{"id":"https://openalex.org/W2403278033","doi":"https://doi.org/10.1109/isqed.2016.7479236","title":"Efficient analog circuit optimization using sparse regression and error margining","display_name":"Efficient analog circuit optimization using sparse regression and error margining","publication_year":2016,"publication_date":"2016-03-01","ids":{"openalex":"https://openalex.org/W2403278033","doi":"https://doi.org/10.1109/isqed.2016.7479236","mag":"2403278033"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2016.7479236","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2016.7479236","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 17th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038501242","display_name":"Mohamed Baker Alawieh","orcid":"https://orcid.org/0000-0002-3546-0336"},"institutions":[{"id":"https://openalex.org/I98635879","display_name":"American University of Beirut","ror":"https://ror.org/04pznsd21","country_code":"LB","type":"education","lineage":["https://openalex.org/I98635879"]}],"countries":["LB"],"is_corresponding":false,"raw_author_name":"Mohamed Baker Alawieh","raw_affiliation_strings":["ECE Department, American University of Beirut, Beirut, Lebanon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, American University of Beirut, Beirut, Lebanon","institution_ids":["https://openalex.org/I98635879"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100702415","display_name":"Fa Wang","orcid":"https://orcid.org/0000-0002-8117-1914"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fa Wang","raw_affiliation_strings":["ECE Department, Carnegie Mellon University, Pittsburgh, PA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071376756","display_name":"Rouwaida Kanj","orcid":"https://orcid.org/0000-0002-3519-2917"},"institutions":[{"id":"https://openalex.org/I98635879","display_name":"American University of Beirut","ror":"https://ror.org/04pznsd21","country_code":"LB","type":"education","lineage":["https://openalex.org/I98635879"]}],"countries":["LB"],"is_corresponding":false,"raw_author_name":"Rouwaida Kanj","raw_affiliation_strings":["ECE Department, American University of Beirut, Beirut, Lebanon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, American University of Beirut, Beirut, Lebanon","institution_ids":["https://openalex.org/I98635879"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055112199","display_name":"Xin Li","orcid":"https://orcid.org/0000-0002-6475-5678"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xin Li","raw_affiliation_strings":["ECE Department, Carnegie Mellon University, Pittsburgh, PA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECE Department, Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5105554115","display_name":"Rajiv Joshi","orcid":"https://orcid.org/0009-0007-7486-1531"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rajiv Joshi","raw_affiliation_strings":["IBM TJ Watson Lab, Yorktown Heights, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM TJ Watson Lab, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I1341412227"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.1161,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.8019501,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"29","issue":null,"first_page":"410","last_page":"415"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.6813434362411499},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6192772388458252},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5114520788192749},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.48072054982185364},{"id":"https://openalex.org/keywords/optimization-problem","display_name":"Optimization problem","score":0.42165857553482056},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.41563108563423157},{"id":"https://openalex.org/keywords/regression","display_name":"Regression","score":0.4152417778968811},{"id":"https://openalex.org/keywords/linear-regression","display_name":"Linear regression","score":0.41244858503341675},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.37981972098350525},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.21197018027305603},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.15086045861244202},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.13609471917152405},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.133802592754364},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.09760203957557678},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.07595294713973999}],"concepts":[{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.6813434362411499},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6192772388458252},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5114520788192749},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.48072054982185364},{"id":"https://openalex.org/C137836250","wikidata":"https://www.wikidata.org/wiki/Q984063","display_name":"Optimization problem","level":2,"score":0.42165857553482056},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.41563108563423157},{"id":"https://openalex.org/C83546350","wikidata":"https://www.wikidata.org/wiki/Q1139051","display_name":"Regression","level":2,"score":0.4152417778968811},{"id":"https://openalex.org/C48921125","wikidata":"https://www.wikidata.org/wiki/Q10861030","display_name":"Linear regression","level":2,"score":0.41244858503341675},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.37981972098350525},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21197018027305603},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.15086045861244202},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.13609471917152405},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.133802592754364},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.09760203957557678},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.07595294713973999},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2016.7479236","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2016.7479236","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 17th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4000000059604645,"id":"https://metadata.un.org/sdg/8","display_name":"Decent work and economic growth"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320336463","display_name":"University Research Board, American University of Beirut","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1595067400","https://openalex.org/W1601795611","https://openalex.org/W1983837873","https://openalex.org/W1989728241","https://openalex.org/W2027852624","https://openalex.org/W2063648336","https://openalex.org/W2076875478","https://openalex.org/W2084494253","https://openalex.org/W2091359500","https://openalex.org/W2092773574","https://openalex.org/W2100992121","https://openalex.org/W2102649620","https://openalex.org/W2105214055","https://openalex.org/W2110073735","https://openalex.org/W2122919983","https://openalex.org/W2126706858","https://openalex.org/W2137037970","https://openalex.org/W2141776905","https://openalex.org/W2154270708","https://openalex.org/W2155811837","https://openalex.org/W2167508000","https://openalex.org/W3144874526","https://openalex.org/W4236412150","https://openalex.org/W4249230816","https://openalex.org/W4297970750","https://openalex.org/W6635427314","https://openalex.org/W6678940919"],"related_works":["https://openalex.org/W4398198689","https://openalex.org/W2354365353","https://openalex.org/W2811287415","https://openalex.org/W1988437325","https://openalex.org/W2354835317","https://openalex.org/W31220157","https://openalex.org/W2288557197","https://openalex.org/W4233024177","https://openalex.org/W2101914902","https://openalex.org/W3174613421"],"abstract_inverted_index":{"In":[0,50],"this":[1,70],"paper,":[2],"we":[3,52],"propose":[4,53],"a":[5,24,41,54],"novel":[6],"analog":[7],"circuit":[8,76],"optimization":[9,21,61],"methodology":[10],"for":[11],"achieving":[12],"high":[13,85],"parametric":[14,86],"yield.":[15],"We":[16],"solve":[17],"the":[18,79],"statistical":[19],"worst-case":[20],"problem":[22],"by":[23],"sequence":[25],"of":[26,44,64,69],"linear":[27],"programmings":[28],"where":[29,78],"performance":[30],"metrics":[31],"are":[32],"fitted":[33],"using":[34,74],"sparse":[35],"regression":[36],"to":[37,57,94],"take":[38],"into":[39],"account":[40],"large":[42],"number":[43],"device-level":[45],"parameters":[46],"modeling":[47,65],"process":[48],"variations.":[49],"addition,":[51],"margining":[55],"mechanism":[56],"ensure":[58],"accurate":[59],"yield":[60,87],"with":[62],"consideration":[63],"errors.":[66],"The":[67],"efficacy":[68],"method":[71],"is":[72,82,91],"demonstrated":[73],"two":[75],"examples":[77],"cost":[80],"function":[81],"minimized":[83],"and":[84],"(e.g.,":[88],"around":[89],"90%)":[90],"achieved":[92],"compared":[93],"other":[95],"conventional":[96],"approaches.":[97]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}