{"id":"https://openalex.org/W2035578772","doi":"https://doi.org/10.1109/isqed.2010.5450452","title":"A novel probabilistic SET propagation method","display_name":"A novel probabilistic SET propagation method","publication_year":2010,"publication_date":"2010-03-01","ids":{"openalex":"https://openalex.org/W2035578772","doi":"https://doi.org/10.1109/isqed.2010.5450452","mag":"2035578772"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2010.5450452","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2010.5450452","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 11th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036248447","display_name":"Sreenivas Gangadhar","orcid":null},"institutions":[{"id":"https://openalex.org/I110378019","display_name":"Southern Illinois University Carbondale","ror":"https://ror.org/049kefs16","country_code":"US","type":"education","lineage":["https://openalex.org/I110378019","https://openalex.org/I2801502357"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Sreenivas Gangadhar","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Southem Illinois University, Carbondale, Carbondale, IL, USA","Department of Electrical and Computer Engineering, Southern Illinois University, Carbondale, 62901 USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Southem Illinois University, Carbondale, Carbondale, IL, USA","institution_ids":["https://openalex.org/I110378019"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Southern Illinois University, Carbondale, 62901 USA","institution_ids":["https://openalex.org/I110378019"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083284025","display_name":"Spyros Tragoudas","orcid":"https://orcid.org/0009-0006-2575-3588"},"institutions":[{"id":"https://openalex.org/I110378019","display_name":"Southern Illinois University Carbondale","ror":"https://ror.org/049kefs16","country_code":"US","type":"education","lineage":["https://openalex.org/I110378019","https://openalex.org/I2801502357"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Spyros Tragoudas","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Southem Illinois University, Carbondale, Carbondale, IL, USA","Department of Electrical and Computer Engineering, Southern Illinois University, Carbondale, 62901 USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Southem Illinois University, Carbondale, Carbondale, IL, USA","institution_ids":["https://openalex.org/I110378019"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Southern Illinois University, Carbondale, 62901 USA","institution_ids":["https://openalex.org/I110378019"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5036248447"],"corresponding_institution_ids":["https://openalex.org/I110378019"],"apc_list":null,"apc_paid":null,"fwci":0.2886,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.62348549,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":null,"first_page":"258","last_page":"263"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/disjoint-sets","display_name":"Disjoint sets","score":0.7135891318321228},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.6530227661132812},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.6393596529960632},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5947064161300659},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.5835510492324829},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5811731219291687},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5656954646110535},{"id":"https://openalex.org/keywords/bayes-theorem","display_name":"Bayes' theorem","score":0.5017220973968506},{"id":"https://openalex.org/keywords/probability-of-error","display_name":"Probability of error","score":0.48220598697662354},{"id":"https://openalex.org/keywords/bayesian-network","display_name":"Bayesian network","score":0.42922329902648926},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.3188754916191101},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.25889962911605835},{"id":"https://openalex.org/keywords/discrete-mathematics","display_name":"Discrete mathematics","score":0.17403405904769897},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.17287135124206543},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.16827526688575745},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.106425940990448}],"concepts":[{"id":"https://openalex.org/C45340560","wikidata":"https://www.wikidata.org/wiki/Q215382","display_name":"Disjoint sets","level":2,"score":0.7135891318321228},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.6530227661132812},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.6393596529960632},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5947064161300659},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.5835510492324829},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5811731219291687},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5656954646110535},{"id":"https://openalex.org/C207201462","wikidata":"https://www.wikidata.org/wiki/Q182505","display_name":"Bayes' theorem","level":3,"score":0.5017220973968506},{"id":"https://openalex.org/C92224547","wikidata":"https://www.wikidata.org/wiki/Q1673216","display_name":"Probability of error","level":2,"score":0.48220598697662354},{"id":"https://openalex.org/C33724603","wikidata":"https://www.wikidata.org/wiki/Q812540","display_name":"Bayesian network","level":2,"score":0.42922329902648926},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.3188754916191101},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.25889962911605835},{"id":"https://openalex.org/C118615104","wikidata":"https://www.wikidata.org/wiki/Q121416","display_name":"Discrete mathematics","level":1,"score":0.17403405904769897},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.17287135124206543},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.16827526688575745},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.106425940990448},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2010.5450452","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2010.5450452","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 11th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1591148251","https://openalex.org/W1667165204","https://openalex.org/W1968709632","https://openalex.org/W2010966375","https://openalex.org/W2020640915","https://openalex.org/W2080267935","https://openalex.org/W2100219166","https://openalex.org/W2106262391","https://openalex.org/W2111114593","https://openalex.org/W2117115814","https://openalex.org/W2122526433","https://openalex.org/W2130670097","https://openalex.org/W2133762912","https://openalex.org/W2140388451","https://openalex.org/W2155051493","https://openalex.org/W2162318113","https://openalex.org/W2169213530","https://openalex.org/W2989448192","https://openalex.org/W3141297747","https://openalex.org/W3146941683","https://openalex.org/W4247972904","https://openalex.org/W4301384537","https://openalex.org/W6653392956","https://openalex.org/W6680751268","https://openalex.org/W6812650097"],"related_works":["https://openalex.org/W4256429076","https://openalex.org/W1971174658","https://openalex.org/W2099195351","https://openalex.org/W2041615232","https://openalex.org/W2348092930","https://openalex.org/W2012063272","https://openalex.org/W3129272755","https://openalex.org/W2138685729","https://openalex.org/W2149032943","https://openalex.org/W26693340"],"abstract_inverted_index":{"In":[0],"the":[1,11,38,56,66,73,94],"current":[2],"deep":[3],"sub-micron":[4],"technology,":[5],"a":[6,16,29,85],"small":[7],"inaccuracy":[8],"in":[9,20,59,65],"computing":[10],"probability":[12,39,57],"of":[13,15,40,49],"occurrence":[14],"soft":[17],"error":[18],"result":[19],"an":[21,45],"unacceptably":[22],"large":[23],"chip":[24],"failure":[25],"rate.":[26],"We":[27],"propose":[28],"method":[30],"that":[31,80],"considers":[32],"gate":[33,75],"delays":[34],"to":[35,61,92],"determine":[36],"accurately":[37],"SET":[41,81,95],"propagation":[42],"resulting":[43],"into":[44],"error.":[46],"Disjoint":[47],"covers":[48],"appropriately":[50],"formulated":[51],"functions":[52],"are":[53,70],"used":[54,91],"for":[55],"computations":[58],"order":[60],"consider":[62],"reconvergent":[63],"paths":[64],"circuit.":[67],"The":[68],"probabilities":[69],"calculated":[71],"at":[72,76],"output":[74],"all":[77],"time":[78],"instants":[79],"can":[82],"propagate":[83],"within":[84],"latching":[86],"window.":[87],"Bayes'":[88],"theorem":[89],"is":[90],"model":[93],"injection.":[96]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}