{"id":"https://openalex.org/W7162679456","doi":"https://doi.org/10.1109/isqed69900.2026.11534698","title":"Characterization of the Stability of DRAM Read Disturbances","display_name":"Characterization of the Stability of DRAM Read Disturbances","publication_year":2026,"publication_date":"2026-04-08","ids":{"openalex":"https://openalex.org/W7162679456","doi":"https://doi.org/10.1109/isqed69900.2026.11534698"},"language":"en","primary_location":{"id":"doi:10.1109/isqed69900.2026.11534698","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed69900.2026.11534698","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 27th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5116055924","display_name":"Roberto Capoferri","orcid":null},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Roberto Capoferri","raw_affiliation_strings":["Politecnico di Milano,DEIB,Milano,IT"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Milano,DEIB,Milano,IT","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061596244","display_name":"Alessandro Barenghi","orcid":"https://orcid.org/0000-0003-0840-6358"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Alessandro Barenghi","raw_affiliation_strings":["Politecnico di Milano,DEIB,Milano,IT"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Milano,DEIB,Milano,IT","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006809009","display_name":"Luca Breveglieri","orcid":"https://orcid.org/0000-0001-5294-6840"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Luca Breveglieri","raw_affiliation_strings":["Politecnico di Milano,DEIB,Milano,IT"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Milano,DEIB,Milano,IT","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070712086","display_name":"Khalil Gammoh","orcid":"https://orcid.org/0000-0002-9999-3246"},"institutions":[{"id":"https://openalex.org/I11912373","display_name":"Micron (United States)","ror":"https://ror.org/02fv52296","country_code":"US","type":"company","lineage":["https://openalex.org/I11912373"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Khalil Gammoh","raw_affiliation_strings":["Micron,Boise,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Micron,Boise,USA","institution_ids":["https://openalex.org/I11912373"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5137273360","display_name":"Niccol\u00f2 Izzo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210152301","display_name":"Azienda Ospedaliera di Desio e Vimercate","ror":"https://ror.org/055redd10","country_code":"IT","type":"healthcare","lineage":["https://openalex.org/I4210152301"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Niccol\u00f2 Izzo","raw_affiliation_strings":["Micron,Vimercate,IT"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Micron,Vimercate,IT","institution_ids":["https://openalex.org/I4210152301"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059940813","display_name":"Gerardo Pelosi","orcid":"https://orcid.org/0000-0002-3812-5429"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Gerardo Pelosi","raw_affiliation_strings":["Politecnico di Milano,DEIB,Milano,IT"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Milano,DEIB,Milano,IT","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.27469998598098755,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.27469998598098755,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.18529999256134033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.16060000658035278,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.5734999775886536},{"id":"https://openalex.org/keywords/stability","display_name":"Stability (learning theory)","score":0.5586000084877014},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.5250999927520752},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.3441999852657318},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3248000144958496}],"concepts":[{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.5734999775886536},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.5586000084877014},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5250999927520752},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4318999946117401},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3472999930381775},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.3441999852657318},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3248000144958496},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.31690001487731934},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2775000035762787},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.24269999563694}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/isqed69900.2026.11534698","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed69900.2026.11534698","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 27th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},{"id":"pmh:oai:re.public.polimi.it:11311/1316925","is_oa":false,"landing_page_url":"https://hdl.handle.net/11311/1316925","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","score":0.4900173544883728,"display_name":"Climate action"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1970426108","https://openalex.org/W1995875735","https://openalex.org/W2088455835","https://openalex.org/W2131862714","https://openalex.org/W2146715387","https://openalex.org/W2163518473","https://openalex.org/W2483049553","https://openalex.org/W2500740922","https://openalex.org/W2530364902","https://openalex.org/W2624299682","https://openalex.org/W2628319348","https://openalex.org/W2794455201","https://openalex.org/W2794842046","https://openalex.org/W2897830755","https://openalex.org/W2939057911","https://openalex.org/W2951971174","https://openalex.org/W2969618534","https://openalex.org/W3107080613","https://openalex.org/W4206782120","https://openalex.org/W4245276998","https://openalex.org/W4390873918","https://openalex.org/W4396949286","https://openalex.org/W4400499063"],"related_works":[],"abstract_inverted_index":{"Read":[0],"disturbance":[1,70],"phenomena,":[2],"such":[3],"as":[4],"RowHammer":[5],"and":[6,108,161],"RowPress,":[7],"are":[8,152,162,198],"well-known":[9],"causes":[10],"for":[11,201],"data":[12,46,75,106],"corruption":[13],"in":[14,47,116,167],"DRAM":[15,119,133,141,159],"memories,":[16],"which":[17],"have":[18],"been":[19],"shown":[20],"to":[21,44],"constitute":[22],"exploitable":[23],"security":[24],"vulnerabilities.":[25],"Indeed,":[26],"both":[27],"phenomena":[28],"alter":[29],"the":[30,68,74,80,88,103,109,113,132,145,168,185],"memory":[31,48],"locations":[32,49],"nearby":[33],"a":[34,62,92,126,157,179,191],"row":[35],"that":[36,50,73,144,195],"is":[37],"targeted":[38],"by":[39,55,149,190],"an":[40],"attacker,":[41],"potentially":[42],"leading":[43],"writing":[45],"should":[51],"not":[52],"be":[53],"accessible":[54],"her.":[56],"In":[57],"this":[58,98],"work,":[59],"we":[60,84,100],"take":[61],"constructive":[63],"point":[64],"of":[65,90,105,112],"view":[66],"on":[67,79,138],"read":[69,150,192],"phenomena.":[71],"Observing":[72],"alteration":[76,107],"patterns":[77,115,147],"depend":[78],"single":[81,158],"device":[82],"instance,":[83],"characterize":[85],"them":[86],"with":[87,178],"intent":[89],"building":[91],"Physically":[93],"Unclonable":[94],"Function":[95],"(PUF).":[96],"To":[97],"end,":[99],"specifically":[101],"analyze":[102],"repeatability":[104],"information":[110,181],"content":[111,182],"bitflip":[114,146,187],"modern":[117],"DDR5":[118,140],"memories.":[120],"This":[121],"analysis":[122],"would":[123],"also":[124],"enable":[125],"PUF":[127],"implementation":[128],"fully":[129],"contained":[130],"within":[131],"module.":[134],"Our":[135],"experimental":[136],"results":[137],"multiple":[139],"chips":[142],"show":[143],"caused":[148],"disturbances":[151],"remarkably":[153],"stable":[154],"when":[155],"considering":[156],"row,":[160],"essentially":[163],"independent":[164],"across":[165,172],"rows":[166],"same":[169],"bank,":[170],"or":[171],"different":[173],"devices.":[174],"These":[175],"results,":[176],"combined":[177],"significant":[180],"coming":[183],"from":[184],"unique":[186],"pattern":[188],"produced":[189],"disturbance,":[193],"suggest":[194],"read-disturbance-based":[196],"PUFs":[197],"promising":[199],"candidates":[200],"future":[202],"implementations.":[203]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2026-05-29T00:00:00"}