rms":[32],"deterministic":[34],"measurement":[36],"characteristics":[37]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":7},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}