{"id":"https://openalex.org/W2140137041","doi":"https://doi.org/10.1109/isqed.2009.4810338","title":"New word-line driving scheme for suppressing oxide-tunneling leakage in sub-65-nm SRAMs","display_name":"New word-line driving scheme for suppressing oxide-tunneling leakage in sub-65-nm SRAMs","publication_year":2009,"publication_date":"2009-03-01","ids":{"openalex":"https://openalex.org/W2140137041","doi":"https://doi.org/10.1109/isqed.2009.4810338","mag":"2140137041"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2009.4810338","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2009.4810338","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 10th International Symposium on Quality Electronic Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029377490","display_name":"Jihye Bong","orcid":"https://orcid.org/0000-0003-1970-3948"},"institutions":[{"id":"https://openalex.org/I110273157","display_name":"Kookmin University","ror":"https://ror.org/0049erg63","country_code":"KR","type":"education","lineage":["https://openalex.org/I110273157"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Ji-Hye Bong","raw_affiliation_strings":["School of Electrical Engineering, Kookmin University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Kookmin University, Seoul, South Korea","institution_ids":["https://openalex.org/I110273157"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102079980","display_name":"Yong-Jin Kwon","orcid":"https://orcid.org/0000-0003-3879-2018"},"institutions":[{"id":"https://openalex.org/I110273157","display_name":"Kookmin University","ror":"https://ror.org/0049erg63","country_code":"KR","type":"education","lineage":["https://openalex.org/I110273157"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yong-Jin Kwon","raw_affiliation_strings":["School of Electrical Engineering, Kookmin University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Kookmin University, Seoul, South Korea","institution_ids":["https://openalex.org/I110273157"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063226833","display_name":"Kyeong\u2010Sik Min","orcid":"https://orcid.org/0000-0002-1518-7037"},"institutions":[{"id":"https://openalex.org/I110273157","display_name":"Kookmin University","ror":"https://ror.org/0049erg63","country_code":"KR","type":"education","lineage":["https://openalex.org/I110273157"]},{"id":"https://openalex.org/I156087764","display_name":"University of California, Merced","ror":"https://ror.org/00d9ah105","country_code":"US","type":"education","lineage":["https://openalex.org/I156087764"]}],"countries":["KR","US"],"is_corresponding":false,"raw_author_name":"Kyeong-Sik Min","raw_affiliation_strings":["School of Electrical Engineering, Kookmin University, Seoul, South Korea","School of Engineering, University of California, Merced, CA, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Kookmin University, Seoul, South Korea","institution_ids":["https://openalex.org/I110273157"]},{"raw_affiliation_string":"School of Engineering, University of California, Merced, CA, USA","institution_ids":["https://openalex.org/I156087764"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032003182","display_name":"Sung\u2010Mo Kang","orcid":"https://orcid.org/0000-0001-6321-6659"},"institutions":[{"id":"https://openalex.org/I156087764","display_name":"University of California, Merced","ror":"https://ror.org/00d9ah105","country_code":"US","type":"education","lineage":["https://openalex.org/I156087764"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sung-Mo Kang","raw_affiliation_strings":["School of Engineering, University of California, Merced, CA, USA"],"affiliations":[{"raw_affiliation_string":"School of Engineering, University of California, Merced, CA, USA","institution_ids":["https://openalex.org/I156087764"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5029377490"],"corresponding_institution_ids":["https://openalex.org/I110273157"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15529099,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"459","last_page":"464"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/quantum-tunnelling","display_name":"Quantum tunnelling","score":0.7103273868560791},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.6928459405899048},{"id":"https://openalex.org/keywords/word","display_name":"Word (group theory)","score":0.5298649668693542},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5295701026916504},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.45730167627334595},{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.42952612042427063},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4293466806411743},{"id":"https://openalex.org/keywords/oxide","display_name":"Oxide","score":0.41455093026161194},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.38715100288391113},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38627341389656067},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34335142374038696},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23114746809005737},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.2052115797996521},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1525282859802246}],"concepts":[{"id":"https://openalex.org/C120398109","wikidata":"https://www.wikidata.org/wiki/Q175751","display_name":"Quantum tunnelling","level":2,"score":0.7103273868560791},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.6928459405899048},{"id":"https://openalex.org/C90805587","wikidata":"https://www.wikidata.org/wiki/Q10944557","display_name":"Word (group theory)","level":2,"score":0.5298649668693542},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5295701026916504},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.45730167627334595},{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.42952612042427063},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4293466806411743},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.41455093026161194},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.38715100288391113},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38627341389656067},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34335142374038696},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23114746809005737},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.2052115797996521},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1525282859802246},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2009.4810338","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2009.4810338","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 10th International Symposium on Quality Electronic Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8999999761581421,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1527927453","https://openalex.org/W2049146774","https://openalex.org/W2094662129","https://openalex.org/W2104572483","https://openalex.org/W2108880814","https://openalex.org/W2134127605","https://openalex.org/W2145536841","https://openalex.org/W2146277792","https://openalex.org/W2305706166","https://openalex.org/W4246613390"],"related_works":["https://openalex.org/W2155827627","https://openalex.org/W4312378593","https://openalex.org/W4242937255","https://openalex.org/W2131019417","https://openalex.org/W2018127069","https://openalex.org/W2132385758","https://openalex.org/W2766813066","https://openalex.org/W1593424929","https://openalex.org/W2139413555","https://openalex.org/W2924345281"],"abstract_inverted_index":{"A":[0],"new":[1],"word-line":[2,195],"driving":[3],"scheme":[4,64,87],"is":[5,20,116,153],"proposed":[6,114],"in":[7,14,23,137],"this":[8,28,43],"paper":[9],"for":[10,182],"suppressing":[11],"oxide-tunneling":[12,18,69],"leakage":[13,19,30,70],"sub-65-nm":[15,24],"devices.":[16],"Reducing":[17],"very":[21,190],"essential":[22],"era":[25],"because":[26,75],"of":[27,76,80,112,174,194],"tunneling":[29],"component":[31],"becoming":[32],"more":[33,35],"and":[34,124,129,150,161,166,180,185],"serious":[36],"comparing":[37],"with":[38,104],"the":[39,49,57,61,77,81,92,97,105,109,113,134,141,144,170],"subthreshold":[40],"component.":[41],"In":[42],"paper,":[44],"we":[45],"propose":[46],"to":[47],"raise":[48],"word-line-off":[50],"voltage":[51,58,79],"higher":[52],"than":[53],"0V":[54],"thereby":[55],"relaxing":[56],"stress":[59],"across":[60],"oxides.":[62],"This":[63,86],"can":[65],"reduce":[66],"not":[67],"only":[68],"but":[71],"also":[72],"switching":[73],"power":[74,110,145,175],"swing":[78],"word":[82],"line":[83],"being":[84],"reduced.":[85],"has":[88],"been":[89],"verified":[90],"using":[91],"65-nm":[93],"devices":[94],"obtained":[95],"from":[96],"Predictive":[98],"Technology":[99],"Modeling":[100],"group.":[101],"The":[102],"comparison":[103],"conventional":[106],"circuit":[107],"shows":[108],"consumption":[111,146],"one":[115],"lowered":[117,154],"by":[118,155],"as":[119,121,156,158],"much":[120,157],"11%,":[122],"19.7%,":[123],"39.9%,":[125],"at":[126,163],"75\u00b0C,":[127,164,183],"25\u00b0C,":[128,165,184],"-25\u00b0C,":[130,167,186],"respectively,":[131,187],"when":[132],"all":[133],"rows":[135],"are":[136],"sleep.":[138],"And,":[139],"during":[140],"read":[142],"operation,":[143,172],"including":[147],"both":[148],"static":[149],"dynamic":[151],"components":[152],"8.3%,":[159],"10.4%,":[160],"10.9%,":[162],"respectively.":[168],"At":[169],"write":[171],"amounts":[173],"saving":[176],"reach":[177],"37.5%,":[178],"38.7%,":[179],"41.1%,":[181],"while":[188],"showing":[189],"little":[191],"delay":[192],"overhead":[193],"driving.":[196]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}