{"id":"https://openalex.org/W2063061076","doi":"https://doi.org/10.1109/isqed.2010.5450504","title":"Signal probability control for relieving NBTI in SRAM cells","display_name":"Signal probability control for relieving NBTI in SRAM cells","publication_year":2010,"publication_date":"2010-03-01","ids":{"openalex":"https://openalex.org/W2063061076","doi":"https://doi.org/10.1109/isqed.2010.5450504","mag":"2063061076"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2010.5450504","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2010.5450504","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 11th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/2324/16893","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073805218","display_name":"Yuji Kunitake","orcid":null},"institutions":[{"id":"https://openalex.org/I135598925","display_name":"Kyushu University","ror":"https://ror.org/00p4k0j84","country_code":"JP","type":"education","lineage":["https://openalex.org/I135598925"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuji Kunitake","raw_affiliation_strings":["Kyushu University, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kyushu University, Japan","institution_ids":["https://openalex.org/I135598925"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062587488","display_name":"Toshinori Sato","orcid":"https://orcid.org/0000-0001-5272-7533"},"institutions":[{"id":"https://openalex.org/I31784960","display_name":"Fukuoka University","ror":"https://ror.org/04nt8b154","country_code":"JP","type":"education","lineage":["https://openalex.org/I31784960"]},{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshinori Sato","raw_affiliation_strings":["CREST, Japan Science and Technology Agency, Japan","Fukuoka University, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CREST, Japan Science and Technology Agency, Japan","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"Fukuoka University, Japan","institution_ids":["https://openalex.org/I31784960"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090230648","display_name":"Hiroto Yasuura","orcid":"https://orcid.org/0000-0002-8387-5405"},"institutions":[{"id":"https://openalex.org/I135598925","display_name":"Kyushu University","ror":"https://ror.org/00p4k0j84","country_code":"JP","type":"education","lineage":["https://openalex.org/I135598925"]},{"id":"https://openalex.org/I4210086780","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19","country_code":"JP","type":"government","lineage":["https://openalex.org/I4210086780"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroto Yasuura","raw_affiliation_strings":["CREST, Japan Science and Technology Agency, Japan","Kyushu University, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CREST, Japan Science and Technology Agency, Japan","institution_ids":["https://openalex.org/I4210086780"]},{"raw_affiliation_string":"Kyushu University, Japan","institution_ids":["https://openalex.org/I135598925"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.2368,"has_fulltext":true,"cited_by_count":28,"citation_normalized_percentile":{"value":0.92140136,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"660","last_page":"666"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/negative-bias-temperature-instability","display_name":"Negative-bias temperature instability","score":0.8695133924484253},{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.8595139980316162},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7404046058654785},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.6708106994628906},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6408990621566772},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.6330866813659668},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.48624077439308167},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47993141412734985},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4745113253593445},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4446902871131897},{"id":"https://openalex.org/keywords/noise-margin","display_name":"Noise margin","score":0.4167342782020569},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.36413300037384033},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3188365399837494},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24129745364189148},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17584288120269775},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.08682918548583984}],"concepts":[{"id":"https://openalex.org/C557185","wikidata":"https://www.wikidata.org/wiki/Q6987194","display_name":"Negative-bias temperature instability","level":5,"score":0.8695133924484253},{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.8595139980316162},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7404046058654785},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.6708106994628906},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6408990621566772},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6330866813659668},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.48624077439308167},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47993141412734985},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4745113253593445},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4446902871131897},{"id":"https://openalex.org/C179499742","wikidata":"https://www.wikidata.org/wiki/Q1324892","display_name":"Noise margin","level":4,"score":0.4167342782020569},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.36413300037384033},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3188365399837494},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24129745364189148},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17584288120269775},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.08682918548583984},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/isqed.2010.5450504","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2010.5450504","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 11th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},{"id":"pmh:oai:catalog.lib.kyushu-u.ac.jp:2324/16893","is_oa":true,"landing_page_url":"http://hdl.handle.net/2324/16893","pdf_url":null,"source":{"id":"https://openalex.org/S4306400832","display_name":"Kyushu University Institutional Repository (QIR) (Kyushu University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I135598925","host_organization_name":"Kyushu University","host_organization_lineage":["https://openalex.org/I135598925"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"11th International Symposium on Quality Electronic Design","raw_type":"conference paper"},{"id":"pmh:oai:irdb.nii.ac.jp:01211:0005977763","is_oa":true,"landing_page_url":"https://hdl.handle.net/2324/16893","pdf_url":null,"source":{"id":"https://openalex.org/S7407056385","display_name":"Institutional Repositories DataBase (IRDB)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184597095","host_organization_name":"National Institute of Informatics","host_organization_lineage":["https://openalex.org/I184597095"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"11th International Symposium on Quality Electronic Design","raw_type":"conference paper"}],"best_oa_location":{"id":"pmh:oai:catalog.lib.kyushu-u.ac.jp:2324/16893","is_oa":true,"landing_page_url":"http://hdl.handle.net/2324/16893","pdf_url":null,"source":{"id":"https://openalex.org/S4306400832","display_name":"Kyushu University Institutional Repository (QIR) (Kyushu University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I135598925","host_organization_name":"Kyushu University","host_organization_lineage":["https://openalex.org/I135598925"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"11th International Symposium on Quality Electronic Design","raw_type":"conference paper"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320338075","display_name":"Core Research for Evolutional Science and Technology","ror":"https://ror.org/00097mb19"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1982083551","https://openalex.org/W2002612140","https://openalex.org/W2041424982","https://openalex.org/W2050493779","https://openalex.org/W2099746875","https://openalex.org/W2102729267","https://openalex.org/W2113115586","https://openalex.org/W2118168173","https://openalex.org/W2120802493","https://openalex.org/W2125169487","https://openalex.org/W2134869654","https://openalex.org/W2136066624","https://openalex.org/W2142908374","https://openalex.org/W2149263288","https://openalex.org/W2154857344","https://openalex.org/W4237900519"],"related_works":["https://openalex.org/W1999919743","https://openalex.org/W2081382200","https://openalex.org/W2100282217","https://openalex.org/W4398784231","https://openalex.org/W2157278395","https://openalex.org/W4388836178","https://openalex.org/W2031972468","https://openalex.org/W2096191509","https://openalex.org/W2164047446","https://openalex.org/W1510452813"],"abstract_inverted_index":{"Negative":[0],"Bias":[1],"Temperature":[2],"Instability":[3],"(NBTI)":[4],"is":[5,25,56,86,89,134,176],"one":[6],"of":[7,59,62,93,151,155],"the":[8,41,48,72,82,90,98,127,131,140,145,157,173],"major":[9],"reliability":[10],"problems":[11],"in":[12,20,40,77,106],"advanced":[13],"technologies.":[14],"NBTI":[15,75,94],"causes":[16],"threshold":[17,37,121,167],"voltage":[18,38,122,168],"degradation":[19,46,76,123,169],"a":[21,57,63,102,161],"PMOS":[22,43],"transistor":[23],"which":[24,55],"biased":[26],"to":[27,35,108,113,120,144,160],"negative":[28],"voltage.":[29],"In":[30,67,153],"an":[31,78],"SRAM":[32,65,79,174],"cell,":[33],"due":[34],"NBTI,":[36],"degrades":[39],"load":[42],"transistors.":[44],"The":[45,115],"has":[47],"impact":[49],"on":[50,97],"Static":[51],"Noise":[52],"Margin":[53],"(SNM),":[54],"measure":[58],"read":[60],"stability":[61],"6-T":[64],"cell.":[66],"this":[68],"paper,":[69],"we":[70,100,138,164],"discuss":[71],"relationship":[73],"between":[74],"cell":[80,175],"and":[81],"signal":[83,110],"probability.":[84],"This":[85],"because,":[87],"it":[88],"key":[91],"parameter":[92],"degradation.":[95],"Based":[96],"observations,":[99],"propose":[101],"novel":[103],"cell-flipping":[104,117,132,146,158],"technique":[105,133,147,159],"order":[107],"make":[109],"probability":[111],"close":[112],"50%.":[114],"long":[116],"period":[118,143],"leads":[119],"as":[124,126],"large":[125],"original":[128],"case":[129],"where":[130],"not":[135],"applied.":[136],"Thus,":[137],"employ":[139],"short":[141],"flipping":[142],"without":[148],"any":[149],"stall":[150],"operations.":[152],"consequence":[154],"applying":[156],"register":[162],"file,":[163],"can":[165],"relieve":[166],"by":[170],"70%":[171],"after":[172],"used":[177],"for":[178],"3":[179],"years.":[180]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":5},{"year":2012,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}