{"id":"https://openalex.org/W1971740886","doi":"https://doi.org/10.1109/isqed.2015.7085421","title":"Energy reduction by built-in body biasing with single supply voltage operation","display_name":"Energy reduction by built-in body biasing with single supply voltage operation","publication_year":2015,"publication_date":"2015-03-01","ids":{"openalex":"https://openalex.org/W1971740886","doi":"https://doi.org/10.1109/isqed.2015.7085421","mag":"1971740886"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2015.7085421","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2015.7085421","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sixteenth International Symposium on Quality Electronic Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067446723","display_name":"Norihiro Kamae","orcid":null},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Norihiro Kamae","raw_affiliation_strings":["Department of Communications and Computer Engineering, Kyoto University, Kyoto, Japan","Department of Communications and Computer Engineering, Kyoto University, Kyoto, 606-8501 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Communications and Computer Engineering, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]},{"raw_affiliation_string":"Department of Communications and Computer Engineering, Kyoto University, Kyoto, 606-8501 Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102980295","display_name":"Mahfuzul Islam","orcid":"https://orcid.org/0000-0002-5011-4044"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"A. K. M. Mahfuzul Islam","raw_affiliation_strings":["Department of Communications and Computer Engineering, Kyoto University, Kyoto, Japan","Department of Communications and Computer Engineering, Kyoto University, Kyoto, 606-8501 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Communications and Computer Engineering, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]},{"raw_affiliation_string":"Department of Communications and Computer Engineering, Kyoto University, Kyoto, 606-8501 Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038761727","display_name":"Akira Tsuchiya","orcid":"https://orcid.org/0000-0002-3299-9328"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akira Tsuchiya","raw_affiliation_strings":["Department of Communications and Computer Engineering, Kyoto University, Kyoto, Japan","Department of Communications and Computer Engineering, Kyoto University, Kyoto, 606-8501 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Communications and Computer Engineering, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]},{"raw_affiliation_string":"Department of Communications and Computer Engineering, Kyoto University, Kyoto, 606-8501 Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022726556","display_name":"Tohru Ishihara","orcid":"https://orcid.org/0000-0002-1650-9958"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tohru Ishihara","raw_affiliation_strings":["Department of Communications and Computer Engineering, Kyoto University, Kyoto, Japan","Department of Communications and Computer Engineering, Kyoto University, Kyoto, 606-8501 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Communications and Computer Engineering, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]},{"raw_affiliation_string":"Department of Communications and Computer Engineering, Kyoto University, Kyoto, 606-8501 Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026865951","display_name":"Hidetoshi Onodera","orcid":"https://orcid.org/0000-0001-5198-0668"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hidetoshi Onodera","raw_affiliation_strings":["Department of Communications and Computer Engineering, Kyoto University, Kyoto, Japan","Department of Communications and Computer Engineering, Kyoto University, Kyoto, 606-8501 Japan"],"affiliations":[{"raw_affiliation_string":"Department of Communications and Computer Engineering, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]},{"raw_affiliation_string":"Department of Communications and Computer Engineering, Kyoto University, Kyoto, 606-8501 Japan","institution_ids":["https://openalex.org/I22299242"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5067446723"],"corresponding_institution_ids":["https://openalex.org/I22299242"],"apc_list":null,"apc_paid":null,"fwci":0.5919,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.71782018,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"181","last_page":"185"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.6941733360290527},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.63158118724823},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5817345380783081},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.5484706163406372},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49676233530044556},{"id":"https://openalex.org/keywords/efficient-energy-use","display_name":"Efficient energy use","score":0.4720906913280487},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4685650169849396},{"id":"https://openalex.org/keywords/dynamic-voltage-scaling","display_name":"Dynamic voltage scaling","score":0.4620259404182434},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4589174687862396},{"id":"https://openalex.org/keywords/voltage-reduction","display_name":"Voltage reduction","score":0.4585030674934387},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.45441871881484985},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4540579319000244},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.4198976755142212},{"id":"https://openalex.org/keywords/low-voltage","display_name":"Low voltage","score":0.4114004373550415},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.40734007954597473},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22574681043624878}],"concepts":[{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.6941733360290527},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.63158118724823},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5817345380783081},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.5484706163406372},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49676233530044556},{"id":"https://openalex.org/C2742236","wikidata":"https://www.wikidata.org/wiki/Q924713","display_name":"Efficient energy use","level":2,"score":0.4720906913280487},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4685650169849396},{"id":"https://openalex.org/C2776047111","wikidata":"https://www.wikidata.org/wiki/Q632037","display_name":"Dynamic voltage scaling","level":3,"score":0.4620259404182434},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4589174687862396},{"id":"https://openalex.org/C2780745134","wikidata":"https://www.wikidata.org/wiki/Q7940751","display_name":"Voltage reduction","level":3,"score":0.4585030674934387},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.45441871881484985},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4540579319000244},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.4198976755142212},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.4114004373550415},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.40734007954597473},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22574681043624878},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2015.7085421","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2015.7085421","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sixteenth International Symposium on Quality Electronic Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8899999856948853,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322832","display_name":"University of Tokyo","ror":"https://ror.org/057zh3y96"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2030638498","https://openalex.org/W2089232024","https://openalex.org/W2122818120","https://openalex.org/W2151037583","https://openalex.org/W2170113561"],"related_works":["https://openalex.org/W4390097625","https://openalex.org/W4387006214","https://openalex.org/W3109750650","https://openalex.org/W1988677061","https://openalex.org/W4205965428","https://openalex.org/W2985963598","https://openalex.org/W1575287425","https://openalex.org/W2605922410","https://openalex.org/W4250241712","https://openalex.org/W2053154428"],"abstract_inverted_index":{"Energy-efficiency":[0],"has":[1,95],"become":[2],"the":[3,86,92,106,109,134,143],"driving":[4],"force":[5],"of":[6,17,61,91,105,149],"today's":[7],"LSI":[8],"industry.":[9],"In":[10,122],"order":[11],"to":[12,98,116,132],"achieve":[13,133],"minimum":[14,135],"energy":[15,136,150],"operation":[16],"LSI,":[18],"we":[19],"propose":[20],"a":[21,54,80,139],"built-in":[22,47],"body":[23,29,48,127],"biasing":[24],"technique":[25],"which":[26],"generates":[27],"independent":[28],"biases":[30],"for":[31,85,138],"nMOSFET":[32],"and":[33,38,64,75,102,108,119,126],"pMOSFET":[34],"separately.":[35],"We":[36],"design":[37,90,118],"fabricate":[39],"an":[40,72],"application":[41,58,87],"circuit":[42,59,94],"integrated":[43],"with":[44,79,155],"our":[45],"proposed":[46],"bias":[49,128],"generation":[50],"(BBG)":[51],"circuits":[52,111],"in":[53],"65-nm":[55],"process.":[56],"The":[57,67],"consists":[60],"AES":[62,107],"cipher":[63],"decipher":[65],"modules.":[66],"BBG":[68,93,110],"does":[69],"not":[70],"require":[71],"external":[73],"supply":[74,124,157],"it":[76],"is":[77,152],"compatible":[78],"dynamic":[81],"voltage":[82,125,158],"scaling":[83],"scheme":[84],"circuit.":[88],"Cell-based":[89],"been":[96,113],"applied":[97],"facilitate":[99],"automatic":[100],"place":[101],"route.":[103],"Both":[104],"have":[112],"routed":[114],"simultaneously":[115],"reduce":[117],"area":[120],"overhead.":[121],"post-silicon,":[123],"voltages":[129],"are":[130],"selected":[131],"consumption":[137],"target":[140],"frequency.":[141],"From":[142],"measurement":[144],"results,":[145],"more":[146],"than":[147],"20%":[148],"reduction":[151],"achieved":[153],"compared":[154],"adjusting":[156],"alone.":[159]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}