{"id":"https://openalex.org/W2162726474","doi":"https://doi.org/10.1109/isqed.2010.5450464","title":"Analysis and modeling of a Low Voltage Triggered SCR ESD protection clamp with the very fast Transmission Line Pulse measurement","display_name":"Analysis and modeling of a Low Voltage Triggered SCR ESD protection clamp with the very fast Transmission Line Pulse measurement","publication_year":2010,"publication_date":"2010-03-01","ids":{"openalex":"https://openalex.org/W2162726474","doi":"https://doi.org/10.1109/isqed.2010.5450464","mag":"2162726474"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2010.5450464","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2010.5450464","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 11th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100422623","display_name":"Jae\u2010Young Park","orcid":"https://orcid.org/0009-0004-6095-0339"},"institutions":[{"id":"https://openalex.org/I4210111902","display_name":"Dongbu HiTek (South Korea)","ror":"https://ror.org/018z3cr21","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210111902"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jae-Young Park","raw_affiliation_strings":["Device Engineering Team, Technical Engineering Center, Dongbu Hitek Company Limited, Bucheon, Gyeonggi, South Korea"],"affiliations":[{"raw_affiliation_string":"Device Engineering Team, Technical Engineering Center, Dongbu Hitek Company Limited, Bucheon, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I4210111902"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056961416","display_name":"Jong-Kyu Song","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111902","display_name":"Dongbu HiTek (South Korea)","ror":"https://ror.org/018z3cr21","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210111902"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jong-Kyu Song","raw_affiliation_strings":["Device Engineering Team, Technical Engineering Center, Dongbu Hitek Company Limited, Bucheon, Gyeonggi, South Korea"],"affiliations":[{"raw_affiliation_string":"Device Engineering Team, Technical Engineering Center, Dongbu Hitek Company Limited, Bucheon, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I4210111902"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088893383","display_name":"Chang-Soo Jang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111902","display_name":"Dongbu HiTek (South Korea)","ror":"https://ror.org/018z3cr21","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210111902"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chang-Soo Jang","raw_affiliation_strings":["Device Engineering Team, Technical Engineering Center, Dongbu Hitek Company Limited, Bucheon, Gyeonggi, South Korea"],"affiliations":[{"raw_affiliation_string":"Device Engineering Team, Technical Engineering Center, Dongbu Hitek Company Limited, Bucheon, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I4210111902"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015182034","display_name":"Young-Sang Son","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111902","display_name":"Dongbu HiTek (South Korea)","ror":"https://ror.org/018z3cr21","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210111902"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Young-Sang Son","raw_affiliation_strings":["Device Engineering Team, Technical Engineering Center, Dongbu Hitek Company Limited, Bucheon, Gyeonggi, South Korea"],"affiliations":[{"raw_affiliation_string":"Device Engineering Team, Technical Engineering Center, Dongbu Hitek Company Limited, Bucheon, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I4210111902"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101661141","display_name":"Dae-Woo Kim","orcid":"https://orcid.org/0000-0001-7937-0853"},"institutions":[{"id":"https://openalex.org/I4210111902","display_name":"Dongbu HiTek (South Korea)","ror":"https://ror.org/018z3cr21","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210111902"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dae-Woo Kim","raw_affiliation_strings":["Device Engineering Team, Technical Engineering Center, Dongbu Hitek Company Limited, Bucheon, Gyeonggi, South Korea"],"affiliations":[{"raw_affiliation_string":"Device Engineering Team, Technical Engineering Center, Dongbu Hitek Company Limited, Bucheon, Gyeonggi, South Korea","institution_ids":["https://openalex.org/I4210111902"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100422623"],"corresponding_institution_ids":["https://openalex.org/I4210111902"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.17423318,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"43","issue":null,"first_page":"206","last_page":"210"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transmission-line","display_name":"Transmission line","score":0.7540217638015747},{"id":"https://openalex.org/keywords/pulse","display_name":"Pulse (music)","score":0.5860366225242615},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5528886318206787},{"id":"https://openalex.org/keywords/rectifier","display_name":"Rectifier (neural networks)","score":0.545602560043335},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5183266401290894},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5030655264854431},{"id":"https://openalex.org/keywords/electric-power-transmission","display_name":"Electric power transmission","score":0.46710148453712463},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.46194037795066833},{"id":"https://openalex.org/keywords/electrostatic-discharge","display_name":"Electrostatic discharge","score":0.45650017261505127},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4178307056427002},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2809174060821533},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.1234714686870575}],"concepts":[{"id":"https://openalex.org/C33441834","wikidata":"https://www.wikidata.org/wiki/Q693004","display_name":"Transmission line","level":2,"score":0.7540217638015747},{"id":"https://openalex.org/C2780167933","wikidata":"https://www.wikidata.org/wiki/Q1550652","display_name":"Pulse (music)","level":3,"score":0.5860366225242615},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5528886318206787},{"id":"https://openalex.org/C50100734","wikidata":"https://www.wikidata.org/wiki/Q7303176","display_name":"Rectifier (neural networks)","level":5,"score":0.545602560043335},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5183266401290894},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5030655264854431},{"id":"https://openalex.org/C140311924","wikidata":"https://www.wikidata.org/wiki/Q200928","display_name":"Electric power transmission","level":2,"score":0.46710148453712463},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.46194037795066833},{"id":"https://openalex.org/C205483674","wikidata":"https://www.wikidata.org/wiki/Q3574961","display_name":"Electrostatic discharge","level":3,"score":0.45650017261505127},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4178307056427002},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2809174060821533},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.1234714686870575},{"id":"https://openalex.org/C86582703","wikidata":"https://www.wikidata.org/wiki/Q7617824","display_name":"Stochastic neural network","level":4,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C147168706","wikidata":"https://www.wikidata.org/wiki/Q1457734","display_name":"Recurrent neural network","level":3,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2010.5450464","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2010.5450464","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 11th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.800000011920929}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1910728869","https://openalex.org/W1984240399","https://openalex.org/W2044400375","https://openalex.org/W2078207669","https://openalex.org/W2115321493","https://openalex.org/W2124240566","https://openalex.org/W2132871374","https://openalex.org/W2133099498","https://openalex.org/W2542983851","https://openalex.org/W2566006804","https://openalex.org/W3022547170","https://openalex.org/W6677368249","https://openalex.org/W6679542466","https://openalex.org/W6679936853"],"related_works":["https://openalex.org/W2544244340","https://openalex.org/W2124694210","https://openalex.org/W2153609444","https://openalex.org/W3160715487","https://openalex.org/W3115307632","https://openalex.org/W4255886484","https://openalex.org/W787855002","https://openalex.org/W2949628984","https://openalex.org/W2096055231","https://openalex.org/W3109294920"],"abstract_inverted_index":{"The":[0,23,70],"analysis":[1],"and":[2,36,73],"the":[3,31,37,44,47,64,74,78],"modeling":[4],"of":[5,77],"a":[6,51,83],"Low":[7],"Voltage":[8],"Triggered":[9],"SCR":[10],"(Silicon":[11],"Controlled":[12],"Rectifier)":[13],"under":[14],"vf-TLP":[15,27,65],"(very-fast":[16],"Transmission":[17],"Line":[18,56],"Pulse)":[19,57],"measurements":[20],"are":[21],"reported.":[22],"results":[24,48],"measured":[25,49,66],"by":[26,50],"system":[28],"showed":[29],"that":[30],"triggering":[32],"voltage":[33],"(Vt1)":[34],"decreased":[35],"second":[38],"breakdown":[39],"current":[40],"(It2)":[41],"increased":[42],"in":[43],"comparison":[45],"with":[46],"standard":[52],"100ns":[53],"TLP":[54],"(Transmission":[55],"system.":[58],"A":[59],"compact":[60],"model":[61,81],"based":[62],"on":[63],"characteristics":[67],"is":[68],"presented.":[69],"measurement":[71],"result":[72],"simulation":[75],"data":[76],"behavior":[79],"approached":[80],"indicate":[82],"good":[84],"correlation.":[85]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}