{"id":"https://openalex.org/W2611756499","doi":"https://doi.org/10.1109/isqed.2017.7918356","title":"Aging-aware critical paths for process related validation in the presence of NBTI","display_name":"Aging-aware critical paths for process related validation in the presence of NBTI","publication_year":2017,"publication_date":"2017-03-01","ids":{"openalex":"https://openalex.org/W2611756499","doi":"https://doi.org/10.1109/isqed.2017.7918356","mag":"2611756499"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2017.7918356","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2017.7918356","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 18th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026267957","display_name":"Phaninder Alladi","orcid":null},"institutions":[{"id":"https://openalex.org/I110378019","display_name":"Southern Illinois University Carbondale","ror":"https://ror.org/049kefs16","country_code":"US","type":"education","lineage":["https://openalex.org/I110378019","https://openalex.org/I2801502357"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Phaninder Alladi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Southern Illinois University Carbondale, Carbondale, IL"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Southern Illinois University Carbondale, Carbondale, IL","institution_ids":["https://openalex.org/I110378019"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083284025","display_name":"Spyros Tragoudas","orcid":"https://orcid.org/0009-0006-2575-3588"},"institutions":[{"id":"https://openalex.org/I110378019","display_name":"Southern Illinois University Carbondale","ror":"https://ror.org/049kefs16","country_code":"US","type":"education","lineage":["https://openalex.org/I110378019","https://openalex.org/I2801502357"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Spyros Tragoudas","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Southern Illinois University Carbondale, Carbondale, IL"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Southern Illinois University Carbondale, Carbondale, IL","institution_ids":["https://openalex.org/I110378019"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5026267957"],"corresponding_institution_ids":["https://openalex.org/I110378019"],"apc_list":null,"apc_paid":null,"fwci":0.1433,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.48376293,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"445","last_page":"448"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/negative-bias-temperature-instability","display_name":"Negative-bias temperature instability","score":0.6129152774810791},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5760869383811951},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5369863510131836},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5211308598518372},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.5112602710723877},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5107314586639404},{"id":"https://openalex.org/keywords/critical-path-method","display_name":"Critical path method","score":0.49652010202407837},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4458320438861847},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34575778245925903},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23400640487670898},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.20978900790214539},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.15422168374061584},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10233289003372192},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09555390477180481}],"concepts":[{"id":"https://openalex.org/C557185","wikidata":"https://www.wikidata.org/wiki/Q6987194","display_name":"Negative-bias temperature instability","level":5,"score":0.6129152774810791},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5760869383811951},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5369863510131836},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5211308598518372},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.5112602710723877},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5107314586639404},{"id":"https://openalex.org/C115874739","wikidata":"https://www.wikidata.org/wiki/Q825377","display_name":"Critical path method","level":2,"score":0.49652010202407837},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4458320438861847},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34575778245925903},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23400640487670898},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.20978900790214539},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.15422168374061584},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10233289003372192},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09555390477180481},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2017.7918356","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2017.7918356","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 18th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/12","display_name":"Responsible consumption and production","score":0.4699999988079071}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1554885925","https://openalex.org/W1902864909","https://openalex.org/W1966741973","https://openalex.org/W1971178560","https://openalex.org/W2022980973","https://openalex.org/W2098194061","https://openalex.org/W2113728962","https://openalex.org/W2123051093","https://openalex.org/W2126564504","https://openalex.org/W2144569631","https://openalex.org/W2146410479","https://openalex.org/W2159373619","https://openalex.org/W2169033838","https://openalex.org/W2271673038","https://openalex.org/W2344758701","https://openalex.org/W2411463051","https://openalex.org/W4234640396","https://openalex.org/W4237955880","https://openalex.org/W6678664461","https://openalex.org/W6681681969"],"related_works":["https://openalex.org/W3011443213","https://openalex.org/W2157278395","https://openalex.org/W2374313965","https://openalex.org/W298517545","https://openalex.org/W2365007040","https://openalex.org/W2045633099","https://openalex.org/W1970519101","https://openalex.org/W1910575119","https://openalex.org/W2765542845","https://openalex.org/W2123824453"],"abstract_inverted_index":{"The":[0,10],"delay":[1],"of":[2,12,80],"a":[3,53],"circuit":[4,42],"degrades":[5],"due":[6],"to":[7,38,67],"NBTI":[8],"affects.":[9],"accuracy":[11],"existing":[13],"predictive":[14],"aging":[15,56],"models":[16],"depend":[17],"on":[18],"input":[19],"signal":[20],"probabilities":[21],"that":[22],"may":[23],"vary":[24],"during":[25],"the":[26,41,78,81],"circuit's":[27],"life":[28],"span.":[29],"Critical":[30],"paths":[31,71],"must":[32],"be":[33],"tested":[34],"periodically":[35],"in":[36,65],"order":[37,66],"determine":[39],"whether":[40],"has":[43],"aged":[44],"more":[45],"than":[46],"predicted.":[47],"Path":[48],"selection":[49],"is":[50,62],"assisted":[51],"by":[52],"proposed":[54,82],"pin-pin":[55],"model.":[57],"A":[58],"compact":[59],"test":[60,68],"set":[61],"also":[63],"derived":[64],"all":[69],"critical":[70],"at":[72],"each":[73],"year.":[74],"Experimental":[75],"results":[76],"show":[77],"effectiveness":[79],"method.":[83]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}