{"id":"https://openalex.org/W2024327457","doi":"https://doi.org/10.1109/isqed.2010.5450536","title":"New SRAM design using body bias technique for ultra low power applications","display_name":"New SRAM design using body bias technique for ultra low power applications","publication_year":2010,"publication_date":"2010-03-01","ids":{"openalex":"https://openalex.org/W2024327457","doi":"https://doi.org/10.1109/isqed.2010.5450536","mag":"2024327457"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2010.5450536","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2010.5450536","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 11th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043716992","display_name":"Farshad Moradi","orcid":"https://orcid.org/0000-0001-7077-8545"},"institutions":[{"id":"https://openalex.org/I184942183","display_name":"University of Oslo","ror":"https://ror.org/01xtthb56","country_code":"NO","type":"education","lineage":["https://openalex.org/I184942183"]},{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["NO","US"],"is_corresponding":false,"raw_author_name":"Farshad Moradi","raw_affiliation_strings":["Department of ECE, Purdue University, West Lafayette, IN, USA","Nanoelectronics Group, Department of Informatics, University of Oslo, Oslo, Norway"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of ECE, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]},{"raw_affiliation_string":"Nanoelectronics Group, Department of Informatics, University of Oslo, Oslo, Norway","institution_ids":["https://openalex.org/I184942183"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081565415","display_name":"Dag T. Wisland","orcid":"https://orcid.org/0000-0002-3678-3946"},"institutions":[{"id":"https://openalex.org/I184942183","display_name":"University of Oslo","ror":"https://ror.org/01xtthb56","country_code":"NO","type":"education","lineage":["https://openalex.org/I184942183"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"Dag T. Wisland","raw_affiliation_strings":["Nanoelectronics Group, Department of Informatics, University of Oslo, Oslo, Norway"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanoelectronics Group, Department of Informatics, University of Oslo, Oslo, Norway","institution_ids":["https://openalex.org/I184942183"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066983905","display_name":"Hamid Mahmoodi","orcid":"https://orcid.org/0000-0003-4237-3086"},"institutions":[{"id":"https://openalex.org/I71838634","display_name":"San Francisco State University","ror":"https://ror.org/05ykr0121","country_code":"US","type":"education","lineage":["https://openalex.org/I71838634"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hamid Mahmoodi","raw_affiliation_strings":["School of Engineering, San Francisco State University, San Francisco, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, San Francisco State University, San Francisco, CA, USA","institution_ids":["https://openalex.org/I71838634"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103258590","display_name":"Yngvar Berg","orcid":"https://orcid.org/0000-0003-4519-995X"},"institutions":[{"id":"https://openalex.org/I184942183","display_name":"University of Oslo","ror":"https://ror.org/01xtthb56","country_code":"NO","type":"education","lineage":["https://openalex.org/I184942183"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"Yngvar Berg","raw_affiliation_strings":["Nanoelectronics Group, Department of Informatics, University of Oslo, Oslo, Norway"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanoelectronics Group, Department of Informatics, University of Oslo, Oslo, Norway","institution_ids":["https://openalex.org/I184942183"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5105837607","display_name":"Tuan Vu Cao","orcid":null},"institutions":[{"id":"https://openalex.org/I184942183","display_name":"University of Oslo","ror":"https://ror.org/01xtthb56","country_code":"NO","type":"education","lineage":["https://openalex.org/I184942183"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"Tuan Vu Cao","raw_affiliation_strings":["Nanoelectronics Group, Department of Informatics, University of Oslo, Oslo, Norway"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanoelectronics Group, Department of Informatics, University of Oslo, Oslo, Norway","institution_ids":["https://openalex.org/I184942183"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"468","last_page":"471"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.905251681804657},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.8330624103546143},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.7492780685424805},{"id":"https://openalex.org/keywords/noise-margin","display_name":"Noise margin","score":0.6667998433113098},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5957576036453247},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5288090705871582},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5107543468475342},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5024282932281494},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45357975363731384},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3214390277862549},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26454371213912964},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.23480787873268127},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12648910284042358}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.905251681804657},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.8330624103546143},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.7492780685424805},{"id":"https://openalex.org/C179499742","wikidata":"https://www.wikidata.org/wiki/Q1324892","display_name":"Noise margin","level":4,"score":0.6667998433113098},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5957576036453247},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5288090705871582},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5107543468475342},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5024282932281494},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45357975363731384},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3214390277862549},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26454371213912964},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.23480787873268127},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12648910284042358},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/isqed.2010.5450536","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2010.5450536","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 11th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},{"id":"pmh:oai:pure.atira.dk:publications/af48a637-3102-4a77-96ad-d208413c3054","is_oa":false,"landing_page_url":"https://pure.au.dk/portal/en/publications/af48a637-3102-4a77-96ad-d208413c3054","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Moradi, F, Wisland, D T, Mahmoodi, H, Berg, Y & Tuan Vu, C 2010, 'New SRAM design using body bias technique for ultra low power applications', Paper presented at IEEE International Symposium on Quality Electronics Design, San Jose, United States, 22/03/2010 - 24/03/2010.","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7900000214576721}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1491082069","https://openalex.org/W1591251167","https://openalex.org/W1753784006","https://openalex.org/W2002038549","https://openalex.org/W2078755136","https://openalex.org/W2134421493","https://openalex.org/W2397682474","https://openalex.org/W6650729477","https://openalex.org/W6675628332"],"related_works":["https://openalex.org/W2053448087","https://openalex.org/W2118528827","https://openalex.org/W2154145758","https://openalex.org/W2110839220","https://openalex.org/W1582224818","https://openalex.org/W2775062502","https://openalex.org/W2044270051","https://openalex.org/W4285609043","https://openalex.org/W2894151971","https://openalex.org/W3032966989"],"abstract_inverted_index":{"A":[0],"new":[1],"SRAM":[2,34],"design":[3],"is":[4,31,36,54],"proposed.":[5],"Body":[6],"biasing":[7,61],"improves":[8],"the":[9,21,49],"static":[10],"noise":[11],"margin":[12],"(SNM)":[13],"improved":[14],"by":[15],"at":[16],"least":[17],"15%":[18],"compared":[19],"to":[20,58],"standard":[22],"cells.":[23],"Through":[24],"using":[25,59],"this":[26],"technique,":[27],"lowering":[28],"supply":[29,40],"voltage":[30,41],"possible.":[32],"This":[33],"cell":[35],"working":[37],"under":[38],"0.3V":[39],"offering":[42],"a":[43],"SNM":[44],"improvement":[45],"of":[46],"22%":[47],"for":[48,68],"read":[50],"cycle.":[51],"Write":[52],"Margin":[53],"not":[55],"affected":[56],"due":[57],"body":[60],"technique.":[62],"65nm":[63],"ST":[64],"models":[65],"are":[66],"used":[67],"simulations.":[69]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}