{"id":"https://openalex.org/W2942059745","doi":"https://doi.org/10.1109/isqed.2019.8697831","title":"Automatic Test Pattern Generation for Double Stuck-at Faults Based on Test Patterns of Single Faults","display_name":"Automatic Test Pattern Generation for Double Stuck-at Faults Based on Test Patterns of Single Faults","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2942059745","doi":"https://doi.org/10.1109/isqed.2019.8697831","mag":"2942059745"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2019.8697831","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2019.8697831","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"20th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101848561","display_name":"Peikun Wang","orcid":"https://orcid.org/0000-0001-6625-7499"},"institutions":[{"id":"https://openalex.org/I14396692","display_name":"Tokyo University of Information Sciences","ror":"https://ror.org/044bdx604","country_code":"JP","type":"education","lineage":["https://openalex.org/I14396692"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Peikun Wang","raw_affiliation_strings":["Dept. of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, JAPAN"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, JAPAN","institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053471252","display_name":"Amir Masoud Gharehbaghi","orcid":"https://orcid.org/0000-0002-0451-221X"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Amir Masoud Gharehbaghi","raw_affiliation_strings":["VLSI Design and Education Center, The University of Tokyo, Tokyo, JAPAN"],"affiliations":[{"raw_affiliation_string":"VLSI Design and Education Center, The University of Tokyo, Tokyo, JAPAN","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027837299","display_name":"Masahiro Fujita","orcid":"https://orcid.org/0000-0002-6516-4175"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masahiro Fujita","raw_affiliation_strings":["VLSI Design and Education Center, The University of Tokyo, Tokyo, JAPAN"],"affiliations":[{"raw_affiliation_string":"VLSI Design and Education Center, The University of Tokyo, Tokyo, JAPAN","institution_ids":["https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5101848561"],"corresponding_institution_ids":["https://openalex.org/I14396692","https://openalex.org/I74801974"],"apc_list":null,"apc_paid":null,"fwci":0.7223,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.66684059,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"c 100","issue":null,"first_page":"284","last_page":"290"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.8748117685317993},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7046023607254028},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6531906127929688},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5327575206756592},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5273457765579224},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.4962461590766907},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.45134657621383667},{"id":"https://openalex.org/keywords/cover","display_name":"Cover (algebra)","score":0.43372589349746704},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4328959882259369},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.42805689573287964},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.37764692306518555},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.3259000778198242},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15003305673599243},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08985662460327148}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.8748117685317993},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7046023607254028},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6531906127929688},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5327575206756592},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5273457765579224},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.4962461590766907},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.45134657621383667},{"id":"https://openalex.org/C2780428219","wikidata":"https://www.wikidata.org/wiki/Q16952335","display_name":"Cover (algebra)","level":2,"score":0.43372589349746704},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4328959882259369},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.42805689573287964},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.37764692306518555},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3259000778198242},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15003305673599243},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08985662460327148},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2019.8697831","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2019.8697831","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"20th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1528837436","https://openalex.org/W1836933035","https://openalex.org/W1998405506","https://openalex.org/W2017974968","https://openalex.org/W2043080135","https://openalex.org/W2047503989","https://openalex.org/W2098850317","https://openalex.org/W2111701647","https://openalex.org/W2138843016","https://openalex.org/W2152406824","https://openalex.org/W2159880265","https://openalex.org/W2533852066","https://openalex.org/W2560525892","https://openalex.org/W2770678416","https://openalex.org/W4245450710","https://openalex.org/W6655136045","https://openalex.org/W6683667564"],"related_works":["https://openalex.org/W2786111245","https://openalex.org/W3009953521","https://openalex.org/W4285708951","https://openalex.org/W1991935474","https://openalex.org/W2340957901","https://openalex.org/W2021253405","https://openalex.org/W2091533492","https://openalex.org/W2098752843","https://openalex.org/W1507615093","https://openalex.org/W2489339098"],"abstract_inverted_index":{"Multiple":[0],"faults":[1,36,43,191,198,214],"are":[2],"more":[3],"likely":[4],"to":[5,32,72,92,147,231,241],"occur":[6],"in":[7,19,86,173],"the":[8,20,29,41,45,49,55,64,75,79,106,111,115,119,129,149,155,161,164,170,193,203,211,220,244],"fabricated":[9],"circuits":[10,194],"since":[11],"they":[12],"have":[13,24],"been":[14,25],"becoming":[15],"larger":[16],"and":[17,52,78,132,143,154],"denser":[18],"past":[21],"decades.":[22],"There":[23],"researches":[26],"that":[27,179,215],"propose":[28,97],"ATPG":[30,100],"method":[31,101,181,205],"deal":[33],"with":[34],"double":[35,76,107,189,213],"by":[37,44,114,125],"quickly":[38,183],"selecting":[39],"all":[40,74,105,110,128,243],"undetected":[42,61],"test":[46,57,66,80,186,208,221,233],"patterns":[47,58,67,187,209,222,234],"for":[48,59,188,210,223,235],"single":[50,196,224],"fault,":[51],"then":[53],"generating":[54],"additional":[56],"those":[60,94],"faults.":[62,246],"However,":[63],"generated":[65],"may":[68],"not":[69],"be":[70,84,200,217,228],"complete":[71],"cover":[73,242],"faults,":[77,108,225,237,239],"generation":[81],"process":[82],"cannot":[83,216],"completed":[85],"an":[87,98],"acceptable":[88],"runtime.":[89],"In":[90],"order":[91],"solve":[93],"problems,":[95],"we":[96,167],"improved":[99],"which":[102,177],"can":[103,182,199,227],"detect":[104],"covering":[109],"cases":[112],"overlooked":[113],"previous":[116],"research.":[117],"Moreover,":[118],"execution":[120],"time":[121],"is":[122],"significantly":[123],"reduced":[124],"adequately":[126],"integrating":[127],"external":[130],"tools":[131],"programs,":[133],"as":[134,136,140],"well":[135],"employing":[137],"strategies":[138],"such":[139],"circuit":[141],"partitioning":[142],"bit":[144],"parallel":[145],"processing":[146],"accelerate":[148],"speed":[150],"of":[151,163],"fault":[152],"simulation":[153],"SAT":[156],"process.":[157],"To":[158],"fully":[159],"understand":[160],"performance":[162],"proposed":[165,204],"method,":[166],"comprehensively":[168],"analyze":[169],"experimental":[171],"results":[172],"several":[174],"different":[175],"aspects,":[176],"demonstrate":[178],"our":[180],"generate":[184,232],"compact":[185],"stuck-at":[190,197],"on":[192],"whose":[195],"generated.":[201],"Since":[202],"efficiently":[206],"generates":[207],"remaining":[212],"detected":[218],"given":[219],"it":[226],"inductively":[229],"extended":[230],"triple":[236],"quadruple":[238],"...,":[240],"multiple":[245]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}