{"id":"https://openalex.org/W2033214828","doi":"https://doi.org/10.1109/isqed.2015.7085409","title":"Architectural reliability estimation using design diversity","display_name":"Architectural reliability estimation using design diversity","publication_year":2015,"publication_date":"2015-03-01","ids":{"openalex":"https://openalex.org/W2033214828","doi":"https://doi.org/10.1109/isqed.2015.7085409","mag":"2033214828"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2015.7085409","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2015.7085409","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sixteenth International Symposium on Quality Electronic Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100401037","display_name":"Zheng Wang","orcid":"https://orcid.org/0000-0001-5330-4532"},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Zheng Wang","raw_affiliation_strings":["Institute for Communication Technologies and Embedded Systems (ICE), RWTH Aachen University, Aachen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute for Communication Technologies and Embedded Systems (ICE), RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101984215","display_name":"Yang Liu","orcid":"https://orcid.org/0000-0003-2642-1404"},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Liu Yang","raw_affiliation_strings":["Institute for Communication Technologies and Embedded Systems (ICE), RWTH Aachen University, Aachen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute for Communication Technologies and Embedded Systems (ICE), RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089860351","display_name":"Anupam Chattopadhyay","orcid":"https://orcid.org/0000-0002-8818-6983"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Anupam Chattopadhyay","raw_affiliation_strings":["School of Computer Engineering, Nanyang Technological University, Singapore","School of Computer Engineering, Nanyang Technological University,,Singapore"],"affiliations":[{"raw_affiliation_string":"School of Computer Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"School of Computer Engineering, Nanyang Technological University,,Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100401037"],"corresponding_institution_ids":["https://openalex.org/I887968799"],"apc_list":null,"apc_paid":null,"fwci":0.8018,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.76483936,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"112","last_page":"117"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6840884685516357},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.557137131690979},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.5538769364356995},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5455685257911682},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.41209155321121216},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.33559450507164},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1859603226184845}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6840884685516357},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.557137131690979},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.5538769364356995},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5455685257911682},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.41209155321121216},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.33559450507164},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1859603226184845},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/isqed.2015.7085409","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2015.7085409","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sixteenth International Symposium on Quality Electronic Design","raw_type":"proceedings-article"},{"id":"pmh:oai:publications.rwth-aachen.de:565236","is_oa":false,"landing_page_url":"https://publications.rwth-aachen.de/record/565236","pdf_url":null,"source":{"id":"https://openalex.org/S4306401362","display_name":"RWTH Publications (RWTH Aachen)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I887968799","host_organization_name":"RWTH Aachen University","host_organization_lineage":["https://openalex.org/I887968799"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2015 16th International Symposium on Quality Electronic Design (ISQED) : 2 - 4 March 2015, Santa Clara, California, USA / with technical sponsorship from the IEEE Electron Devices Society (EDS) ...<br/>16. International Symposium on Quality Electronic Design, ISQED 2015, Santa Clara, CA, USA, 2015-03-02 - 2015-03-04","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11","score":0.4099999964237213}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W141121412","https://openalex.org/W232459968","https://openalex.org/W1714865987","https://openalex.org/W1864485850","https://openalex.org/W1964073704","https://openalex.org/W1966826470","https://openalex.org/W1972649107","https://openalex.org/W1984960541","https://openalex.org/W1999173345","https://openalex.org/W2003740940","https://openalex.org/W2017521824","https://openalex.org/W2034593585","https://openalex.org/W2054855408","https://openalex.org/W2094996433","https://openalex.org/W2111537388","https://openalex.org/W2116059696","https://openalex.org/W2116097016","https://openalex.org/W2142155216","https://openalex.org/W2147343854","https://openalex.org/W2154332186","https://openalex.org/W2159235462","https://openalex.org/W2162990087","https://openalex.org/W2164236653","https://openalex.org/W2185943396","https://openalex.org/W4247904356","https://openalex.org/W6605853022","https://openalex.org/W6638967067"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"Reliability":[0],"has":[1,50],"emerged":[2],"as":[3,121,123],"an":[4],"important":[5],"design":[6,32,70,96,119],"criterion":[7],"due":[8],"to":[9,38,53],"shrinking":[10],"device":[11],"dimensions.":[12],"Several":[13],"reliability":[14,75],"estimation":[15,124],"techniques":[16],"have":[17],"been":[18,51],"proposed":[19,37,103],"which":[20,34,92],"apply":[21],"either":[22],"fault":[23],"injection":[24],"or":[25],"analytical":[26],"methods.":[27],"Among":[28],"all":[29],"such":[30],"techniques,":[31],"diversity,":[33,120],"is":[35,90,105],"initially":[36],"protect":[39],"system":[40,60,126],"from":[41],"common-mode":[42],"failures":[43],"using":[44],"redundant":[45],"copies":[46],"of":[47,57,125],"different":[48],"implementation,":[49],"applied":[52],"quantify":[54],"the":[55,69,79,113],"availability":[56],"a":[58],"duplex":[59],"in":[61],"circuit-level":[62,95],"design.":[63],"In":[64],"this":[65],"paper,":[66],"we":[67],"utilize":[68],"diversity":[71,97],"metric":[72],"for":[73],"architecture-level":[74,99],"analysis":[76,89,114],"and":[77,98,117],"validate":[78],"concept":[80],"with":[81],"diverse":[82],"processing":[83],"architectures.":[84],"A":[85],"novel":[86],"graph":[87],"based":[88],"introduced":[91],"jointly":[93],"quantifies":[94],"operator":[100],"exclusiveness.":[101],"The":[102],"approach":[104],"demonstrated":[106],"on":[107,115],"several":[108],"embedded":[109],"computing":[110],"architectures":[111],"through":[112],"architecture":[116],"application-level":[118],"well":[122],"Mean-Time-to-Failure.":[127]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}