{"id":"https://openalex.org/W2168699553","doi":"https://doi.org/10.1109/isqed.2013.6523616","title":"Vision-inspired global routing for enhanced performance and reliability","display_name":"Vision-inspired global routing for enhanced performance and reliability","publication_year":2013,"publication_date":"2013-03-01","ids":{"openalex":"https://openalex.org/W2168699553","doi":"https://doi.org/10.1109/isqed.2013.6523616","mag":"2168699553"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2013.6523616","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2013.6523616","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003380356","display_name":"Jun Yong Shin","orcid":null},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Jun Yong Shin","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, University of California, Irvine, Irvine, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, University of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007817952","display_name":"Nikil Dutt","orcid":"https://orcid.org/0000-0002-3060-8119"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N. Dutt","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, University of California, Irvine, Irvine, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, University of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008034875","display_name":"Fadi Kurdahi","orcid":"https://orcid.org/0000-0002-6982-365X"},"institutions":[{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"F. Kurdahi","raw_affiliation_strings":["Department of Electrical Engineering and Computer Science, University of California, Irvine, Irvine, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Computer Science, University of California, Irvine, Irvine, CA, USA","institution_ids":["https://openalex.org/I204250578"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5003380356"],"corresponding_institution_ids":["https://openalex.org/I204250578"],"apc_list":null,"apc_paid":null,"fwci":0.2364,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.63557603,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"239","last_page":"244"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromigration","display_name":"Electromigration","score":0.7454184293746948},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7310081124305725},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.7301639914512634},{"id":"https://openalex.org/keywords/router","display_name":"Router","score":0.7275580763816833},{"id":"https://openalex.org/keywords/routing","display_name":"Routing (electronic design automation)","score":0.678551435470581},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.6299120187759399},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.575843334197998},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.47627419233322144},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4418072998523712},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.43304795026779175},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.41597509384155273},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4013587236404419},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.31531500816345215},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2302098572254181},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20229974389076233},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.15787819027900696},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10842141509056091},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09492868185043335},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.07474681735038757},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06928953528404236}],"concepts":[{"id":"https://openalex.org/C138055206","wikidata":"https://www.wikidata.org/wiki/Q1319010","display_name":"Electromigration","level":2,"score":0.7454184293746948},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7310081124305725},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.7301639914512634},{"id":"https://openalex.org/C2775896111","wikidata":"https://www.wikidata.org/wiki/Q642560","display_name":"Router","level":2,"score":0.7275580763816833},{"id":"https://openalex.org/C74172769","wikidata":"https://www.wikidata.org/wiki/Q1446839","display_name":"Routing (electronic design automation)","level":2,"score":0.678551435470581},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6299120187759399},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.575843334197998},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.47627419233322144},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4418072998523712},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.43304795026779175},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.41597509384155273},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4013587236404419},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.31531500816345215},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2302098572254181},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20229974389076233},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.15787819027900696},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10842141509056091},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09492868185043335},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.07474681735038757},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06928953528404236},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2013.6523616","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2013.6523616","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1984588379","https://openalex.org/W1987786682","https://openalex.org/W2007719944","https://openalex.org/W2111596650","https://openalex.org/W2127218421","https://openalex.org/W2129960401","https://openalex.org/W2132816157","https://openalex.org/W2146669920","https://openalex.org/W2150547314","https://openalex.org/W2161981431","https://openalex.org/W2540437384","https://openalex.org/W2752573522","https://openalex.org/W3145128584","https://openalex.org/W4245052796","https://openalex.org/W6678914141","https://openalex.org/W6728716478"],"related_works":["https://openalex.org/W2136403807","https://openalex.org/W796810817","https://openalex.org/W2127180614","https://openalex.org/W2018755015","https://openalex.org/W2167711148","https://openalex.org/W4235531327","https://openalex.org/W1603115038","https://openalex.org/W2177095534","https://openalex.org/W1964344619","https://openalex.org/W2163233359"],"abstract_inverted_index":{"As":[0],"we":[1,100],"enter":[2],"the":[3,14,34,48,86,92,116,142,162],"deep":[4],"submicron":[5],"era,":[6],"transistors":[7],"are":[8],"increasingly":[9],"added":[10],"to":[11,16,26,57,84,122,151],"chips,":[12],"causing":[13],"chips":[15,53],"become":[17],"hotter":[18],"in":[19,30,50,114,146],"a":[20,41,102,157],"non-uniform":[21],"manner.":[22],"This":[23,36],"is":[24,125,133],"due":[25,56,121],"different":[27,31],"processing":[28,109],"tasks":[29],"parts":[32],"of":[33,44,52,64,89,95,118,144,164],"chips.":[35],"thermal":[37,73],"gradient":[38],"also":[39,134],"causes":[40],"great":[42],"number":[43,143],"problems":[45],"such":[46],"as":[47,166,168],"reduction":[49],"reliability":[51],"and":[54,59,67,91,110,127],"interconnects":[55,165],"electromigration,":[58],"system":[60],"performance":[61,128],"degradation":[62,129],"because":[63],"increased":[65,131],"delay":[66,94,132,163],"lowered":[68],"clock":[69],"frequencies.":[70],"Since":[71],"these":[72],"issues":[74],"exist,":[75],"interconnect":[76,123],"routing,":[77,80],"especially":[78],"global":[79,103],"should":[81],"be":[82],"performed":[83],"consider":[85],"temperature":[87],"distribution":[88],"substrates":[90],"actual":[93],"interconnects.":[96],"In":[97],"this":[98],"paper,":[99],"propose":[101],"routing":[104],"method":[105,140],"based":[106],"on":[107],"image":[108],"computer":[111],"vision":[112],"techniques":[113],"which":[115],"probability":[117],"chip":[119],"failure":[120,124],"reduced,":[126],"from":[130],"prevented.":[135],"We":[136],"observed":[137],"that":[138],"our":[139],"reduced":[141],"grids":[145],"hot":[147],"regions":[148],"by":[149],"up":[150],"50":[152],"%":[153],"when":[154],"compared":[155],"with":[156],"conventional":[158],"router,":[159],"while":[160],"maintaining":[161],"small":[167],"possible.":[169]},"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}