{"id":"https://openalex.org/W2166500516","doi":"https://doi.org/10.1109/isscc.2006.1696224","title":"Optical interconnect technologies for high-speed VLSI chips using silicon nano-photonics","display_name":"Optical interconnect technologies for high-speed VLSI chips using silicon nano-photonics","publication_year":2006,"publication_date":"2006-01-01","ids":{"openalex":"https://openalex.org/W2166500516","doi":"https://doi.org/10.1109/isscc.2006.1696224","mag":"2166500516"},"language":"en","primary_location":{"id":"doi:10.1109/isscc.2006.1696224","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2006.1696224","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046102207","display_name":"Keishi Ohashi","orcid":"https://orcid.org/0000-0002-3431-0053"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"K. Ohashi","raw_affiliation_strings":["NEC Limited, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Limited, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021824492","display_name":"Junichi Fujikata","orcid":"https://orcid.org/0000-0002-1555-1118"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"J. Fujikata","raw_affiliation_strings":["NEC Limited, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Limited, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082400581","display_name":"M. Nakada","orcid":"https://orcid.org/0000-0002-9155-3932"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Nakada","raw_affiliation_strings":["NEC Limited, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Limited, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020646436","display_name":"Tsutomu Ishi","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Ishi","raw_affiliation_strings":["NEC Limited, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Limited, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013240857","display_name":"Kenichi Nishi","orcid":"https://orcid.org/0000-0002-0189-9252"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Nishi","raw_affiliation_strings":["NEC Limited, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Limited, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026765551","display_name":"Hidenori Yamada","orcid":"https://orcid.org/0000-0002-6371-0128"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Yamada","raw_affiliation_strings":["NEC Limited, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Limited, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036021200","display_name":"M. Fukaishi","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Fukaishi","raw_affiliation_strings":["NEC Limited, Sagamihara, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Limited, Sagamihara, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045168120","display_name":"Masayuki Mizuno","orcid":"https://orcid.org/0000-0002-1924-9856"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"M. Mizuno","raw_affiliation_strings":["NEC Limited, Sagamihara, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Limited, Sagamihara, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111797901","display_name":"Keisuke Nose","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Nose","raw_affiliation_strings":["NEC Limited, Sagamihara, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Limited, Sagamihara, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091457815","display_name":"I. Ogura","orcid":"https://orcid.org/0000-0002-2351-195X"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"I. Ogura","raw_affiliation_strings":["NEC Limited, Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Limited, Kawasaki, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055962153","display_name":"Yutaka Urino","orcid":"https://orcid.org/0000-0001-8254-5562"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Urino","raw_affiliation_strings":["NEC Limited, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Limited, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110279873","display_name":"T. Baba","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Baba","raw_affiliation_strings":["NEC Limited, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"NEC Limited, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":12,"corresponding_author_ids":["https://openalex.org/A5046102207"],"corresponding_institution_ids":["https://openalex.org/I118347220"],"apc_list":null,"apc_paid":null,"fwci":3.3848,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.92409576,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"1686","last_page":"1695"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10666","display_name":"Photonic Crystals and Applications","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/photodiode","display_name":"Photodiode","score":0.834038257598877},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6769716143608093},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6657041311264038},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.6357210278511047},{"id":"https://openalex.org/keywords/photonics","display_name":"Photonics","score":0.5642159581184387},{"id":"https://openalex.org/keywords/silicon-photonics","display_name":"Silicon photonics","score":0.5478824973106384},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5349218845367432},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.5324531197547913},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.5219359397888184},{"id":"https://openalex.org/keywords/parasitic-capacitance","display_name":"Parasitic capacitance","score":0.5161765217781067},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38886117935180664},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36002418398857117},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.34044215083122253},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2031048834323883},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17165732383728027}],"concepts":[{"id":"https://openalex.org/C751236","wikidata":"https://www.wikidata.org/wiki/Q175943","display_name":"Photodiode","level":2,"score":0.834038257598877},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6769716143608093},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6657041311264038},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.6357210278511047},{"id":"https://openalex.org/C20788544","wikidata":"https://www.wikidata.org/wiki/Q467054","display_name":"Photonics","level":2,"score":0.5642159581184387},{"id":"https://openalex.org/C119423029","wikidata":"https://www.wikidata.org/wiki/Q3749103","display_name":"Silicon photonics","level":3,"score":0.5478824973106384},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5349218845367432},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.5324531197547913},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.5219359397888184},{"id":"https://openalex.org/C154318817","wikidata":"https://www.wikidata.org/wiki/Q2157249","display_name":"Parasitic capacitance","level":4,"score":0.5161765217781067},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38886117935180664},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36002418398857117},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34044215083122253},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2031048834323883},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17165732383728027},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isscc.2006.1696224","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isscc.2006.1696224","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6700000166893005}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W370801252","https://openalex.org/W1996408406","https://openalex.org/W2036962371","https://openalex.org/W2114494402","https://openalex.org/W2162686316","https://openalex.org/W2165648623","https://openalex.org/W6612627003"],"related_works":["https://openalex.org/W2802439887","https://openalex.org/W2058545256","https://openalex.org/W4396689093","https://openalex.org/W2394034449","https://openalex.org/W2904654231","https://openalex.org/W4210807885","https://openalex.org/W2051045034","https://openalex.org/W2248915580","https://openalex.org/W2999380399","https://openalex.org/W4304890870"],"abstract_inverted_index":{"Optoelectronic":[0],"and":[1,122,128],"electrooptic":[2],"elements":[3],"are":[4],"integrated":[5],"on":[6,71,78],"VLSI":[7],"chips.":[8,73],"The":[9,95,107],"junction":[10],"capacitance":[11,84],"of":[12,103],"a":[13,21,51,63],"nano-photodiode":[14,115],"is":[15],"extremely":[16,81],"low":[17,82],"(<10aF),":[18],"which":[19],"permits":[20],"high":[22,34,52,93],"load":[23],"resistance":[24],"to":[25,105],"be":[26,117],"used,":[27],"resulting":[28],"in":[29],"higher":[30],"output":[31],"voltage":[32],"at":[33,91],"frequencies.":[35,94],"A":[36],"ceramic":[37],"Pb(,ZrTi)O":[38],"<sub":[39],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[40],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">3":[41],"</sub>":[42],"film":[43],"with":[44,80,100],"average":[45],"crystallite":[46],"diameter":[47],"below":[48],"20nm":[49],"has":[50],"electro-optical":[53],"coefficient":[54],"(>150pm/V)":[55],"suitable":[56],"for":[57,66,119,126],"on-chip":[58,127],"modulators.":[59],"This":[60,74],"paper":[61],"introduces":[62],"new":[64],"approach":[65],"realizing":[67],"high-speed":[68],"optical":[69,130],"interconnects":[70],"silicon":[72,79,114],"concept":[75],"uses":[76],"nano-photodiodes":[77],"parasitic":[83],"(less":[85],"than":[86],"10aF)":[87],"enabling":[88],"robust":[89],"communication":[90],"very":[92],"results":[96],"demonstrate":[97],"5GHz":[98],"clocking":[99],"the":[101,113],"promise":[102],"up":[104],"20GHz.":[106],"authors":[108],"will":[109],"also":[110],"discuss":[111],"how":[112],"can":[116],"used":[118],"wavelength-division":[120],"multiplexing":[121],"low-voltage":[123],"electro-optic":[124],"modulators":[125],"off-chip":[129],"communications":[131]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}