{"id":"https://openalex.org/W2801809960","doi":"https://doi.org/10.1109/isqed.2018.8357280","title":"Body-biasing assisted vmin optimization for 5nm-node multi-Vt FD-SOI 6T-SRAM","display_name":"Body-biasing assisted vmin optimization for 5nm-node multi-Vt FD-SOI 6T-SRAM","publication_year":2018,"publication_date":"2018-03-01","ids":{"openalex":"https://openalex.org/W2801809960","doi":"https://doi.org/10.1109/isqed.2018.8357280","mag":"2801809960"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2018.8357280","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2018.8357280","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 19th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085342240","display_name":"Jheng-Yi Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jheng-Yi Chen","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013381366","display_name":"Ming-Yu Chang","orcid":"https://orcid.org/0009-0009-3351-0262"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ming-Yu Chang","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055000437","display_name":"Shihao Chen","orcid":"https://orcid.org/0000-0001-7646-8003"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shi-Hao Chen","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084827358","display_name":"Jia\u2010Wei Lee","orcid":"https://orcid.org/0000-0002-3336-8050"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jia-Wei Lee","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085545279","display_name":"Meng\u2010Hsueh Chiang","orcid":"https://orcid.org/0000-0003-4789-6302"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Meng-Hsueh Chiang","raw_affiliation_strings":["Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I91807558"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"30","issue":null,"first_page":"151","last_page":"155"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.693322479724884},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6228655576705933},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.6133636236190796},{"id":"https://openalex.org/keywords/silicon-on-insulator","display_name":"Silicon on insulator","score":0.6072408556938171},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46176642179489136},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.4344174861907959},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.408670574426651},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.33776411414146423},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3179875314235687},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24722471833229065},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.18623045086860657},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17761951684951782},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.16528040170669556},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.1525324583053589}],"concepts":[{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.693322479724884},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6228655576705933},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.6133636236190796},{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.6072408556938171},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46176642179489136},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.4344174861907959},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.408670574426651},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.33776411414146423},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3179875314235687},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24722471833229065},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.18623045086860657},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17761951684951782},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.16528040170669556},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.1525324583053589},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2018.8357280","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2018.8357280","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 19th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7200000286102295,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W347657323","https://openalex.org/W2002612140","https://openalex.org/W2119143252","https://openalex.org/W2275545695"],"related_works":["https://openalex.org/W2104300577","https://openalex.org/W4206445530","https://openalex.org/W2771786520","https://openalex.org/W3151633427","https://openalex.org/W2810180604","https://openalex.org/W2325281603","https://openalex.org/W2069427488","https://openalex.org/W2944964251","https://openalex.org/W2042526628","https://openalex.org/W2053448087"],"abstract_inverted_index":{"This":[0],"work":[1],"proposes":[2],"a":[3,89],"body-biasing":[4],"technique":[5,87],"to":[6,76],"optimize":[7],"V":[8,32,50,78],"<sub":[9,19,33,51],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[10,20,34,52],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">min</sub>":[11,35,53],"of":[12,58,82],"the":[13,26,29,45,48,59,71,94,101],"6T-SRAM":[14],"based":[15],"on":[16],"5nm-node":[17],"multi-V":[18],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">t</sub>":[21],"FD-SOI":[22],"devices.":[23],"Accounting":[24],"for":[25,56,92],"process":[27,106],"variation,":[28],"operating":[30],"voltage,":[31],",":[36],"is":[37,54,74],"estimated":[38],"at":[39,79],"6-sigma":[40],"yield.":[41],"By":[42],"properly":[43],"selecting":[44],"back":[46,80,102],"bias,":[47],"lowest":[49],"achieved":[55],"each":[57],"three":[60],"operation":[61],"modes:":[62],"high-performance,":[63],"standard":[64],"and":[65,97],"low-voltage":[66],"modes.":[67],"In":[68],"high-performance":[69],"mode,":[70],"optimized":[72],"Vmin":[73],"reduced":[75],"0.491":[77],"bias":[81,103],"0.2":[83],"V.":[84],"The":[85],"proposed":[86],"offers":[88],"design":[90],"flexibility":[91],"optimizing":[93],"SRAM":[95],"performance":[96],"yield":[98],"by":[99],"adjusting":[100],"without":[104],"complicated":[105],"technology":[107],"requirements.":[108]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}