{"id":"https://openalex.org/W2611800749","doi":"https://doi.org/10.1109/isqed.2017.7918294","title":"Re-addressing SRAM design and measurement for sub-threshold operation in view of classic 6T vs. standard cell based implementations","display_name":"Re-addressing SRAM design and measurement for sub-threshold operation in view of classic 6T vs. standard cell based implementations","publication_year":2017,"publication_date":"2017-03-01","ids":{"openalex":"https://openalex.org/W2611800749","doi":"https://doi.org/10.1109/isqed.2017.7918294","mag":"2611800749"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2017.7918294","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2017.7918294","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 18th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034733719","display_name":"Xin Fan","orcid":"https://orcid.org/0000-0001-6954-5074"},"institutions":[{"id":"https://openalex.org/I4210153656","display_name":"Holst Centre (Netherlands)","ror":"https://ror.org/04abpa862","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210153656"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Xin Fan","raw_affiliation_strings":["Holst-Center/IMEC-nl Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Holst-Center/IMEC-nl Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I4210153656"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043487726","display_name":"Jan Stuijt","orcid":"https://orcid.org/0000-0001-6797-2339"},"institutions":[{"id":"https://openalex.org/I4210153656","display_name":"Holst Centre (Netherlands)","ror":"https://ror.org/04abpa862","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210153656"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Jan Stuijt","raw_affiliation_strings":["Holst-Center/IMEC-nl Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Holst-Center/IMEC-nl Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I4210153656"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113817243","display_name":"Rui Wang","orcid":"https://orcid.org/0009-0000-3553-1520"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]},{"id":"https://openalex.org/I4210153656","display_name":"Holst Centre (Netherlands)","ror":"https://ror.org/04abpa862","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210153656"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Rui Wang","raw_affiliation_strings":["ES, TU/e Eindhoven, The Netherlands","Holst-Center/IMEC-nl Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"ES, TU/e Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I83019370"]},{"raw_affiliation_string":"Holst-Center/IMEC-nl Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I4210153656"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100461621","display_name":"Bo Liu","orcid":"https://orcid.org/0000-0002-0894-1054"},"institutions":[{"id":"https://openalex.org/I4210153656","display_name":"Holst Centre (Netherlands)","ror":"https://ror.org/04abpa862","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210153656"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Bo Liu","raw_affiliation_strings":["Holst-Center/IMEC-nl Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Holst-Center/IMEC-nl Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I4210153656"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023628905","display_name":"Tobias Gemmeke","orcid":"https://orcid.org/0000-0003-1583-3411"},"institutions":[{"id":"https://openalex.org/I4210153656","display_name":"Holst Centre (Netherlands)","ror":"https://ror.org/04abpa862","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210153656"]},{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE","NL"],"is_corresponding":false,"raw_author_name":"Tobias Gemmeke","raw_affiliation_strings":["Holst-Center/IMEC-nl Eindhoven, The Netherlands","IDS, RWTH Aachen University, Germany"],"affiliations":[{"raw_affiliation_string":"Holst-Center/IMEC-nl Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I4210153656"]},{"raw_affiliation_string":"IDS, RWTH Aachen University, Germany","institution_ids":["https://openalex.org/I887968799"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5034733719"],"corresponding_institution_ids":["https://openalex.org/I4210153656"],"apc_list":null,"apc_paid":null,"fwci":0.292,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.58439583,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"59","issue":null,"first_page":"65","last_page":"70"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.94284987449646},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5806302428245544},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4988565444946289},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4925101697444916},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4629695415496826},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.4134484827518463},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.34190624952316284},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.33170127868652344},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26408639550209045},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.26129376888275146}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.94284987449646},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5806302428245544},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4988565444946289},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4925101697444916},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4629695415496826},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4134484827518463},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.34190624952316284},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.33170127868652344},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26408639550209045},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.26129376888275146},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.1109/isqed.2017.7918294","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2017.7918294","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 18th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},{"id":"pmh:906012","is_oa":false,"landing_page_url":"http://library.tue.nl/csp/dare/LinkToRepository.csp?recordnumber=906012","pdf_url":null,"source":{"id":"https://openalex.org/S4406923046","display_name":"TU/e Research Portal (Eindhoven University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""},{"id":"pmh:oai:library.tue.nl:906012","is_oa":false,"landing_page_url":"http://repository.tue.nl/906012","pdf_url":null,"source":{"id":"https://openalex.org/S4406923046","display_name":"TU/e Research Portal (Eindhoven University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":""},{"id":"pmh:oai:publications.rwth-aachen.de:717981","is_oa":false,"landing_page_url":"https://publications.rwth-aachen.de/record/717981","pdf_url":null,"source":{"id":"https://openalex.org/S4306401033","display_name":"RWTH Publications (RWTH Aachen)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I887968799","host_organization_name":"RWTH Aachen University","host_organization_lineage":["https://openalex.org/I887968799"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Piscataway, NJ : IEEE 6 Seiten (2017). doi:10.1109/ISQED.2017.7918294","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:tue:oai:pure.tue.nl:publications/95c8f0f5-00d7-4fff-9bdc-279292f8d1a4","is_oa":false,"landing_page_url":"https://research.tue.nl/nl/publications/readdressing-sram-design-and-measurement-for-subthreshold-operation-in-view-of-classic-6t-vs-standard-cell-based-implementations(95c8f0f5-00d7-4fff-9bdc-279292f8d1a4).html","pdf_url":null,"source":{"id":"https://openalex.org/S4306401843","display_name":"Data Archiving and Networked Services (DANS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1322597698","host_organization_name":"Royal Netherlands Academy of Arts and Sciences","host_organization_lineage":["https://openalex.org/I1322597698"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Proceedings of the 18th International Symposium on Quality Electronic Design, ISQED 2017 : March 14-15, 2017, Santa Clara, California USA, 65 - 70","raw_type":"info:eu-repo/semantics/conferencepaper"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8600000143051147,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1753784006","https://openalex.org/W1975331880","https://openalex.org/W2017216250","https://openalex.org/W2036742943","https://openalex.org/W2057899754","https://openalex.org/W2075778001","https://openalex.org/W2095913060","https://openalex.org/W2098931949","https://openalex.org/W2106339466","https://openalex.org/W2106507957","https://openalex.org/W2113613740","https://openalex.org/W2133614817","https://openalex.org/W2137432370","https://openalex.org/W2139434498","https://openalex.org/W2144289559","https://openalex.org/W2158622216","https://openalex.org/W2164330002","https://openalex.org/W2397682474","https://openalex.org/W4239993202","https://openalex.org/W4285719527","https://openalex.org/W6674416592","https://openalex.org/W6676171248","https://openalex.org/W6680831945","https://openalex.org/W7073655612"],"related_works":["https://openalex.org/W4392590355","https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W1976168335","https://openalex.org/W2109451123","https://openalex.org/W4378977321","https://openalex.org/W3211992815","https://openalex.org/W2119025037"],"abstract_inverted_index":{"This":[0,123],"paper":[1],"re-addresses":[2],"standard-cell":[3],"based":[4,27,118],"SRAM":[5,19,44,50,94,115],"design":[6,99],"for":[7],"sub-threshold":[8],"operation.":[9],"Rather":[10],"than":[11],"using":[12],"flip-flop":[13],"or":[14],"latch":[15],"gates":[16],"to":[17],"implement":[18],"bitcells,":[20],"a":[21,41,53,62,83,96,114,125],"circuit":[22],"structure":[23],"that":[24],"is":[25,37,116],"fully":[26],"on":[28,40,119,128],"combinational":[29],"logic,":[30],"OAI":[31],"(Or-And-Invert)":[32],"and":[33,60,95,106],"AOI":[34],"(And-Or-Invert)":[35],"gates,":[36],"presented.":[38],"Measurements":[39],"90-kb":[42],"40-nm":[43],"chip":[45],"show":[46],"that,":[47],"the":[48,74,92,102,129],"OAI/AOI-based":[49],"operates":[51],"at":[52],"minimum":[54,63],"access":[55,70],"voltage":[56,77],"of":[57,66,78,86,111,113,131],"410":[58],"mV":[59],"obtains":[61],"read":[64],"energy":[65],"30":[67],"fJ":[68],"per":[69,71,89],"bit.":[72,90],"At":[73],"data":[75],"retention":[76],"330":[79],"mV,":[80],"it":[81],"features":[82],"leakage":[84],"power":[85],"1.6":[87],"pW":[88],"Taking":[91],"proposed":[93],"classic":[97],"6T-cell":[98],"as":[100],"examples,":[101],"relationship":[103],"between":[104],"yield":[105],"bias":[107],"in":[108,134],"key":[109],"figures":[110],"merit":[112],"highlighted":[117],"silicon":[120],"measurement":[121],"results.":[122],"motivates":[124],"statistical":[126],"view":[127],"evaluation":[130],"SRAMs":[132],"operating":[133],"sub-threshold.":[135]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}