{"id":"https://openalex.org/W2124636026","doi":"https://doi.org/10.1109/isqed.2013.6523646","title":"Peak power reduction of a sensor network processor fabricated with Deeply Depleted Channel transistors in 65nm technology","display_name":"Peak power reduction of a sensor network processor fabricated with Deeply Depleted Channel transistors in 65nm technology","publication_year":2013,"publication_date":"2013-03-01","ids":{"openalex":"https://openalex.org/W2124636026","doi":"https://doi.org/10.1109/isqed.2013.6523646","mag":"2124636026"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2013.6523646","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2013.6523646","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041721902","display_name":"Kentaro Kawakami","orcid":"https://orcid.org/0000-0002-3248-1190"},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"K. Kawakami","raw_affiliation_strings":["Fujitsu Laboratories Limited, Kawasaki, Japan","FUJITSU LABORATORIES LTD. Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Limited, Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"FUJITSU LABORATORIES LTD. Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091838315","display_name":"Takeshi Shiro","orcid":null},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Shiro","raw_affiliation_strings":["Fujitsu Laboratories Limited, Kawasaki, Japan","FUJITSU LABORATORIES LTD. Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Limited, Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"FUJITSU LABORATORIES LTD. Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037143824","display_name":"H. Yamasaki","orcid":null},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Yamasaki","raw_affiliation_strings":["Fujitsu Laboratories Limited, Kawasaki, Japan","FUJITSU LABORATORIES LTD. Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Limited, Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"FUJITSU LABORATORIES LTD. Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090183307","display_name":"Katsuhiro Yoda","orcid":null},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Yoda","raw_affiliation_strings":["Fujitsu Laboratories Limited, Kawasaki, Japan","FUJITSU LABORATORIES LTD. Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Limited, Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"FUJITSU LABORATORIES LTD. Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113783841","display_name":"H. Fujimoto","orcid":null},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Fujimoto","raw_affiliation_strings":["Fujitsu Laboratories Limited, Kawasaki, Japan","FUJITSU LABORATORIES LTD. Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Limited, Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"FUJITSU LABORATORIES LTD. Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108635531","display_name":"K. Kawasaki","orcid":"https://orcid.org/0009-0001-2108-9812"},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Kawasaki","raw_affiliation_strings":["Fujitsu Laboratories Limited, Kawasaki, Japan","FUJITSU LABORATORIES LTD. Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Limited, Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"FUJITSU LABORATORIES LTD. Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109145214","display_name":"Y. Watanabe","orcid":null},"institutions":[{"id":"https://openalex.org/I2252096349","display_name":"Fujitsu (Japan)","ror":"https://ror.org/038e2g226","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Watanabe","raw_affiliation_strings":["Fujitsu Laboratories Limited, Kawasaki, Japan","FUJITSU LABORATORIES LTD. Kawasaki, Japan"],"affiliations":[{"raw_affiliation_string":"Fujitsu Laboratories Limited, Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]},{"raw_affiliation_string":"FUJITSU LABORATORIES LTD. Kawasaki, Japan","institution_ids":["https://openalex.org/I2252096349"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5041721902"],"corresponding_institution_ids":["https://openalex.org/I2252096349"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15196266,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"422","last_page":"429"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.7603054642677307},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.7014473080635071},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5355072021484375},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5284685492515564},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5258277654647827},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.5164108872413635},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5116575360298157},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.4963141083717346},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4753270447254181},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41117390990257263},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3414789140224457},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23971661925315857},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16538819670677185},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08760598301887512}],"concepts":[{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.7603054642677307},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.7014473080635071},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5355072021484375},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5284685492515564},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5258277654647827},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5164108872413635},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5116575360298157},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.4963141083717346},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4753270447254181},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41117390990257263},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3414789140224457},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23971661925315857},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16538819670677185},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08760598301887512},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2013.6523646","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2013.6523646","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8799999952316284}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1506620311","https://openalex.org/W1670085780","https://openalex.org/W2014010346","https://openalex.org/W2041727850","https://openalex.org/W2044955139","https://openalex.org/W2046304309","https://openalex.org/W2056796532","https://openalex.org/W2069471336","https://openalex.org/W2087321000","https://openalex.org/W2111993105","https://openalex.org/W2121520532","https://openalex.org/W2123949733","https://openalex.org/W2126811283","https://openalex.org/W2128805857","https://openalex.org/W2132421515","https://openalex.org/W2134067926","https://openalex.org/W2150938923","https://openalex.org/W2159361123","https://openalex.org/W2162250277","https://openalex.org/W2164234661","https://openalex.org/W2172094277","https://openalex.org/W2463468293","https://openalex.org/W2532574515","https://openalex.org/W6661926970"],"related_works":["https://openalex.org/W4316095964","https://openalex.org/W2383001583","https://openalex.org/W3151633427","https://openalex.org/W2771395446","https://openalex.org/W2089988144","https://openalex.org/W1985703800","https://openalex.org/W1972388196","https://openalex.org/W2347749188","https://openalex.org/W2735419558","https://openalex.org/W4302313182"],"abstract_inverted_index":{"We":[0],"fabricated":[1],"a":[2,58],"low":[3,75],"power":[4,63,76,111],"sensor":[5,158],"network":[6,159],"processor":[7],"with":[8],"Deeply":[9],"Depleted":[10],"Channel":[11],"(DDC)":[12],"transistors":[13,35],"of":[14,26,34,61,92,100,110,128,136,157],"65":[15],"nm":[16],"technology,":[17],"which":[18,150],"has":[19,142],"distinguishing":[20],"device":[21],"structure":[22],"and":[23,89,97,107,116],"enables":[24],"variation":[25],"threshold":[27],"voltage":[28,41,102,147],"(V":[29],"<sub":[30,125],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[31,126],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">th</sub>":[32,127],")":[33],"to":[36,43,72,134],"decrease.":[37],"At":[38],"the":[39,45,54,66,73,83,114,123,129,137,145,154],"optimal":[40,146],"condition":[42],"achieve":[44],"same":[46],"maximum":[47],"operating":[48,93],"frequency,":[49,94],"measurement":[50],"result":[51,80],"shows":[52,82],"that":[53,135],"DDC":[55,84,138],"process":[56,85,131],"achieves":[57],"47.0":[59],"%":[60,88,91,106,109],"peak":[62],"reduction":[64,112],"for":[65,113,153],"micro":[67],"controller":[68],"unit":[69],"(MCU)":[70],"compared":[71],"conventional":[74],"(LP)":[77],"process.":[78,139],"Measurement":[79],"also":[81,143],"improves":[86],"56.5":[87],"15.0":[90],"200":[95],"mV":[96,99],"50":[98],"supply":[101],"margin,":[103],"or":[104],"23.8":[105],"19.0":[108],"MCU":[115],"320":[117],"KB":[118],"SRAM,":[119],"respectively,":[120],"even":[121],"if":[122],"V":[124],"LP":[130],"is":[132,151],"adjusted":[133],"The":[140],"paper":[141],"discussed":[144],"control":[148],"method,":[149],"suitable":[152],"various":[155],"applications":[156],"processors.":[160]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}