{"id":"https://openalex.org/W1979646733","doi":"https://doi.org/10.1109/isqed.2014.6783357","title":"Application of six-sigma DMAIC methodology in the evaluation of test effectiveness: A case study for EDA tools","display_name":"Application of six-sigma DMAIC methodology in the evaluation of test effectiveness: A case study for EDA tools","publication_year":2014,"publication_date":"2014-03-01","ids":{"openalex":"https://openalex.org/W1979646733","doi":"https://doi.org/10.1109/isqed.2014.6783357","mag":"1979646733"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2014.6783357","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2014.6783357","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fifteenth International Symposium on Quality Electronic Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001510113","display_name":"Eman El Mandouh","orcid":null},"institutions":[{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]},{"id":"https://openalex.org/I4210099704","display_name":"Mentor","ror":"https://ror.org/016grqh48","country_code":"GB","type":"nonprofit","lineage":["https://openalex.org/I4210099704"]}],"countries":["GB","HU"],"is_corresponding":true,"raw_author_name":"Eman El Mandouh","raw_affiliation_strings":["Mentor Graphics Corporate"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corporate","institution_ids":["https://openalex.org/I105695857","https://openalex.org/I4210099704"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5001510113"],"corresponding_institution_ids":["https://openalex.org/I105695857","https://openalex.org/I4210099704"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.12087169,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"200","issue":null,"first_page":"434","last_page":"441"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9900000095367432,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9900000095367432,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9858999848365784,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.982200026512146,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dmaic","display_name":"DMAIC","score":0.7729804515838623},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7063308954238892},{"id":"https://openalex.org/keywords/six-sigma","display_name":"Six Sigma","score":0.6944330334663391},{"id":"https://openalex.org/keywords/time-to-market","display_name":"Time to market","score":0.6237777471542358},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.5717834234237671},{"id":"https://openalex.org/keywords/usability","display_name":"Usability","score":0.5687255263328552},{"id":"https://openalex.org/keywords/electronic-design-automation","display_name":"Electronic design automation","score":0.5352659225463867},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5078704953193665},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.4992058277130127},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.4946403205394745},{"id":"https://openalex.org/keywords/scope","display_name":"Scope (computer science)","score":0.44559597969055176},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.3970465362071991},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.3699348270893097},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3474705219268799},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.28500938415527344},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1918286681175232},{"id":"https://openalex.org/keywords/database","display_name":"Database","score":0.1498529314994812}],"concepts":[{"id":"https://openalex.org/C205400985","wikidata":"https://www.wikidata.org/wiki/Q380179","display_name":"DMAIC","level":4,"score":0.7729804515838623},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7063308954238892},{"id":"https://openalex.org/C23119410","wikidata":"https://www.wikidata.org/wiki/Q236908","display_name":"Six Sigma","level":3,"score":0.6944330334663391},{"id":"https://openalex.org/C2779229675","wikidata":"https://www.wikidata.org/wiki/Q445235","display_name":"Time to market","level":2,"score":0.6237777471542358},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.5717834234237671},{"id":"https://openalex.org/C170130773","wikidata":"https://www.wikidata.org/wiki/Q216378","display_name":"Usability","level":2,"score":0.5687255263328552},{"id":"https://openalex.org/C64260653","wikidata":"https://www.wikidata.org/wiki/Q1194864","display_name":"Electronic design automation","level":2,"score":0.5352659225463867},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5078704953193665},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.4992058277130127},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.4946403205394745},{"id":"https://openalex.org/C2778012447","wikidata":"https://www.wikidata.org/wiki/Q1034415","display_name":"Scope (computer science)","level":2,"score":0.44559597969055176},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.3970465362071991},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.3699348270893097},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3474705219268799},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.28500938415527344},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1918286681175232},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.1498529314994812},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C137335462","wikidata":"https://www.wikidata.org/wiki/Q380772","display_name":"Lean manufacturing","level":2,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C107457646","wikidata":"https://www.wikidata.org/wiki/Q207434","display_name":"Human\u2013computer interaction","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2014.6783357","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2014.6783357","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fifteenth International Symposium on Quality Electronic Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/12","display_name":"Responsible consumption and production","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1514705535","https://openalex.org/W1827007993","https://openalex.org/W2098070484","https://openalex.org/W2153463648","https://openalex.org/W4244049207"],"related_works":["https://openalex.org/W2757064773","https://openalex.org/W1584919102","https://openalex.org/W1969848021","https://openalex.org/W2046319294","https://openalex.org/W2259171508","https://openalex.org/W2075656146","https://openalex.org/W4243556880","https://openalex.org/W1973251412","https://openalex.org/W2790529218","https://openalex.org/W2082397417"],"abstract_inverted_index":{"As":[0],"the":[1,116,121,153,164,177,199,202],"scale":[2],"and":[3,18,30,86,91,98,120,128,139,172,195],"complexity":[4,119],"of":[5,40,53,78,104,124,166,201],"electronic":[6],"designs":[7],"increase,":[8],"Electronic":[9],"Design":[10],"Automation":[11],"(EDA)":[12],"tools":[13,34,55,108,183],"become":[14],"much":[15],"more":[16],"sophisticated":[17],"have":[19,35,81],"to":[20,24,36,71,84,92,142,151,175,186,190,196],"face":[21],"incredible":[22],"challenges":[23],"keep":[25],"peace":[26],"with":[27,95,180],"increasing":[28,140],"technology":[29],"time-to-market":[31],"pressures.":[32],"EDA":[33,54,107,182],"own":[37],"a":[38,75,112,145,160],"lot":[39],"quality":[41],"attributes":[42],"such":[43],"as":[44,48,50],"performance,":[45],"scalability,":[46],"usability":[47],"well":[49],"functionality.":[51],"Testing":[52],"is":[56,66,109,149],"not":[57],"about":[58,67],"avoiding":[59],"crashes":[60],"or":[61],"core":[62],"dumps,":[63],"but":[64],"it":[65],"verifying":[68],"tool's":[69,117],"ability":[70],"work":[72],"correctly":[73],"on":[74],"wide":[76],"range":[77],"input":[79],"data,":[80],"higher":[82],"capability":[83],"visualize":[85],"debug":[87],"larger":[88],"output":[89],"dataset":[90],"perform":[93],"reasonably":[94],"less":[96],"memory":[97],"time":[99,141],"consumption":[100],"[1].":[101],"The":[102],"scope":[103],"testing":[105,155,184],"in":[106,115],"challenged":[110],"by":[111],"constant":[113],"increase":[114],"code":[118],"expanding":[122],"number":[123],"configurations,":[125],"flows,":[126],"combinations":[127],"platforms":[129],"they":[130],"should":[131],"support.":[132],"With":[133],"shrinking":[134],"product":[135],"development":[136],"life":[137],"cycles":[138],"market":[143],"constraints,":[144],"robust":[146],"quantitative":[147],"method":[148],"needed":[150],"judge":[152],"pre-release":[154],"effectiveness.":[156],"This":[157],"paper":[158],"presents":[159],"case":[161],"study":[162],"for":[163,193],"application":[165],"six-sigma":[167],"DMAIC(Define,":[168],"Measure":[169],"Analyze,":[170],"Improve":[171],"Control)":[173],"methodology":[174],"understand":[176],"main":[178],"problems":[179],"some":[181],"process,":[185],"analytically":[187],"reach":[188],"solutions,":[189],"identify":[191],"opportunities":[192],"improvement":[194],"quantitatively":[197],"monitor":[198],"effectiveness":[200],"proposed":[203],"solutions.":[204]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}