{"id":"https://openalex.org/W2112007167","doi":"https://doi.org/10.1109/isqed.2008.4479814","title":"A Novel Automated Scan Chain Division Method for Shift and Capture Power Reduction in Broadside At-Speed Test","display_name":"A Novel Automated Scan Chain Division Method for Shift and Capture Power Reduction in Broadside At-Speed Test","publication_year":2008,"publication_date":"2008-03-01","ids":{"openalex":"https://openalex.org/W2112007167","doi":"https://doi.org/10.1109/isqed.2008.4479814","mag":"2112007167"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2008.4479814","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2008.4479814","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th International Symposium on Quality Electronic Design (isqed 2008)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5047060205","display_name":"Ho Fai Ko","orcid":null},"institutions":[{"id":"https://openalex.org/I98251732","display_name":"McMaster University","ror":"https://ror.org/02fa3aq29","country_code":"CA","type":"education","lineage":["https://openalex.org/I98251732"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Ho Fai Ko","raw_affiliation_strings":["Department of Electrical and Computer Engineering, McMaster University, Hamilton, ONT, Canada","McMaster University, Hamilton"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, McMaster University, Hamilton, ONT, Canada","institution_ids":["https://openalex.org/I98251732"]},{"raw_affiliation_string":"McMaster University, Hamilton","institution_ids":["https://openalex.org/I98251732"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048457847","display_name":"Nicola Nicolici","orcid":"https://orcid.org/0000-0001-6345-5908"},"institutions":[{"id":"https://openalex.org/I98251732","display_name":"McMaster University","ror":"https://ror.org/02fa3aq29","country_code":"CA","type":"education","lineage":["https://openalex.org/I98251732"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Nicola Nicolici","raw_affiliation_strings":["Department of Electrical and Computer Engineering, McMaster University, Hamilton, ONT, Canada","McMaster University, Hamilton"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, McMaster University, Hamilton, ONT, Canada","institution_ids":["https://openalex.org/I98251732"]},{"raw_affiliation_string":"McMaster University, Hamilton","institution_ids":["https://openalex.org/I98251732"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I98251732"],"apc_list":null,"apc_paid":null,"fwci":0.7516,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.6744868,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"649","last_page":"654"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/broadside","display_name":"Broadside","score":0.8658381700515747},{"id":"https://openalex.org/keywords/division","display_name":"Division (mathematics)","score":0.7350746393203735},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.6694509387016296},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.586536705493927},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4995434284210205},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.46789681911468506},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.4668921232223511},{"id":"https://openalex.org/keywords/speedup","display_name":"Speedup","score":0.41855812072753906},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.38108664751052856},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.339616060256958},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.25837862491607666},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.19118386507034302},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10916492342948914},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10512271523475647},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.09752491116523743},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.08867567777633667},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.07849177718162537}],"concepts":[{"id":"https://openalex.org/C57130246","wikidata":"https://www.wikidata.org/wiki/Q849965","display_name":"Broadside","level":2,"score":0.8658381700515747},{"id":"https://openalex.org/C60798267","wikidata":"https://www.wikidata.org/wiki/Q1226939","display_name":"Division (mathematics)","level":2,"score":0.7350746393203735},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.6694509387016296},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.586536705493927},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4995434284210205},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.46789681911468506},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.4668921232223511},{"id":"https://openalex.org/C68339613","wikidata":"https://www.wikidata.org/wiki/Q1549489","display_name":"Speedup","level":2,"score":0.41855812072753906},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.38108664751052856},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.339616060256958},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.25837862491607666},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.19118386507034302},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10916492342948914},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10512271523475647},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.09752491116523743},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08867567777633667},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.07849177718162537},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2008.4479814","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2008.4479814","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th International Symposium on Quality Electronic Design (isqed 2008)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8600000143051147}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1557977552","https://openalex.org/W1924975623","https://openalex.org/W1970310355","https://openalex.org/W2069650309","https://openalex.org/W2080510479","https://openalex.org/W2106571261","https://openalex.org/W2108254527","https://openalex.org/W2114502453","https://openalex.org/W2132588260","https://openalex.org/W2132665983","https://openalex.org/W2136680550","https://openalex.org/W2143393888","https://openalex.org/W2152321821","https://openalex.org/W2152406824","https://openalex.org/W2156577524","https://openalex.org/W2162547872","https://openalex.org/W2165516518","https://openalex.org/W2166163625","https://openalex.org/W6680940336","https://openalex.org/W6683103440","https://openalex.org/W6683598130","https://openalex.org/W6684123354"],"related_works":["https://openalex.org/W4307513436","https://openalex.org/W2012969487","https://openalex.org/W4283778528","https://openalex.org/W4307441381","https://openalex.org/W4307513434","https://openalex.org/W4307513423","https://openalex.org/W2058965144","https://openalex.org/W2164382479","https://openalex.org/W4248862039","https://openalex.org/W2141235927"],"abstract_inverted_index":{"To":[0],"address":[1],"the":[2,17,23,34,40,52,65,69,102,109,115],"excessive":[3],"power":[4,46,82],"during":[5,88],"test,":[6],"multiple":[7],"scan":[8,73,116],"divisions":[9,75],"can":[10,76],"be":[11,77,86],"created":[12,78],"such":[13,80],"that":[14,81],"not":[15],"all":[16],"circuit":[18],"blocks":[19],"are":[20],"active":[21],"at":[22],"same":[24],"time.":[25,117],"While":[26],"this":[27],"concept":[28],"has":[29],"been":[30],"successfully":[31],"employed":[32],"in":[33,51,68],"past":[35],"for":[36,43],"addressing":[37],"shift":[38,90],"power,":[39],"reported":[41],"techniques":[42],"at-speed":[44],"capture":[45,92],"reduction":[47],"rely":[48],"on":[49],"modifications":[50],"automatic":[53],"test":[54,95],"pattern":[55],"generation":[56],"(ATPG)":[57],"algorithms.":[58],"This":[59,98],"paper":[60],"shows":[61],"how":[62],"by":[63],"analyzing":[64],"signal":[66],"dependencies":[67],"circuit's":[70],"sequential":[71],"graph,":[72],"chain":[74],"automatically,":[79],"is":[83,96,99],"guaranteed":[84],"to":[85],"reduced":[87],"both":[89],"and":[91,106],"when":[93],"broadside":[94],"employed.":[97],"achieved":[100],"with":[101],"existing":[103],"ATPG":[104],"flows":[105],"without":[107],"affecting":[108],"transition":[110],"fault":[111],"coverage":[112],"or":[113],"increasing":[114]},"counts_by_year":[{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}