{"id":"https://openalex.org/W2156707883","doi":"https://doi.org/10.1109/isqed.2010.5450408","title":"A dual-level adaptive supply voltage system for variation resilience","display_name":"A dual-level adaptive supply voltage system for variation resilience","publication_year":2010,"publication_date":"2010-03-01","ids":{"openalex":"https://openalex.org/W2156707883","doi":"https://doi.org/10.1109/isqed.2010.5450408","mag":"2156707883"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2010.5450408","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2010.5450408","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 11th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040495265","display_name":"Kyu-Nam Shim","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Kyu-Nam Shim","raw_affiliation_strings":["Department of ECE, Texas A and M University, Italy"],"affiliations":[{"raw_affiliation_string":"Department of ECE, Texas A and M University, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103246390","display_name":"Jiang Hu","orcid":"https://orcid.org/0000-0003-1157-7799"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jiang Hu","raw_affiliation_strings":["Department of ECE, Texas A and M University, Italy"],"affiliations":[{"raw_affiliation_string":"Department of ECE, Texas A and M University, Italy","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024571753","display_name":"Jos\u00e9 Silva-Mart\u00ednez","orcid":"https://orcid.org/0000-0002-7960-0177"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jose Silva-Martinez","raw_affiliation_strings":["Department of ECE, Texas A and M University, Italy"],"affiliations":[{"raw_affiliation_string":"Department of ECE, Texas A and M University, Italy","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5040495265"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.17183303,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":"45","issue":null,"first_page":"38","last_page":"43"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.696315586566925},{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.6920329332351685},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.6849007606506348},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6138434410095215},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.612595796585083},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.5755630731582642},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5421929359436035},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5377101898193359},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.4946999251842499},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4711281955242157},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44435709714889526},{"id":"https://openalex.org/keywords/routing","display_name":"Routing (electronic design automation)","score":0.4378286600112915},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4369446337223053},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.34661343693733215},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.26108318567276},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20719873905181885},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18552470207214355},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.07827281951904297}],"concepts":[{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.696315586566925},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.6920329332351685},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.6849007606506348},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6138434410095215},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.612595796585083},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.5755630731582642},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5421929359436035},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5377101898193359},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.4946999251842499},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4711281955242157},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44435709714889526},{"id":"https://openalex.org/C74172769","wikidata":"https://www.wikidata.org/wiki/Q1446839","display_name":"Routing (electronic design automation)","level":2,"score":0.4378286600112915},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4369446337223053},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.34661343693733215},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.26108318567276},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20719873905181885},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18552470207214355},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.07827281951904297},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2010.5450408","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2010.5450408","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 11th International Symposium on Quality Electronic Design (ISQED)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7799999713897705,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1541483005","https://openalex.org/W1973248777","https://openalex.org/W1999253425","https://openalex.org/W2045435077","https://openalex.org/W2054989520","https://openalex.org/W2098143668","https://openalex.org/W2105597240","https://openalex.org/W2105963793","https://openalex.org/W2107766185","https://openalex.org/W2116175063","https://openalex.org/W2125169487","https://openalex.org/W2138534066","https://openalex.org/W2141565132","https://openalex.org/W2150526221","https://openalex.org/W2161737488","https://openalex.org/W2170444169","https://openalex.org/W6643513670","https://openalex.org/W6677377052","https://openalex.org/W6683952863"],"related_works":["https://openalex.org/W2204879205","https://openalex.org/W2096437374","https://openalex.org/W1943174035","https://openalex.org/W1928481607","https://openalex.org/W3135165657","https://openalex.org/W1485582195","https://openalex.org/W57337972","https://openalex.org/W2313216219","https://openalex.org/W2054411746","https://openalex.org/W2063242678"],"abstract_inverted_index":{"VLSI":[0],"circuits":[1],"of":[2,61,129],"45":[3],"nm":[4],"technology":[5],"and":[6,33,89,92,123],"beyond":[7],"are":[8],"increasingly":[9],"affected":[10],"by":[11],"process":[12],"variations":[13,21,62],"as":[14,16],"well":[15],"aging":[17],"effects.":[18],"Overcoming":[19],"the":[20,31,58,116],"inevitably":[22],"requires":[23],"additional":[24],"power":[25,32,53,95,122],"expense":[26],"which":[27],"in":[28,127],"turn":[29],"aggravates":[30],"heat":[34],"problem.":[35],"Adaptive":[36],"supply":[37,84],"voltage":[38,85],"(ASV)":[39],"is":[40,63,101],"an":[41],"arguably":[42],"power-efficient":[43],"approach":[44],"for":[45,71],"variation":[46],"resilience":[47],"since":[48],"it":[49],"attempts":[50],"to":[51,56],"allocate":[52],"resources":[54],"only":[55],"where":[57],"negative":[59],"effect":[60],"strong.":[64],"We":[65],"propose":[66],"a":[67],"dual-level":[68],"ASV":[69,105],"system":[70,79,100,118],"designs":[72],"containing":[73],"many":[74],"timing":[75],"critical":[76],"paths.":[77],"This":[78],"can":[80],"simultaneously":[81],"provide":[82],"adaptive":[83],"at":[86],"both":[87],"coarse-grained":[88],"fine-grained":[90],"level,":[91],"has":[93],"limited":[94],"routing":[96],"overhead.":[97],"The":[98,112],"dual-ASV":[99,117],"compared":[102],"with":[103],"conventional":[104],"through":[106],"SPICE":[107],"simulations":[108],"on":[109],"benchmark":[110],"circuits.":[111],"results":[113],"indicate":[114],"that":[115],"consumes":[119],"significantly":[120],"less":[121],"achieves":[124],"similar":[125],"performance":[126],"presence":[128],"variations.":[130]},"counts_by_year":[{"year":2014,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}