{"id":"https://openalex.org/W2091296019","doi":"https://doi.org/10.1109/isqed.2009.4810290","title":"Yield evaluation of analog placement with arbitrary capacitor ratio","display_name":"Yield evaluation of analog placement with arbitrary capacitor ratio","publication_year":2009,"publication_date":"2009-03-01","ids":{"openalex":"https://openalex.org/W2091296019","doi":"https://doi.org/10.1109/isqed.2009.4810290","mag":"2091296019"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2009.4810290","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2009.4810290","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 10th International Symposium on Quality Electronic Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064869482","display_name":"Jwu-E Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Jwu-E Chen","raw_affiliation_strings":["Department of Electrical Engineering, National Central University, Taiwan","[Department of Electrical Engineering, National Central University, Jhongli, Taoyuan, Taiwan R.O.C]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Central University, Taiwan","institution_ids":["https://openalex.org/I22265921"]},{"raw_affiliation_string":"[Department of Electrical Engineering, National Central University, Jhongli, Taoyuan, Taiwan R.O.C]","institution_ids":["https://openalex.org/I22265921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079240515","display_name":"Pei-Wen Luo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]},{"id":"https://openalex.org/I142066694","display_name":"ITRI International","ror":"https://ror.org/04wwsbd59","country_code":"US","type":"facility","lineage":["https://openalex.org/I142066694"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Pei-Wen Luo","raw_affiliation_strings":["SoC Technology Center, Industrial Technology and Research Institute, Hsinchu, Taiwan","SoC Technology Center, Industrial Technology Research Institute, Hsin-Chu, Taiwan, R.O.C"],"affiliations":[{"raw_affiliation_string":"SoC Technology Center, Industrial Technology and Research Institute, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210148468"]},{"raw_affiliation_string":"SoC Technology Center, Industrial Technology Research Institute, Hsin-Chu, Taiwan, R.O.C","institution_ids":["https://openalex.org/I142066694"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111539337","display_name":"Chin\u2010Long Wey","orcid":null},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chin-Long Wey","raw_affiliation_strings":["Department of Electrical Engineering, National Central University, Taiwan","[Department of Electrical Engineering, National Central University, Jhongli, Taoyuan, Taiwan R.O.C]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Central University, Taiwan","institution_ids":["https://openalex.org/I22265921"]},{"raw_affiliation_string":"[Department of Electrical Engineering, National Central University, Jhongli, Taoyuan, Taiwan R.O.C]","institution_ids":["https://openalex.org/I22265921"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5064869482"],"corresponding_institution_ids":["https://openalex.org/I22265921"],"apc_list":null,"apc_paid":null,"fwci":1.3191,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.81253083,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"179","last_page":"184"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.8391461372375488},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.621119499206543},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.5489729046821594},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5374147891998291},{"id":"https://openalex.org/keywords/centroid","display_name":"Centroid","score":0.49574050307273865},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.47651827335357666},{"id":"https://openalex.org/keywords/correlation","display_name":"Correlation","score":0.46839165687561035},{"id":"https://openalex.org/keywords/aspect-ratio","display_name":"Aspect ratio (aeronautics)","score":0.4383430480957031},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.3604699373245239},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.29216498136520386},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2511756420135498},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.24194034934043884},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14553490281105042},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1401064097881317},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.13812285661697388},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.12334290146827698},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09875524044036865},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09485882520675659}],"concepts":[{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.8391461372375488},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.621119499206543},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.5489729046821594},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5374147891998291},{"id":"https://openalex.org/C146599234","wikidata":"https://www.wikidata.org/wiki/Q511093","display_name":"Centroid","level":2,"score":0.49574050307273865},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.47651827335357666},{"id":"https://openalex.org/C117220453","wikidata":"https://www.wikidata.org/wiki/Q5172842","display_name":"Correlation","level":2,"score":0.46839165687561035},{"id":"https://openalex.org/C82558694","wikidata":"https://www.wikidata.org/wiki/Q1545619","display_name":"Aspect ratio (aeronautics)","level":2,"score":0.4383430480957031},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.3604699373245239},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.29216498136520386},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2511756420135498},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.24194034934043884},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14553490281105042},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1401064097881317},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.13812285661697388},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.12334290146827698},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09875524044036865},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09485882520675659},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2009.4810290","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2009.4810290","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 10th International Symposium on Quality Electronic Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1566907904","https://openalex.org/W2010921337","https://openalex.org/W2078093280","https://openalex.org/W2096760280","https://openalex.org/W2098414328","https://openalex.org/W2105010240","https://openalex.org/W2107031936","https://openalex.org/W2115311846","https://openalex.org/W2157680838","https://openalex.org/W4230800282","https://openalex.org/W6675602057"],"related_works":["https://openalex.org/W2381926679","https://openalex.org/W2007009951","https://openalex.org/W2082644203","https://openalex.org/W2080773395","https://openalex.org/W3212531278","https://openalex.org/W2099626417","https://openalex.org/W2019514496","https://openalex.org/W2085450379","https://openalex.org/W2354552488","https://openalex.org/W2129873400"],"abstract_inverted_index":{"Capacitance":[0],"mismatch":[1,11,16,25,81],"can":[2,141],"be":[3],"generally":[4],"attributed":[5],"two":[6,96],"sources":[7],"of":[8,63,71,85,101,129,155,158],"errors:":[9],"random":[10,46],"and":[12,32,61,82],"systematic":[13,24,41],"mismatch.":[14,47],"Random":[15],"is":[17,26,108,124],"caused":[18],"by":[19,150],"the":[20,40,45,56,69,99,112,122,127,130,134,152,159],"process":[21],"variation,":[22],"while":[23],"mainly":[27],"due":[28],"to":[29],"asymmetrical":[30],"layout":[31],"processing":[33],"gradients.":[34],"Common":[35],"centroid":[36],"structure":[37],"may":[38],"reduce":[39],"mismatch,":[42,60],"but":[43],"not":[44],"Based":[48],"on":[49],"spatial":[50],"correlation":[51,77,102],"model,":[52],"this":[53],"study":[54],"derives":[55],"relationship":[57],"among":[58],"correlation,":[59],"variation":[62,84],"capacitance":[64,73,86,91,106],"ratio.":[65,87],"Results":[66],"show":[67],"that":[68],"placement":[70,113,145],"unit":[72],"array":[74],"with":[75,114],"higher":[76,115,119],"results":[78,117],"in":[79,118],"lower":[80,83],"For":[88],"any":[89],"arbitrary":[90],"ratio,":[92],"i.e.,":[93],"more":[94],"than":[95],"capacitors,":[97],"if":[98],"summation":[100],"coefficients":[103],"for":[104],"all":[105],"pairs":[107],"defined":[109,125],"as":[110,126],"\"index\",":[111],"index":[116],"yield,":[120],"where":[121],"yield":[123,149],"ratio":[128],"acceptable":[131],"designs":[132],"over":[133],"sample":[135],"size.":[136],"In":[137],"other":[138],"words,":[139],"one":[140],"find":[142],"a":[143],"near-optimal":[144],"which":[146],"has":[147],"better":[148],"using":[151],"simple":[153],"calculation":[154],"index,":[156],"instead":[157],"complicated":[160],"circuit":[161],"simulations.":[162]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}