{"id":"https://openalex.org/W2016824522","doi":"https://doi.org/10.1109/isqed.2014.6783301","title":"A 40-nm resilient cache memory for dynamic variation tolerance with bit-enhancing memory and on-chip diagnosis structures delivering ×91 failure rate improvement","display_name":"A 40-nm resilient cache memory for dynamic variation tolerance with bit-enhancing memory and on-chip diagnosis structures delivering ×91 failure rate improvement","publication_year":2014,"publication_date":"2014-03-01","ids":{"openalex":"https://openalex.org/W2016824522","doi":"https://doi.org/10.1109/isqed.2014.6783301","mag":"2016824522"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2014.6783301","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2014.6783301","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fifteenth International Symposium on Quality Electronic Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103590982","display_name":"Yohei Nakata","orcid":null},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yohei Nakata","raw_affiliation_strings":["Graduate School of System Informatics, Kobe University, Kobe, Japan","Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University, Kobe, Japan","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014132866","display_name":"Yuta Kimi","orcid":null},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuta Kimi","raw_affiliation_strings":["Graduate School of System Informatics, Kobe University, Kobe, Japan","Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University, Kobe, Japan","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111719492","display_name":"Shunsuke Okumura","orcid":null},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shunsuke Okumura","raw_affiliation_strings":["Graduate School of System Informatics, Kobe University, Kobe, Japan","Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University, Kobe, Japan","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101764248","display_name":"Jinwook Jung","orcid":"https://orcid.org/0000-0002-9384-5277"},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Jinwook Jung","raw_affiliation_strings":["Graduate School of System Informatics, Kobe University, Kobe, Japan","Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University, Kobe, Japan","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112715429","display_name":"Takuya Sawada","orcid":null},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takuya Sawada","raw_affiliation_strings":["Graduate School of System Informatics, Kobe University, Kobe, Japan","Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University, Kobe, Japan","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028693660","display_name":"Taku Toshikawa","orcid":null},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Taku Toshikawa","raw_affiliation_strings":["Graduate School of System Informatics, Kobe University, Kobe, Japan","Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University, Kobe, Japan","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070370721","display_name":"Makoto Nagata","orcid":"https://orcid.org/0000-0002-0625-9107"},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Makoto Nagata","raw_affiliation_strings":["Japan Science and Technology Agency (JST) CREST, Tokyo, Japan","Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Japan Science and Technology Agency (JST) CREST, Tokyo, Japan","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102077603","display_name":"Hirofumi Nakano","orcid":null},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hirofumi Nakano","raw_affiliation_strings":["Renesas Electronics Corporation, Itami, Japan","Renesas Electron. Corp., Itami, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Electronics Corporation, Itami, Japan","institution_ids":["https://openalex.org/I4210153176"]},{"raw_affiliation_string":"Renesas Electron. Corp., Itami, Japan","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088276903","display_name":"Makoto Yabuuchi","orcid":"https://orcid.org/0000-0003-1515-4726"},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Makoto Yabuuchi","raw_affiliation_strings":["Renesas Electronics Corporation, Kodaira, Japan","Renesas Electron. Corp., Kodaira, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Electronics Corporation, Kodaira, Japan","institution_ids":["https://openalex.org/I4210153176"]},{"raw_affiliation_string":"Renesas Electron. Corp., Kodaira, Japan","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100989173","display_name":"Hidehiro Fujiwara","orcid":null},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hidehiro Fujiwara","raw_affiliation_strings":["Renesas Electronics Corporation, Kodaira, Japan","Renesas Electron. Corp., Kodaira, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Electronics Corporation, Kodaira, Japan","institution_ids":["https://openalex.org/I4210153176"]},{"raw_affiliation_string":"Renesas Electron. Corp., Kodaira, Japan","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047952713","display_name":"Koji Nii","orcid":"https://orcid.org/0000-0002-9986-5308"},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Koji Nii","raw_affiliation_strings":["Renesas Electronics Corporation, Kodaira, Japan","Renesas Electron. Corp., Kodaira, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Electronics Corporation, Kodaira, Japan","institution_ids":["https://openalex.org/I4210153176"]},{"raw_affiliation_string":"Renesas Electron. Corp., Kodaira, Japan","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111546550","display_name":"Hiroyuki Kawai","orcid":null},"institutions":[{"id":"https://openalex.org/I4210153176","display_name":"Renesas Electronics (Japan)","ror":"https://ror.org/058wb7691","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroyuki Kawai","raw_affiliation_strings":["Renesas Electronics Corporation, Tokyo, Japan","Renesas Electron. Corp., Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Renesas Electronics Corporation, Tokyo, Japan","institution_ids":["https://openalex.org/I4210153176"]},{"raw_affiliation_string":"Renesas Electron. Corp., Tokyo, Japan","institution_ids":["https://openalex.org/I4210153176"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052940529","display_name":"Hiroshi Kawaguchi","orcid":"https://orcid.org/0000-0001-8677-4733"},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroshi Kawaguchi","raw_affiliation_strings":["Graduate School of System Informatics, Kobe University, Kobe, Japan","Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of System Informatics, Kobe University, Kobe, Japan","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110454295","display_name":"Masahiko Yoshimoto","orcid":null},"institutions":[{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]},{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masahiko Yoshimoto","raw_affiliation_strings":["Japan Science and Technology Agency (JST) CREST, Tokyo, Japan","Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Japan Science and Technology Agency (JST) CREST, Tokyo, Japan","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan","institution_ids":["https://openalex.org/I65837984"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":14,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2129,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.5879444,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"16","last_page":"23"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-droop","display_name":"Voltage droop","score":0.8210639953613281},{"id":"https://openalex.org/keywords/cache","display_name":"Cache","score":0.7844914197921753},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6677934527397156},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6112682223320007},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5305410027503967},{"id":"https://openalex.org/keywords/cpu-cache","display_name":"CPU cache","score":0.5248361229896545},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.46245431900024414},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4569055140018463},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4077075719833374},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3364070653915405},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3240726590156555},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2853560149669647},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21778184175491333},{"id":"https://openalex.org/keywords/voltage-regulator","display_name":"Voltage regulator","score":0.15778830647468567},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13181522488594055},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08573836088180542}],"concepts":[{"id":"https://openalex.org/C40760162","wikidata":"https://www.wikidata.org/wiki/Q10920295","display_name":"Voltage droop","level":4,"score":0.8210639953613281},{"id":"https://openalex.org/C115537543","wikidata":"https://www.wikidata.org/wiki/Q165596","display_name":"Cache","level":2,"score":0.7844914197921753},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6677934527397156},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6112682223320007},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5305410027503967},{"id":"https://openalex.org/C189783530","wikidata":"https://www.wikidata.org/wiki/Q352090","display_name":"CPU cache","level":3,"score":0.5248361229896545},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.46245431900024414},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4569055140018463},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4077075719833374},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3364070653915405},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3240726590156555},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2853560149669647},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21778184175491333},{"id":"https://openalex.org/C110706871","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Voltage regulator","level":3,"score":0.15778830647468567},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13181522488594055},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08573836088180542}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2014.6783301","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2014.6783301","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fifteenth International Symposium on Quality Electronic Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7200000286102295,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1565403545","https://openalex.org/W1702767802","https://openalex.org/W1995460436","https://openalex.org/W2015917466","https://openalex.org/W2076566564","https://openalex.org/W2110142825","https://openalex.org/W2130583886","https://openalex.org/W2146410479","https://openalex.org/W2147657366","https://openalex.org/W2157447136","https://openalex.org/W2165952864","https://openalex.org/W2178284432","https://openalex.org/W4231535434","https://openalex.org/W6633895739"],"related_works":["https://openalex.org/W2119025037","https://openalex.org/W2186949690","https://openalex.org/W2549803267","https://openalex.org/W2497617944","https://openalex.org/W3019064768","https://openalex.org/W2167303720","https://openalex.org/W1563139915","https://openalex.org/W3019683061","https://openalex.org/W2061075966","https://openalex.org/W3147501184"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,12,22,50,60,66,91,122],"resilient":[4,31],"cache":[5,16,32,74,142],"memory":[6],"for":[7],"dynamic":[8],"variation":[9],"tolerance":[10],"in":[11,144,149],"40-nm":[13],"CMOS.":[14],"The":[15,72,135],"can":[17,45,58,75,87],"perform":[18],"sustained":[19,28],"operations":[20],"under":[21,90],"large-amplitude":[23,92],"voltage":[24,63,93],"droop.":[25,94],"To":[26],"realize":[27],"operation,":[29],"the":[30,70,82,132,140,145],"exploit":[33],"7T/14T":[34,42],"bit-enhancing":[35,43,52,146],"SRAM":[36,44],"and":[37,86,105,113],"on-chip":[38,55],"voltage/temperature":[39,83],"monitoring":[40,56,84],"circuit.":[41],"reconfigure":[46],"itself":[47],"dynamically":[48,76],"to":[49],"reliable":[51],"mode.":[53],"An":[54],"circuit":[57],"sense":[59],"precise":[61],"supply":[62],"level":[64],"of":[65,69,108,125],"power":[67],"rail":[68],"cache.":[71],"proposed":[73,141],"change":[77],"its":[78],"operation":[79],"mode":[80,147],"using":[81],"result":[85,96],"operate":[88],"reliably":[89],"Experimental":[95],"shows":[97,138],"that":[98,139],"it":[99,114],"does":[100],"not":[101],"fail":[102],"with":[103,121,131],"25%":[104],"30%":[106],"droop":[107,124],"V":[109,126],"dd":[112,129],"provides":[115],"91":[116],"times":[117],"better":[118],"failure":[119],"rate":[120],"35%":[123],"compared":[130],"conventional":[133],"design.":[134],"processor":[136],"simulator":[137],"running":[143],"results":[148],"2.88%":[150],"IPC":[151],"loss":[152],"on":[153],"average.":[154]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}