{"id":"https://openalex.org/W4410887768","doi":"https://doi.org/10.1109/isqed65160.2025.11014331","title":"Deep Learning-Based ASM-ESD Forward I-V Parameter Extraction","display_name":"Deep Learning-Based ASM-ESD Forward I-V Parameter Extraction","publication_year":2025,"publication_date":"2025-04-23","ids":{"openalex":"https://openalex.org/W4410887768","doi":"https://doi.org/10.1109/isqed65160.2025.11014331"},"language":"en","primary_location":{"id":"doi:10.1109/isqed65160.2025.11014331","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed65160.2025.11014331","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 26th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033850468","display_name":"Fredo Chavez","orcid":"https://orcid.org/0000-0002-5046-6832"},"institutions":[{"id":"https://openalex.org/I99043593","display_name":"Macquarie University","ror":"https://ror.org/01sf06y89","country_code":"AU","type":"education","lineage":["https://openalex.org/I99043593"]}],"countries":["AU"],"is_corresponding":true,"raw_author_name":"Fredo Chavez","raw_affiliation_strings":["Macquarie University,Australia"],"affiliations":[{"raw_affiliation_string":"Macquarie University,Australia","institution_ids":["https://openalex.org/I99043593"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070251221","display_name":"Sourabh Khandelwal","orcid":"https://orcid.org/0000-0001-8833-6462"},"institutions":[{"id":"https://openalex.org/I99043593","display_name":"Macquarie University","ror":"https://ror.org/01sf06y89","country_code":"AU","type":"education","lineage":["https://openalex.org/I99043593"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Sourabh Khandelwal","raw_affiliation_strings":["Macquarie University,Australia"],"affiliations":[{"raw_affiliation_string":"Macquarie University,Australia","institution_ids":["https://openalex.org/I99043593"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5033850468"],"corresponding_institution_ids":["https://openalex.org/I99043593"],"apc_list":null,"apc_paid":null,"fwci":1.6627,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.84842285,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrostatic-discharge","display_name":"Electrostatic discharge","score":0.5998953580856323},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5684436559677124},{"id":"https://openalex.org/keywords/extraction","display_name":"Extraction (chemistry)","score":0.5256227850914001},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4802965819835663},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.424361914396286},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2599804997444153},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2128235399723053},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.07285380363464355}],"concepts":[{"id":"https://openalex.org/C205483674","wikidata":"https://www.wikidata.org/wiki/Q3574961","display_name":"Electrostatic discharge","level":3,"score":0.5998953580856323},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5684436559677124},{"id":"https://openalex.org/C4725764","wikidata":"https://www.wikidata.org/wiki/Q844704","display_name":"Extraction (chemistry)","level":2,"score":0.5256227850914001},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4802965819835663},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.424361914396286},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2599804997444153},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2128235399723053},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.07285380363464355},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed65160.2025.11014331","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed65160.2025.11014331","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 26th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2342585796","https://openalex.org/W4225307293"],"related_works":["https://openalex.org/W2731899572","https://openalex.org/W3215138031","https://openalex.org/W3009238340","https://openalex.org/W4360585206","https://openalex.org/W4321369474","https://openalex.org/W4285208911","https://openalex.org/W3082895349","https://openalex.org/W4213079790","https://openalex.org/W2248239756","https://openalex.org/W3086377361"],"abstract_inverted_index":{"The":[0],"parameter":[1],"extraction":[2],"process":[3],"for":[4,9,38],"the":[5,40,47],"advanced":[6],"SPICE":[7],"model":[8,46],"electrostatic":[10],"discharge":[11],"diodes":[12],"(ASM-ESD)":[13],"requires":[14],"expert":[15],"knowledge":[16],"and":[17,31],"can":[18],"take":[19],"several":[20],"minutes":[21],"to":[22,24,45],"hours":[23],"finish.":[25],"This":[26],"paper":[27],"presents":[28],"a":[29,53],"fast":[30],"accurate":[32],"deep":[33],"learning":[34],"(DL)":[35],"based":[36],"methodology":[37],"extracting":[39],"ASM-ESD":[41],"Forward":[42],"I-V":[43],"parameters":[44],"transmission":[48],"line":[49],"pulse":[50],"(TLP)-IV":[51],"of":[52],"device.":[54]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-03-04T09:10:02.777135","created_date":"2025-10-10T00:00:00"}