{"id":"https://openalex.org/W2128376111","doi":"https://doi.org/10.1109/isqed.2008.4479848","title":"On Chip Jitter Measurement through a High Accuracy TDC","display_name":"On Chip Jitter Measurement through a High Accuracy TDC","publication_year":2008,"publication_date":"2008-03-01","ids":{"openalex":"https://openalex.org/W2128376111","doi":"https://doi.org/10.1109/isqed.2008.4479848","mag":"2128376111"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2008.4479848","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2008.4479848","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th International Symposium on Quality Electronic Design (isqed 2008)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087649945","display_name":"Akhil Ranjan Garg","orcid":"https://orcid.org/0000-0003-1778-2718"},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210094169","display_name":"STMicroelectronics (India)","ror":"https://ror.org/00ft7bw25","country_code":"IN","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210094169"]}],"countries":["CH","IN"],"is_corresponding":false,"raw_author_name":"Akhil Garg","raw_affiliation_strings":["STMicroelectronics India Private Limited, Noida, India","STMicroelectronics India Pvt. Ltd., Noida"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics India Private Limited, Noida, India","institution_ids":["https://openalex.org/I4210094169"]},{"raw_affiliation_string":"STMicroelectronics India Pvt. Ltd., Noida","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005110984","display_name":"Prashant Dubey","orcid":"https://orcid.org/0000-0001-8159-6528"},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210094169","display_name":"STMicroelectronics (India)","ror":"https://ror.org/00ft7bw25","country_code":"IN","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210094169"]}],"countries":["CH","IN"],"is_corresponding":false,"raw_author_name":"Prashant Dubey","raw_affiliation_strings":["STMicroelectronics India Private Limited, Noida, India","STMicroelectronics India Pvt. Ltd., Noida"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics India Private Limited, Noida, India","institution_ids":["https://openalex.org/I4210094169"]},{"raw_affiliation_string":"STMicroelectronics India Pvt. Ltd., Noida","institution_ids":["https://openalex.org/I131827901"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.4233,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.79286492,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"844","last_page":"847"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.9848816394805908},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.6245988011360168},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6030924916267395},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5770959854125977},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.49250635504722595},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1427973210811615},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10895282030105591}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.9848816394805908},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.6245988011360168},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6030924916267395},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5770959854125977},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49250635504722595},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1427973210811615},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10895282030105591},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2008.4479848","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2008.4479848","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th International Symposium on Quality Electronic Design (isqed 2008)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8399999737739563,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W950342579","https://openalex.org/W1691451471","https://openalex.org/W1969331325","https://openalex.org/W1999162711","https://openalex.org/W2045058214","https://openalex.org/W2097562675","https://openalex.org/W2100156170","https://openalex.org/W2104340505","https://openalex.org/W2118565267","https://openalex.org/W2121955149","https://openalex.org/W2127929773","https://openalex.org/W2140391578","https://openalex.org/W2161602450"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2121182846","https://openalex.org/W2315668284","https://openalex.org/W2155789024","https://openalex.org/W2109491806","https://openalex.org/W3213608175","https://openalex.org/W2058044441","https://openalex.org/W3117675750","https://openalex.org/W2141743053","https://openalex.org/W3095633856"],"abstract_inverted_index":{"In":[0,19],"high":[1],"speed":[2],"applications,":[3],"ratio":[4],"of":[5,17],"total":[6],"jitter":[7,30],"to":[8,28,37],"clock":[9],"period":[10],"is":[11],"critical.":[12],"It":[13],"necessitates":[14],"accurate":[15],"measurement":[16],"Jitter.":[18],"this":[20],"paper":[21],"we":[22],"describe":[23],"an":[24],"on-":[25],"chip":[26],"methodology":[27],"measure":[29],"in":[31],"time":[32],"domain,":[33],"with":[34],"resolutions":[35],"up":[36],"0.1":[38],"ps.":[39]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}