{"id":"https://openalex.org/W2148546046","doi":"https://doi.org/10.1109/isqed.2009.4810345","title":"Fast characterization of parameterized cell library","display_name":"Fast characterization of parameterized cell library","publication_year":2009,"publication_date":"2009-03-01","ids":{"openalex":"https://openalex.org/W2148546046","doi":"https://doi.org/10.1109/isqed.2009.4810345","mag":"2148546046"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2009.4810345","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2009.4810345","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 10th International Symposium on Quality of Electronic Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061667558","display_name":"Uday Doddannagari","orcid":null},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Uday Doddannagari","raw_affiliation_strings":["Department of ECE, Texas A and M University, College Station, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of ECE, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114375267","display_name":"Shiyan Hu","orcid":"https://orcid.org/0000-0001-5029-1588"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]},{"id":"https://openalex.org/I11957088","display_name":"Michigan Technological University","ror":"https://ror.org/0036rpn28","country_code":"US","type":"education","lineage":["https://openalex.org/I11957088"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shiyan Hu","raw_affiliation_strings":["Department of ECE, Michigan Technological University, Houghton, MI, USA","Department of ECE, Texas A and M University, College Station, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of ECE, Michigan Technological University, Houghton, MI, USA","institution_ids":["https://openalex.org/I11957088"]},{"raw_affiliation_string":"Department of ECE, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078773079","display_name":"Weiping Shi","orcid":"https://orcid.org/0000-0001-9773-9255"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Weiping Shi","raw_affiliation_strings":["Department of ECE, Texas A and M University, College Station, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of ECE, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5061667558"],"corresponding_institution_ids":["https://openalex.org/I91045830"],"apc_list":null,"apc_paid":null,"fwci":0.304,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.657989,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"500","last_page":"505"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/standard-cell","display_name":"Standard cell","score":0.8182299733161926},{"id":"https://openalex.org/keywords/parameterized-complexity","display_name":"Parameterized complexity","score":0.7590376138687134},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7388251423835754},{"id":"https://openalex.org/keywords/implementation","display_name":"Implementation","score":0.45584338903427124},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.42693957686424255},{"id":"https://openalex.org/keywords/table","display_name":"Table (database)","score":0.42455875873565674},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.26330071687698364},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.14227750897407532},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.12310582399368286},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.11581900715827942},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.09904789924621582},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.07121574878692627}],"concepts":[{"id":"https://openalex.org/C78401558","wikidata":"https://www.wikidata.org/wiki/Q464496","display_name":"Standard cell","level":3,"score":0.8182299733161926},{"id":"https://openalex.org/C165464430","wikidata":"https://www.wikidata.org/wiki/Q1570441","display_name":"Parameterized complexity","level":2,"score":0.7590376138687134},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7388251423835754},{"id":"https://openalex.org/C26713055","wikidata":"https://www.wikidata.org/wiki/Q245962","display_name":"Implementation","level":2,"score":0.45584338903427124},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.42693957686424255},{"id":"https://openalex.org/C45235069","wikidata":"https://www.wikidata.org/wiki/Q278425","display_name":"Table (database)","level":2,"score":0.42455875873565674},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.26330071687698364},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.14227750897407532},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.12310582399368286},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.11581900715827942},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09904789924621582},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.07121574878692627},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/isqed.2009.4810345","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2009.4810345","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 10th International Symposium on Quality of Electronic Design","raw_type":"proceedings-article"},{"id":"pmh:oai:digitalcommons.mtu.edu:michigantech-p-29990","is_oa":false,"landing_page_url":"https://digitalcommons.mtu.edu/michigantech-p/10688","pdf_url":null,"source":{"id":"https://openalex.org/S4377196391","display_name":"Digital Commons - Michigan Tech (Michigan Technological University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I11957088","host_organization_name":"Michigan Technological University","host_organization_lineage":["https://openalex.org/I11957088"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Michigan Tech Publications, Part 1","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1991973217","https://openalex.org/W2053710383","https://openalex.org/W2126900479","https://openalex.org/W2135779606","https://openalex.org/W4236556413"],"related_works":["https://openalex.org/W2051058708","https://openalex.org/W1494268238","https://openalex.org/W154868527","https://openalex.org/W1983207144","https://openalex.org/W2490706771","https://openalex.org/W2480116122","https://openalex.org/W4255576661","https://openalex.org/W1516574938","https://openalex.org/W2625725254","https://openalex.org/W2563912921"],"abstract_inverted_index":{"In":[0],"Standard":[1],"cell":[2,62,76,81,97,109,116,142],"library":[3,29,63,117,137,143],"based":[4],"design":[5],"methodology,":[6],"maintaining":[7],"multiple":[8],"driving":[9],"strengths":[10],"for":[11,17,39,79],"each":[12],"gate":[13,35,41],"type":[14],"is":[15,53,67,145],"critical":[16],"timing":[18],"closure":[19],"and":[20,89],"low":[21],"power.":[22],"However,":[23],"due":[24],"to":[25,139],"formidable":[26],"burden":[27],"on":[28,60,102],"designers,":[30],"often":[31,146],"only":[32],"a":[33,57,74,123],"few":[34],"implementations":[36],"are":[37],"available":[38],"many":[40],"types.":[42],"The":[43],"problem":[44],"becomes":[45],"more":[46],"difficult":[47],"if":[48],"constructing":[49],"accurate":[50,91],"delay":[51,92],"tables":[52],"considered.":[54],"This":[55,65],"imposes":[56],"great":[58],"challenge":[59,66],"efficient":[61],"design.":[64],"tackled":[68],"in":[69,149],"this":[70],"paper.":[71],"We":[72],"propose":[73],"fast":[75],"characterization":[77],"approach":[78],"parameterized":[80],"(p-cell)":[82],"library.":[83],"By":[84],"our":[85],"approach,":[86],"the":[87,90,103,107,131,134,140,147],"layout":[88],"table":[93],"of":[94],"any":[95,111],"integer-sized":[96],"can":[98,118,127],"be":[99,119,128],"automatically":[100],"generated":[101],"fly":[104],"solely":[105],"from":[106],"smallest":[108],"without":[110],"additional":[112],"simulations.":[113],"Thus,":[114],"dense":[115,135],"efficiently":[120],"generated.":[121],"As":[122],"result,":[124],"significant":[125],"area":[126],"saved":[129],"by":[130],"synthesis":[132],"using":[133],"p-cell":[136],"compared":[138],"sparse":[141],"which":[144],"case":[148],"practice.":[150]},"counts_by_year":[],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}