{"id":"https://openalex.org/W2136193292","doi":"https://doi.org/10.1109/isqed.2011.5770789","title":"SEU tolerant SRAM cell","display_name":"SEU tolerant SRAM cell","publication_year":2011,"publication_date":"2011-03-01","ids":{"openalex":"https://openalex.org/W2136193292","doi":"https://doi.org/10.1109/isqed.2011.5770789","mag":"2136193292"},"language":"pt","primary_location":{"id":"doi:10.1109/isqed.2011.5770789","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2011.5770789","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 12th International Symposium on Quality Electronic Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028719602","display_name":"Sudipta Sarkar","orcid":"https://orcid.org/0000-0003-0551-6543"},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Sudipta Sarkar","raw_affiliation_strings":["Indian Institute of Science, Bangalore, India","Indian Inst. of Science, Bangalore  India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Science, Bangalore, India","institution_ids":["https://openalex.org/I59270414"]},{"raw_affiliation_string":"Indian Inst. of Science, Bangalore  India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017294735","display_name":"Anubhav Adak","orcid":null},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Anubhav Adak","raw_affiliation_strings":["Indian Institute of Science, Bangalore, India","Indian Inst. of Science, Bangalore  India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Science, Bangalore, India","institution_ids":["https://openalex.org/I59270414"]},{"raw_affiliation_string":"Indian Inst. of Science, Bangalore  India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073587430","display_name":"Virendra Singh","orcid":"https://orcid.org/0000-0002-7035-7844"},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Virendra Singh","raw_affiliation_strings":["Indian Institute of Science, Bangalore, India","Indian Inst. of Science, Bangalore  India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Science, Bangalore, India","institution_ids":["https://openalex.org/I59270414"]},{"raw_affiliation_string":"Indian Inst. of Science, Bangalore  India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110218098","display_name":"Kewal K. Saluja","orcid":null},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kewal Saluja","raw_affiliation_strings":["University of Wisconsin, Madison, USA","University of Wisconsin\u2013Madison  USA"],"affiliations":[{"raw_affiliation_string":"University of Wisconsin, Madison, USA","institution_ids":["https://openalex.org/I135310074"]},{"raw_affiliation_string":"University of Wisconsin\u2013Madison  USA","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027837299","display_name":"Masahiro Fujita","orcid":"https://orcid.org/0000-0002-6516-4175"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masahiro Fujita","raw_affiliation_strings":["University of Tokyo, Japan","University of Tokyo, , Japan"],"affiliations":[{"raw_affiliation_string":"University of Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"University of Tokyo, , Japan","institution_ids":["https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5028719602"],"corresponding_institution_ids":["https://openalex.org/I59270414"],"apc_list":null,"apc_paid":null,"fwci":1.3477,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.8347205,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"16","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9889000058174133,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8834694623947144},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.831695556640625},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7998299598693848},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5804117321968079},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5373975038528442},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.5119427442550659},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4654479920864105},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.45287027955055237},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.43244442343711853},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4029015898704529},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2668534517288208},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26199662685394287},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.22934585809707642},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1693095564842224}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8834694623947144},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.831695556640625},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7998299598693848},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5804117321968079},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5373975038528442},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.5119427442550659},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4654479920864105},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.45287027955055237},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.43244442343711853},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4029015898704529},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2668534517288208},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26199662685394287},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.22934585809707642},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1693095564842224},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2011.5770789","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2011.5770789","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 12th International Symposium on Quality Electronic Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1591148251","https://openalex.org/W2003964202","https://openalex.org/W2030501553","https://openalex.org/W2101838114","https://openalex.org/W2104304150","https://openalex.org/W2105981249","https://openalex.org/W2143291726","https://openalex.org/W2155822792","https://openalex.org/W2159262743","https://openalex.org/W2160410291","https://openalex.org/W2161033118","https://openalex.org/W2161714728","https://openalex.org/W6675685769"],"related_works":["https://openalex.org/W1500230652","https://openalex.org/W2077268733","https://openalex.org/W3208260600","https://openalex.org/W2136193292","https://openalex.org/W1509746271","https://openalex.org/W2112208503","https://openalex.org/W3097930358","https://openalex.org/W4214914025","https://openalex.org/W2128298986","https://openalex.org/W3137664271"],"abstract_inverted_index":{"Modern":[0],"integrated":[1],"circuits":[2],"require":[3],"careful":[4],"attention":[5],"to":[6,28],"the":[7,62,69,87],"soft":[8],"errors":[9],"resulting":[10],"into":[11],"bit":[12],"upsets,":[13],"which":[14],"are":[15],"normally":[16],"caused":[17],"by":[18],"alpha":[19],"particle":[20],"or":[21],"neutron":[22],"hits.":[23],"These":[24],"events,":[25],"also":[26],"referred":[27],"as":[29,74],"single-event":[30],"upsets":[31],"(SEUs),":[32],"will":[33],"become":[34],"more":[35],"severe":[36],"for":[37,80],"future":[38],"technologies.":[39],"In":[40],"this":[41],"paper":[42],"we":[43],"propose":[44],"a":[45,81,90],"novel":[46],"10T":[47],"SEU":[48],"tolerant":[49],"SRAM":[50,54,93],"cell":[51,55,71],"design.":[52],"Our":[53],"is":[56,72],"area":[57],"efficient":[58],"in":[59],"comparison":[60],"with":[61,84],"earlier":[63],"proposals.":[64],"Simulation":[65],"results":[66],"show":[67],"that":[68],"proposed":[70],"robust":[73],"it":[75],"does":[76],"not":[77],"flip":[78],"even":[79],"transient":[82],"pulse":[83],"four":[85],"times":[86],"Qcrit":[88],"of":[89],"standard":[91],"6T":[92],"cell.":[94]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":4},{"year":2012,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}