{"id":"https://openalex.org/W2145847330","doi":"https://doi.org/10.1109/isqed.2012.6187553","title":"24% Power reduction by post-fabrication dual supply voltage control of 64 voltage domains in V&lt;inf&gt;DDmin&lt;/inf&gt; limited ultra low voltage logic circuits","display_name":"24% Power reduction by post-fabrication dual supply voltage control of 64 voltage domains in V&lt;inf&gt;DDmin&lt;/inf&gt; limited ultra low voltage logic circuits","publication_year":2012,"publication_date":"2012-03-01","ids":{"openalex":"https://openalex.org/W2145847330","doi":"https://doi.org/10.1109/isqed.2012.6187553","mag":"2145847330"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2012.6187553","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2012.6187553","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thirteenth International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036785948","display_name":"Tadashi Yasufuku","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Tadashi Yasufuku","raw_affiliation_strings":["University of Tokyo, Japan","University of Tokyo, , Japan"],"affiliations":[{"raw_affiliation_string":"University of Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"University of Tokyo, , Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050277015","display_name":"Koji Hirairi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Koji Hirairi","raw_affiliation_strings":["Semiconductor Technology Academic Research Center, Japan","Semiconductor Technology Academic Research Center (STARC), Japan"],"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center, Japan","institution_ids":["https://openalex.org/I4210125918"]},{"raw_affiliation_string":"Semiconductor Technology Academic Research Center (STARC), Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037936776","display_name":"Yu Pu","orcid":"https://orcid.org/0000-0001-8366-8572"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yu Pu","raw_affiliation_strings":["University of Tokyo, Japan","University of Tokyo, , Japan"],"affiliations":[{"raw_affiliation_string":"University of Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"University of Tokyo, , Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082251048","display_name":"Yun Zheng","orcid":"https://orcid.org/0000-0002-7273-5327"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yun Fei Zheng","raw_affiliation_strings":["University of Tokyo, Japan","University of Tokyo, , Japan"],"affiliations":[{"raw_affiliation_string":"University of Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"University of Tokyo, , Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043884951","display_name":"Ryo Takahashi","orcid":"https://orcid.org/0000-0001-5045-341X"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryo Takahashi","raw_affiliation_strings":["University of Tokyo, Japan","University of Tokyo, , Japan"],"affiliations":[{"raw_affiliation_string":"University of Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"University of Tokyo, , Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100647936","display_name":"Masato Sasaki","orcid":"https://orcid.org/0000-0001-7505-1580"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masato Sasaki","raw_affiliation_strings":["University of Tokyo, Japan","University of Tokyo, , Japan"],"affiliations":[{"raw_affiliation_string":"University of Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"University of Tokyo, , Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004321250","display_name":"Hiroshi Fuketa","orcid":"https://orcid.org/0000-0003-0171-6679"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroshi Fuketa","raw_affiliation_strings":["University of Tokyo, Japan","University of Tokyo, , Japan"],"affiliations":[{"raw_affiliation_string":"University of Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"University of Tokyo, , Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108573399","display_name":"Atsushi Muramatsu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Atsushi Muramatsu","raw_affiliation_strings":["Semiconductor Technology Academic Research Center, Japan","Semiconductor Technology Academic Research Center (STARC), Japan"],"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center, Japan","institution_ids":["https://openalex.org/I4210125918"]},{"raw_affiliation_string":"Semiconductor Technology Academic Research Center (STARC), Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005079654","display_name":"Masahiro Nomura","orcid":"https://orcid.org/0000-0003-3706-4836"},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masahiro Nomura","raw_affiliation_strings":["Semiconductor Technology Academic Research Center, Japan","Semiconductor Technology Academic Research Center (STARC), Japan"],"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center, Japan","institution_ids":["https://openalex.org/I4210125918"]},{"raw_affiliation_string":"Semiconductor Technology Academic Research Center (STARC), Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008563407","display_name":"Hirofumi Shinohara","orcid":"https://orcid.org/0000-0001-5589-8397"},"institutions":[{"id":"https://openalex.org/I4210125918","display_name":"Semiconductor Energy Laboratory (Japan)","ror":"https://ror.org/02vszc135","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210125918"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hirofumi Shinohara","raw_affiliation_strings":["Semiconductor Technology Academic Research Center, Japan","Semiconductor Technology Academic Research Center (STARC), Japan"],"affiliations":[{"raw_affiliation_string":"Semiconductor Technology Academic Research Center, Japan","institution_ids":["https://openalex.org/I4210125918"]},{"raw_affiliation_string":"Semiconductor Technology Academic Research Center (STARC), Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003282110","display_name":"Makoto Takamiya","orcid":"https://orcid.org/0000-0003-0289-7790"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Makoto Takamiya","raw_affiliation_strings":["University of Tokyo, Japan","University of Tokyo, , Japan"],"affiliations":[{"raw_affiliation_string":"University of Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"University of Tokyo, , Japan","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112189116","display_name":"Takayasu Sakurai","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takayasu Sakurai","raw_affiliation_strings":["University of Tokyo, Japan","University of Tokyo, , Japan"],"affiliations":[{"raw_affiliation_string":"University of Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"University of Tokyo, , Japan","institution_ids":["https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":12,"corresponding_author_ids":["https://openalex.org/A5036785948"],"corresponding_institution_ids":["https://openalex.org/I74801974"],"apc_list":null,"apc_paid":null,"fwci":0.982,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.79478269,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"586","last_page":"591"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4626769423484802},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39937371015548706},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3647013306617737},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3473455309867859},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1688435971736908}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4626769423484802},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39937371015548706},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3647013306617737},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3473455309867859},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1688435971736908}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2012.6187553","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2012.6187553","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Thirteenth International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8899999856948853,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2025847799","https://openalex.org/W2055317051","https://openalex.org/W2119935308","https://openalex.org/W2137041830","https://openalex.org/W2152510163","https://openalex.org/W2158915695","https://openalex.org/W2168156204","https://openalex.org/W3147809611","https://openalex.org/W3151972521","https://openalex.org/W6656891329"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2899084033","https://openalex.org/W3014521742","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W2376932109","https://openalex.org/W4306968100","https://openalex.org/W2382290278"],"abstract_inverted_index":{"A":[0,160],"post-fabrication":[1],"dual":[2],"supply":[3],"voltage":[4,14,22,30],"(V":[5,23,95,106],"<sub":[6,24,39,44,78,92,96,103,107,121,134,141,148,155,174,181],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[7,25,40,45,79,93,97,104,108,122,135,142,149,156,175,182],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DD</sub>":[8,41,80,94,105,123],")":[9,99,110],"control":[10],"(PDVC)":[11],"of":[12,53,70,119],"multiple":[13,129],"domains":[15,81],"is":[16,57,73,86,111,125,137,151],"proposed":[17,169],"for":[18],"a":[19,60],"minimum":[20],"operating":[21],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DDmin</sub>":[26,46,143,157],")-limited":[27],"ultra":[28],"low":[29,101],"logic":[31,54],"circuits.":[32,55],"PDVC":[33,56,170],"effectively":[34],"reduces":[35],"an":[36],"average":[37],"V":[38,43,77,91,102,120,133,140,147,154,173,180],"below":[42],",":[47],"thereby":[48],"reducing":[49],"the":[50,117,168],"power":[51,163],"consumption":[52],"applied":[58,112],"to":[59,113],"DES":[61,71],"CODEC'S":[62,72],"circuit":[63],"fabricated":[64],"in":[65,139,153],"65nm":[66],"CMOS.":[67],"The":[68],"layout":[69],"divided":[74],"into":[75],"64":[76],"and":[82,116,179],"each":[83,114],"domain":[84,115],"size":[85],"54\u03bcm":[87],"\u00d7":[88],"63.2\u03bcm.":[89],"High":[90],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DDH</sub>":[98,136,176],"or":[100],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DDL</sub>":[109,150,183],"selection":[118],"'s":[124],"performed":[126],"based":[127],"on":[128],"built-in":[130],"self":[131],"tests.":[132],"selected":[138,152],"-critical":[144],"domains,":[145],"while":[146],"-non-critical":[158],"domains.":[159],"maximum":[161],"24%":[162],"reduction":[164],"was":[165],"measured":[166],"with":[167],"at":[171],"300kHz,":[172],"=":[177,184],"3D437mV,":[178],"3D397mV.":[185]},"counts_by_year":[{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}