{"id":"https://openalex.org/W2611334943","doi":"https://doi.org/10.1109/isqed.2017.7918296","title":"Low redundancy matrix-based codes for adjacent error correction with parity sharing","display_name":"Low redundancy matrix-based codes for adjacent error correction with parity sharing","publication_year":2017,"publication_date":"2017-03-01","ids":{"openalex":"https://openalex.org/W2611334943","doi":"https://doi.org/10.1109/isqed.2017.7918296","mag":"2611334943"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2017.7918296","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2017.7918296","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 18th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100417119","display_name":"Shanshan Liu","orcid":"https://orcid.org/0000-0001-6226-2880"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Shanshan Liu","raw_affiliation_strings":["Harbin Institute of Technology, Harbin, Heilongjiang, China"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology, Harbin, Heilongjiang, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100651217","display_name":"Liyi Xiao","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liyi Xiao","raw_affiliation_strings":["Harbin Institute of Technology, Harbin, Heilongjiang, China"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology, Harbin, Heilongjiang, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101850344","display_name":"Jie Li","orcid":"https://orcid.org/0000-0003-3878-7710"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Li","raw_affiliation_strings":["Harbin Institute of Technology, Harbin, Heilongjiang, China"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology, Harbin, Heilongjiang, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086955758","display_name":"Yihan Zhou","orcid":"https://orcid.org/0000-0003-0032-0330"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yihan Zhou","raw_affiliation_strings":["Harbin Institute of Technology, Harbin, Heilongjiang, China"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology, Harbin, Heilongjiang, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103236320","display_name":"Zhigang Mao","orcid":"https://orcid.org/0000-0001-9431-9853"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhigang Mao","raw_affiliation_strings":["Harbin Institute of Technology, Harbin, Heilongjiang, China"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology, Harbin, Heilongjiang, China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100417119"],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":0.8765,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.7557895,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"76","last_page":"80"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parity-check-matrix","display_name":"Parity-check matrix","score":0.7049140930175781},{"id":"https://openalex.org/keywords/hamming-code","display_name":"Hamming code","score":0.6899290084838867},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6508272886276245},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6370707154273987},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5610767006874084},{"id":"https://openalex.org/keywords/parity-bit","display_name":"Parity bit","score":0.5395950078964233},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.5224955677986145},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.46044716238975525},{"id":"https://openalex.org/keywords/generator-matrix","display_name":"Generator matrix","score":0.432840496301651},{"id":"https://openalex.org/keywords/block-code","display_name":"Block code","score":0.368091344833374},{"id":"https://openalex.org/keywords/low-density-parity-check-code","display_name":"Low-density parity-check code","score":0.30911025404930115}],"concepts":[{"id":"https://openalex.org/C95925971","wikidata":"https://www.wikidata.org/wiki/Q3100414","display_name":"Parity-check matrix","level":4,"score":0.7049140930175781},{"id":"https://openalex.org/C73150493","wikidata":"https://www.wikidata.org/wiki/Q853922","display_name":"Hamming code","level":4,"score":0.6899290084838867},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6508272886276245},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6370707154273987},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5610767006874084},{"id":"https://openalex.org/C131521367","wikidata":"https://www.wikidata.org/wiki/Q625502","display_name":"Parity bit","level":2,"score":0.5395950078964233},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.5224955677986145},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.46044716238975525},{"id":"https://openalex.org/C1842014","wikidata":"https://www.wikidata.org/wiki/Q1502046","display_name":"Generator matrix","level":3,"score":0.432840496301651},{"id":"https://openalex.org/C157125643","wikidata":"https://www.wikidata.org/wiki/Q884707","display_name":"Block code","level":3,"score":0.368091344833374},{"id":"https://openalex.org/C67692717","wikidata":"https://www.wikidata.org/wiki/Q187444","display_name":"Low-density parity-check code","level":3,"score":0.30911025404930115},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2017.7918296","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2017.7918296","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 18th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1980073965","https://openalex.org/W1991534444","https://openalex.org/W2003964202","https://openalex.org/W2015548239","https://openalex.org/W2025474944","https://openalex.org/W2029648330","https://openalex.org/W2065356549","https://openalex.org/W2096885248","https://openalex.org/W2099569658","https://openalex.org/W2100704360","https://openalex.org/W2103415152","https://openalex.org/W2104886115","https://openalex.org/W2137874240","https://openalex.org/W2138815251","https://openalex.org/W2335199650","https://openalex.org/W2342204193","https://openalex.org/W3149410719"],"related_works":["https://openalex.org/W2279940065","https://openalex.org/W2282053458","https://openalex.org/W2090897912","https://openalex.org/W2141157615","https://openalex.org/W4384074457","https://openalex.org/W2386742926","https://openalex.org/W2083917443","https://openalex.org/W1986170760","https://openalex.org/W2596270314","https://openalex.org/W1949143627"],"abstract_inverted_index":{"As":[0],"CMOS":[1],"technology":[2],"scales":[3],"down,":[4],"multiple":[5],"cell":[6],"upsets":[7],"(MCUs)":[8],"caused":[9],"by":[10,33,142,150,157,175],"a":[11,87,98,136,146,153,203,223],"single":[12],"radiation":[13],"particle":[14],"have":[15],"become":[16],"one":[17],"of":[18,66,139,172,197,226],"the":[19,76,102,106,122,126,130,161,169,176,189,193,198,207,215],"most":[20],"challenging":[21],"reliability":[22],"issues":[23],"for":[24,91,165,192,220],"memories":[25,173,221],"in":[26,79,202,213],"space":[27],"applications.":[28],"In":[29,84],"general,":[30],"bits":[31,68,141],"affected":[32],"MCUs":[34,170],"are":[35,43,54,201],"usually":[36],"physically":[37],"close.":[38],"Error":[39],"correction":[40,132],"codes":[41,53,70,93,109,114,200,217],"(ECCs)":[42],"commonly":[44],"used":[45],"to":[46,59,75,121,183],"protect":[47],"memory":[48,186],"against":[49],"MCUs.":[50],"Recently,":[51],"Matrix-based":[52],"an":[55],"interesting":[56],"option":[57],"due":[58],"their":[60],"low":[61,88],"complexity":[62],"decoding.":[63],"The":[64],"number":[65,138],"parity":[67,113,118,140],"matrix-based":[69,92,124,209],"required,":[71],"which":[72,159,211],"is":[73,81,94],"related":[74],"redundancy":[77,89,185],"cells":[78],"memories,":[80],"not":[82],"small.":[83],"this":[85],"paper,":[86],"scheme":[90,104,128,163,178],"presented.":[95],"Based":[96],"on":[97],"new":[99,162],"matrix":[100],"arrangement,":[101],"proposed":[103,127,177,199,216],"combines":[105],"extended":[107],"Hamming":[108],"per":[110,115],"row":[111],"and":[112,152,195,228],"column":[116],"with":[117,222],"sharing.":[119],"Compared":[120],"existing":[123,208],"codes,":[125,210],"maintains":[129],"same":[131],"capability,":[133],"but":[134],"costs":[135],"smaller":[137,147],"24%":[143],"at":[144],"most,":[145],"area":[148,227],"overhead":[149,156],"16.24%,":[151],"lower":[154],"power":[155],"26.04%,":[158],"make":[160],"attractive":[164],"circuit":[166],"implementations.":[167],"Meanwhile,":[168],"probability":[171],"protected":[174],"can":[179],"be":[180],"reduced":[181],"owning":[182],"less":[184],"cells.":[187],"However,":[188],"delay":[190],"required":[191],"encoder":[194],"decoder":[196],"middle":[204],"level":[205],"among":[206],"results":[212],"that":[214],"suit":[218],"better":[219],"strict":[224],"requirement":[225],"power.":[229]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":4}],"updated_date":"2026-04-18T07:56:08.524223","created_date":"2025-10-10T00:00:00"}