{"id":"https://openalex.org/W2148051622","doi":"https://doi.org/10.1109/isqed.2013.6523621","title":"Fast reliability exploration for embedded processors via high-level fault injection","display_name":"Fast reliability exploration for embedded processors via high-level fault injection","publication_year":2013,"publication_date":"2013-03-01","ids":{"openalex":"https://openalex.org/W2148051622","doi":"https://doi.org/10.1109/isqed.2013.6523621","mag":"2148051622"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2013.6523621","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2013.6523621","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100401045","display_name":"Zheng Wang","orcid":"https://orcid.org/0000-0001-6157-0662"},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Zheng Wang","raw_affiliation_strings":["UMIC, RWTH Aachen University, Aachen, Germany"],"affiliations":[{"raw_affiliation_string":"UMIC, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100408398","display_name":"Chao Chen","orcid":"https://orcid.org/0000-0003-1960-4042"},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Chao Chen","raw_affiliation_strings":["UMIC, RWTH Aachen University, Aachen, Germany"],"affiliations":[{"raw_affiliation_string":"UMIC, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089860351","display_name":"Anupam Chattopadhyay","orcid":"https://orcid.org/0000-0002-8818-6983"},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"A. Chattopadhyay","raw_affiliation_strings":["UMIC, RWTH Aachen University, Aachen, Germany"],"affiliations":[{"raw_affiliation_string":"UMIC, RWTH Aachen University, Aachen, Germany","institution_ids":["https://openalex.org/I887968799"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100401045"],"corresponding_institution_ids":["https://openalex.org/I887968799"],"apc_list":null,"apc_paid":null,"fwci":1.6816,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.86321005,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"265","last_page":"272"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.914444088935852},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6798626184463501},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.628912091255188},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6198014616966248},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.610036313533783},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5584198832511902},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.554821252822876},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5543578267097473},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.44944384694099426},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.447317898273468},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.4126071333885193},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.39492952823638916},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.30839771032333374},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.22351256012916565},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18987807631492615},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11352777481079102},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.08347991108894348}],"concepts":[{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.914444088935852},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6798626184463501},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.628912091255188},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6198014616966248},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.610036313533783},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5584198832511902},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.554821252822876},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5543578267097473},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.44944384694099426},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.447317898273468},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.4126071333885193},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.39492952823638916},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.30839771032333374},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.22351256012916565},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18987807631492615},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11352777481079102},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.08347991108894348},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/isqed.2013.6523621","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2013.6523621","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},{"id":"pmh:oai:publications.rwth-aachen.de:226714","is_oa":false,"landing_page_url":"http://publications.rwth-aachen.de/search?p=id:%22RWTH-CONV-204133%22","pdf_url":null,"source":{"id":"https://openalex.org/S4306401033","display_name":"RWTH Publications (RWTH Aachen)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I887968799","host_organization_name":"RWTH Aachen University","host_organization_lineage":["https://openalex.org/I887968799"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"International Symposium on Quality Electronic Design (ISQED 2013) : Santa Clara, California, USA, 4 - 6 March 2013 / [with technical sponsorship from the IEEE Electron Devices Society (EDS) ...]<br/>International Symposium on Quality Electronic Design 2013, ISQED 2013, Santa Clara, California, USA, 2013-03-04 - 2013-03-06","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4300000071525574,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W598796226","https://openalex.org/W1537875328","https://openalex.org/W1556212265","https://openalex.org/W1964073704","https://openalex.org/W2011289549","https://openalex.org/W2017521824","https://openalex.org/W2049694450","https://openalex.org/W2094996433","https://openalex.org/W2098513789","https://openalex.org/W2100866260","https://openalex.org/W2104122494","https://openalex.org/W2104677471","https://openalex.org/W2116097016","https://openalex.org/W2125303664","https://openalex.org/W2126570992","https://openalex.org/W2131132556","https://openalex.org/W2134778828","https://openalex.org/W2155441237","https://openalex.org/W2162203608","https://openalex.org/W2164473871","https://openalex.org/W2166532333","https://openalex.org/W2169213530","https://openalex.org/W2185943396","https://openalex.org/W3145844624","https://openalex.org/W4235799760","https://openalex.org/W4236380341","https://openalex.org/W4236432903","https://openalex.org/W4247904356","https://openalex.org/W4250475448","https://openalex.org/W4253910316"],"related_works":["https://openalex.org/W2971479921","https://openalex.org/W2607474334","https://openalex.org/W2130922779","https://openalex.org/W2138861322","https://openalex.org/W2121043529","https://openalex.org/W2083209667","https://openalex.org/W2098626762","https://openalex.org/W3155997325","https://openalex.org/W2742111403","https://openalex.org/W764083103"],"abstract_inverted_index":{"The":[0,51,116],"downscaling":[1],"of":[2,84,90,114,124,132,141],"technology":[3],"features":[4],"has":[5],"brought":[6],"the":[7,27,48,55,82,95,100,130,139],"system":[8,56],"developers":[9],"an":[10,87],"important":[11,88],"design":[12,57,66,78],"criteria,":[13],"reliability,":[14],"into":[15],"prime":[16],"consideration.":[17],"Due":[18],"to":[19,34,40,94],"effects":[20],"like":[21],"external":[22],"radiation":[23],"and":[24,134],"temperature":[25],"gradients,":[26],"CMOS":[28],"device":[29],"is":[30,42,69,107],"not":[31],"guaranteed":[32],"anymore":[33],"function":[35],"flawlessly.":[36],"Admission":[37],"for":[38,63,153],"errors":[39],"occur":[41],"also":[43,120,164],"helpful":[44],"as":[45],"that":[46],"increases":[47],"power":[49],"budget.":[50],"power-reliability":[52],"trade-off":[53],"compounds":[54],"challenge":[58],"by":[59,129,144],"adding":[60],"another":[61],"metric,":[62],"which":[64],"efficient":[65],"exploration":[67,123],"framework":[68,79,119,167],"needed.":[70],"In":[71],"this":[72],"work,":[73],"we":[74],"present":[75],"a":[76,145,149,160,169],"high-level":[77],"extended":[80],"with":[81,148,168],"capability":[83],"fault":[85,98,102,117,125,157,172],"injection,":[86,99],"ingredient":[89],"reliability-driven":[91],"design.":[92],"Compared":[93],"traditional":[96],"HDL-based":[97,171],"proposed":[101],"injection":[103,118,173],"during":[104],"instruction-set":[105],"simulation":[106],"significantly":[108],"faster":[109],"without":[110],"any":[111],"notable":[112],"loss":[113],"accuracy.":[115],"allows":[121],"quick":[122],"prevention":[126],"measure":[127],"both":[128],"aid":[131],"software":[133],"hardware":[135],"techniques.":[136],"We":[137,163],"demonstrate":[138],"efficacy":[140],"our":[142,166],"approach":[143],"case":[146],"study":[147],"RISC":[150],"processor":[151],"customized":[152],"cryptographic":[154],"application,":[155],"where":[156],"protection":[158],"plays":[159],"major":[161],"role.":[162],"benchmark":[165],"state-of-the-art":[170],"framework.":[174]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}