{"id":"https://openalex.org/W2027956094","doi":"https://doi.org/10.1109/isqed.2009.4810353","title":"Variability aware modeling of SoCs: From device variations to manufactured system yield","display_name":"Variability aware modeling of SoCs: From device variations to manufactured system yield","publication_year":2009,"publication_date":"2009-03-01","ids":{"openalex":"https://openalex.org/W2027956094","doi":"https://doi.org/10.1109/isqed.2009.4810353","mag":"2027956094"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2009.4810353","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2009.4810353","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 10th International Symposium on Quality of Electronic Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086743303","display_name":"M\u00f3nica Maribel Mata-Miranda","orcid":"https://orcid.org/0000-0002-1811-4511"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"M. Miranda","raw_affiliation_strings":["IMEC vzw, Leuven, Belgium","IMEC, Kapeldreef 75, 3001 Leuven Belgium,"],"affiliations":[{"raw_affiliation_string":"IMEC vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"IMEC, Kapeldreef 75, 3001 Leuven Belgium,","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053357255","display_name":"B. Dierickx","orcid":"https://orcid.org/0000-0002-7587-7865"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"B. Dierickx","raw_affiliation_strings":["IMEC vzw, Leuven, Belgium","IMEC, Kapeldreef 75, 3001 Leuven Belgium,"],"affiliations":[{"raw_affiliation_string":"IMEC vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"IMEC, Kapeldreef 75, 3001 Leuven Belgium,","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079692388","display_name":"Paul Zuber","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"P. Zuber","raw_affiliation_strings":["IMEC vzw, Leuven, Belgium","IMEC, Kapeldreef 75, 3001 Leuven Belgium,"],"affiliations":[{"raw_affiliation_string":"IMEC vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"IMEC, Kapeldreef 75, 3001 Leuven Belgium,","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040416465","display_name":"P. Dobrovoln","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"P. Dobrovoln","raw_affiliation_strings":["IMEC vzw, Leuven, Belgium","IMEC, Kapeldreef 75, 3001 Leuven Belgium,"],"affiliations":[{"raw_affiliation_string":"IMEC vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"IMEC, Kapeldreef 75, 3001 Leuven Belgium,","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072855520","display_name":"F. Kutscherauer","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"F. Kutscherauer","raw_affiliation_strings":["IMEC vzw, Leuven, Belgium","IMEC, Kapeldreef 75, 3001 Leuven Belgium,"],"affiliations":[{"raw_affiliation_string":"IMEC vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"IMEC, Kapeldreef 75, 3001 Leuven Belgium,","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051111763","display_name":"Ph. Roussel","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"P. Roussel","raw_affiliation_strings":["IMEC vzw, Leuven, Belgium","IMEC, Kapeldreef 75, 3001 Leuven Belgium,"],"affiliations":[{"raw_affiliation_string":"IMEC vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"IMEC, Kapeldreef 75, 3001 Leuven Belgium,","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081419754","display_name":"Pavel Poliakov","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"P. Poliakov","raw_affiliation_strings":["IMEC vzw, Leuven, Belgium","IMEC, Kapeldreef 75, 3001 Leuven Belgium,"],"affiliations":[{"raw_affiliation_string":"IMEC vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"IMEC, Kapeldreef 75, 3001 Leuven Belgium,","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5086743303"],"corresponding_institution_ids":["https://openalex.org/I4210114974"],"apc_list":null,"apc_paid":null,"fwci":2.4319,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.88858967,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"547","last_page":"553"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.6922512054443359},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.6247539520263672},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.5656937956809998},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5584020018577576},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.5421356558799744},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5335009694099426},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.5051773190498352},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.49009597301483154},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.47129547595977783},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.46442094445228577},{"id":"https://openalex.org/keywords/die","display_name":"Die (integrated circuit)","score":0.45478004217147827},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.42219844460487366},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41152146458625793},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3808803856372833},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3643127679824829},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2831222414970398},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1839606761932373},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10607528686523438},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.09671473503112793},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.0830409824848175}],"concepts":[{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.6922512054443359},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.6247539520263672},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.5656937956809998},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5584020018577576},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.5421356558799744},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5335009694099426},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.5051773190498352},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.49009597301483154},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.47129547595977783},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.46442094445228577},{"id":"https://openalex.org/C111106434","wikidata":"https://www.wikidata.org/wiki/Q1072430","display_name":"Die (integrated circuit)","level":2,"score":0.45478004217147827},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.42219844460487366},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41152146458625793},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3808803856372833},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3643127679824829},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2831222414970398},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1839606761932373},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10607528686523438},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.09671473503112793},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0830409824848175},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2009.4810353","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2009.4810353","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 10th International Symposium on Quality of Electronic Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.9100000262260437}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W2060137226","https://openalex.org/W2079163915","https://openalex.org/W2106456041","https://openalex.org/W2108880814","https://openalex.org/W2125157415","https://openalex.org/W2125169487","https://openalex.org/W2132389735","https://openalex.org/W2140823559","https://openalex.org/W2141001531","https://openalex.org/W2142599304","https://openalex.org/W2142726556","https://openalex.org/W2161648718","https://openalex.org/W2536807331","https://openalex.org/W6670145025"],"related_works":["https://openalex.org/W2388040150","https://openalex.org/W4230718388","https://openalex.org/W2141405780","https://openalex.org/W2002682434","https://openalex.org/W2102117846","https://openalex.org/W2481546399","https://openalex.org/W3149244010","https://openalex.org/W4382130817","https://openalex.org/W2047284788","https://openalex.org/W2097141385"],"abstract_inverted_index":{"As":[0],"CMOS":[1],"technology":[2],"feature":[3],"sizes":[4],"decrease,":[5],"random":[6],"within-die":[7],"and":[8,13,18,29,67],"inter-die":[9],"process":[10],"variations":[11,46],"more":[12,14],"jeopardize":[15],"SoC":[16,56],"parametric":[17],"functional":[19],"yield.":[20],"Largely":[21],"neglected":[22],"in":[23],"the":[24,48,52,55],"state-of-the-art,":[25],"dynamic":[26],"energy":[27],"consumption":[28],"power":[30],"dissipation":[31],"becomes":[32],"heavily":[33],"affected.":[34],"This":[35],"paper":[36],"describes":[37],"a":[38,60,71,75],"technique":[39],"to":[40,54,70],"systematically":[41],"bring":[42],"statistically":[43],"correlated":[44],"timing/energy":[45],"all":[47],"way":[49],"up":[50],"from":[51],"device":[53],"level.":[57],"We":[58],"propose":[59],"flow":[61],"for":[62],"variability":[63],"aware":[64],"modeling":[65],"(VAM)":[66],"apply":[68],"it":[69],"case":[72],"study":[73],"using":[74],"industrial":[76],"test":[77],"vehicle.":[78]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":4},{"year":2012,"cited_by_count":3}],"updated_date":"2026-03-17T17:19:04.345684","created_date":"2025-10-10T00:00:00"}