{"id":"https://openalex.org/W1975975253","doi":"https://doi.org/10.1109/isqed.2014.6783364","title":"Methodology to optimize critical node separation in hardened flip-flops","display_name":"Methodology to optimize critical node separation in hardened flip-flops","publication_year":2014,"publication_date":"2014-03-01","ids":{"openalex":"https://openalex.org/W1975975253","doi":"https://doi.org/10.1109/isqed.2014.6783364","mag":"1975975253"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2014.6783364","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2014.6783364","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fifteenth International Symposium on Quality Electronic Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015371745","display_name":"Sandeep Shambhulingaiah","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Sandeep Shambhulingaiah","raw_affiliation_strings":["School of Electrical, Computer and Energy Engineering Arizona State University, Tempe, AZ","Sch. of Electr. Comput. & Energy Eng, Arizona State Univ., Tempe, AZ, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical, Computer and Energy Engineering Arizona State University, Tempe, AZ","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"Sch. of Electr. Comput. & Energy Eng, Arizona State Univ., Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085711547","display_name":"Srivatsan Chellappa","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Srivatsan Chellappa","raw_affiliation_strings":["School of Electrical, Computer and Energy Engineering Arizona State University, Tempe, AZ","Sch. of Electr. Comput. & Energy Eng, Arizona State Univ., Tempe, AZ, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical, Computer and Energy Engineering Arizona State University, Tempe, AZ","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"Sch. of Electr. Comput. & Energy Eng, Arizona State Univ., Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101760423","display_name":"Sushil Kumar","orcid":"https://orcid.org/0000-0001-8552-8821"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sushil Kumar","raw_affiliation_strings":["School of Electrical, Computer and Energy Engineering Arizona State University, Tempe, AZ","Sch. of Electr. Comput. & Energy Eng, Arizona State Univ., Tempe, AZ, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical, Computer and Energy Engineering Arizona State University, Tempe, AZ","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"Sch. of Electr. Comput. & Energy Eng, Arizona State Univ., Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015329523","display_name":"Lawrence T. Clark","orcid":"https://orcid.org/0000-0001-7741-6512"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lawrence T. Clark","raw_affiliation_strings":["School of Electrical, Computer and Energy Engineering Arizona State University, Tempe, AZ","Sch. of Electr. Comput. & Energy Eng, Arizona State Univ., Tempe, AZ, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical, Computer and Energy Engineering Arizona State University, Tempe, AZ","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"Sch. of Electr. Comput. & Energy Eng, Arizona State Univ., Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5015371745"],"corresponding_institution_ids":["https://openalex.org/I55732556"],"apc_list":null,"apc_paid":null,"fwci":1.4653,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.83788957,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"197","issue":null,"first_page":"486","last_page":"493"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flops","display_name":"FLOPS","score":0.5835234522819519},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5302916169166565},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5211572647094727},{"id":"https://openalex.org/keywords/radiation-hardening","display_name":"Radiation hardening","score":0.5011594295501709},{"id":"https://openalex.org/keywords/charge-sharing","display_name":"Charge sharing","score":0.49379023909568787},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.47241535782814026},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.4713843762874603},{"id":"https://openalex.org/keywords/interleaving","display_name":"Interleaving","score":0.44485703110694885},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.43486812710762024},{"id":"https://openalex.org/keywords/microelectronics","display_name":"Microelectronics","score":0.43125295639038086},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3941907286643982},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2853083610534668},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2330518662929535},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.1990240216255188},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.18233761191368103},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.11319670081138611}],"concepts":[{"id":"https://openalex.org/C3826847","wikidata":"https://www.wikidata.org/wiki/Q188768","display_name":"FLOPS","level":2,"score":0.5835234522819519},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5302916169166565},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5211572647094727},{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.5011594295501709},{"id":"https://openalex.org/C2781179661","wikidata":"https://www.wikidata.org/wiki/Q5074272","display_name":"Charge sharing","level":3,"score":0.49379023909568787},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.47241535782814026},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.4713843762874603},{"id":"https://openalex.org/C28034677","wikidata":"https://www.wikidata.org/wiki/Q17092530","display_name":"Interleaving","level":2,"score":0.44485703110694885},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.43486812710762024},{"id":"https://openalex.org/C187937830","wikidata":"https://www.wikidata.org/wiki/Q175403","display_name":"Microelectronics","level":2,"score":0.43125295639038086},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3941907286643982},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2853083610534668},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2330518662929535},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.1990240216255188},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.18233761191368103},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.11319670081138611},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2014.6783364","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2014.6783364","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fifteenth International Symposium on Quality Electronic Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5299999713897705,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W2037576006","https://openalex.org/W2050431855","https://openalex.org/W2100738296","https://openalex.org/W2102850678","https://openalex.org/W2114790701","https://openalex.org/W2122954231","https://openalex.org/W2141493152","https://openalex.org/W2142358791","https://openalex.org/W2143328585","https://openalex.org/W2149394641","https://openalex.org/W2155603569","https://openalex.org/W2159575344","https://openalex.org/W2161666298","https://openalex.org/W2167002145"],"related_works":["https://openalex.org/W2090290079","https://openalex.org/W2801372096","https://openalex.org/W3099416085","https://openalex.org/W4401308369","https://openalex.org/W2023659251","https://openalex.org/W2160088500","https://openalex.org/W2055535162","https://openalex.org/W2563310135","https://openalex.org/W3009592744","https://openalex.org/W2054806199"],"abstract_inverted_index":{"Radiation":[0],"hardening":[1],"is":[2,34,45],"a":[3,88,107],"requirement":[4],"for":[5,129],"microelectronic":[6],"circuits":[7,33],"used":[8],"in":[9,55],"aerospace":[10],"applications":[11],"as":[12,104,106],"they":[13],"are":[14],"prone":[15],"to":[16,30,35,94,111,119],"radiation":[17,75,120],"induced":[18],"upsets":[19],"from":[20],"high":[21],"altitude":[22],"neutrons":[23],"and":[24,65,123],"ions.":[25],"The":[26,40],"most":[27],"common":[28],"method":[29],"harden":[31],"VLSI":[32],"use":[36],"hardened":[37,98,121],"flip-flops":[38,122],"(FFs).":[39],"design":[41,92],"of":[42],"these":[43],"FFs":[44],"made":[46],"more":[47],"difficult":[48],"with":[49],"increasing":[50],"multi-node":[51,132],"charge":[52,63,133],"collection":[53],"(MNCC)":[54],"advanced":[56],"scaled":[57],"fabrication":[58],"processes,":[59],"which":[60,97],"requires":[61],"that":[62,72],"storage":[64],"other":[66],"sensitive":[67],"nodes":[68,81,100],"be":[69,102],"separated":[70],"so":[71],"one":[73],"impinging":[74],"particle":[76],"does":[77],"not":[78],"affect":[79],"redundant":[80],"simultaneously.":[82],"In":[83],"this":[84,113],"paper":[85],"we":[86],"describe":[87],"correct":[89],"by":[90],"construction":[91],"methodology":[93,118],"determine":[95],"a-priori":[96],"FF":[99],"must":[101],"separated,":[103],"well":[105],"general":[108],"interleaving":[109],"scheme":[110],"achieve":[112],"separation.":[114],"We":[115],"apply":[116],"the":[117],"demonstrate":[124],"optimal":[125],"circuit":[126],"physical":[127],"organization":[128],"protection":[130],"against":[131],"collection.":[134]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":6}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}