{"id":"https://openalex.org/W2107184159","doi":"https://doi.org/10.1109/isqed.2008.4479772","title":"Innovative Test Solutions for Pin-Limited Microcontrollers","display_name":"Innovative Test Solutions for Pin-Limited Microcontrollers","publication_year":2008,"publication_date":"2008-03-01","ids":{"openalex":"https://openalex.org/W2107184159","doi":"https://doi.org/10.1109/isqed.2008.4479772","mag":"2107184159"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2008.4479772","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2008.4479772","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th International Symposium on Quality Electronic Design (isqed 2008)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073478204","display_name":"M.G. Stout","orcid":null},"institutions":[{"id":"https://openalex.org/I100625452","display_name":"ON Semiconductor (United States)","ror":"https://ror.org/03nw6pt28","country_code":"US","type":"company","lineage":["https://openalex.org/I100625452"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Matthew G. Stout","raw_affiliation_strings":["Freescale Semiconductor, Inc., USA","Freescale Semicond., Austin"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Inc., USA","institution_ids":[]},{"raw_affiliation_string":"Freescale Semicond., Austin","institution_ids":["https://openalex.org/I100625452"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017063010","display_name":"K. Tumin","orcid":null},"institutions":[{"id":"https://openalex.org/I100625452","display_name":"ON Semiconductor (United States)","ror":"https://ror.org/03nw6pt28","country_code":"US","type":"company","lineage":["https://openalex.org/I100625452"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kenneth P. Tumin","raw_affiliation_strings":["Freescale Semiconductor, Inc., USA","Freescale Semicond., Austin"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Freescale Semiconductor, Inc., USA","institution_ids":[]},{"raw_affiliation_string":"Freescale Semicond., Austin","institution_ids":["https://openalex.org/I100625452"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I100625452"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16998834,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"437","last_page":"440"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.987500011920929,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.878385066986084},{"id":"https://openalex.org/keywords/reset","display_name":"Reset (finance)","score":0.8094981908798218},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6281154155731201},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.5066574215888977},{"id":"https://openalex.org/keywords/iddq-testing","display_name":"Iddq testing","score":0.49048611521720886},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4832606911659241},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.4767535626888275},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.46080541610717773},{"id":"https://openalex.org/keywords/multiplexing","display_name":"Multiplexing","score":0.45832809805870056},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43089696764945984},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.41009700298309326},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3582965135574341},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2714502811431885},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20567643642425537},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.12685257196426392},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.0692649781703949}],"concepts":[{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.878385066986084},{"id":"https://openalex.org/C2779795794","wikidata":"https://www.wikidata.org/wiki/Q7315343","display_name":"Reset (finance)","level":2,"score":0.8094981908798218},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6281154155731201},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.5066574215888977},{"id":"https://openalex.org/C206678392","wikidata":"https://www.wikidata.org/wiki/Q5987815","display_name":"Iddq testing","level":3,"score":0.49048611521720886},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4832606911659241},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.4767535626888275},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.46080541610717773},{"id":"https://openalex.org/C19275194","wikidata":"https://www.wikidata.org/wiki/Q222903","display_name":"Multiplexing","level":2,"score":0.45832809805870056},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43089696764945984},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.41009700298309326},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3582965135574341},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2714502811431885},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20567643642425537},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.12685257196426392},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0692649781703949},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C106159729","wikidata":"https://www.wikidata.org/wiki/Q2294553","display_name":"Financial economics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2008.4479772","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2008.4479772","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th International Symposium on Quality Electronic Design (isqed 2008)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.47999998927116394,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2157048441","https://openalex.org/W2398889980"],"related_works":["https://openalex.org/W1930974068","https://openalex.org/W934993865","https://openalex.org/W2021615582","https://openalex.org/W2536675427","https://openalex.org/W112366330","https://openalex.org/W2356698984","https://openalex.org/W2187825401","https://openalex.org/W2129020400","https://openalex.org/W2156661581","https://openalex.org/W2539374469"],"abstract_inverted_index":{"A":[0],"scan-based":[1,95,149],"test":[2,88,116,122],"methodology":[3,21],"was":[4],"adopted":[5],"for":[6,54,135,148],"the":[7,42,52,62,72],"Freescale":[8],"S08":[9],"and":[10,30,71,140],"RS08":[11],"(8-bit)":[12],"families":[13,48],"of":[14,35,41,49,83],"microcontrollers":[15],"(MCUs)":[16],"several":[17,87,145],"years":[18],"ago.":[19],"This":[20],"has":[22],"been":[23,91],"shown":[24],"to":[25,93],"provide":[26],"high":[27],"quality":[28],"testing":[29,96],"is":[31,51,65,75],"an":[32,68,109,132],"important":[33],"part":[34],"Freescale's":[36],"\"Zero":[37],"Defect\"":[38],"initiative.":[39],"One":[40],"difficult":[43],"restrictions":[44],"placed":[45],"on":[46],"these":[47,84],"products":[50],"requirement":[53],"applications":[55],"requiring":[56],"very":[57,98],"few":[58,99],"pins.":[59,100],"For":[60],"instance,":[61],"9S08QG8":[63],"MCU":[64,74],"available":[66,76],"in":[67,77],"8-pin":[69],"package,":[70],"9S08KA2":[73],"a":[78,128],"6-":[79],"pin":[80,141],"package.":[81],"Because":[82],"packaging":[85],"requirements,":[86],"methods":[89,102],"have":[90],"developed":[92],"implement":[94],"using":[97,127],"The":[101],"include":[103],"full":[104],"single":[105,129],"scan":[106],"chain":[107],"testing,":[108],"internally-generated":[110],"reset":[111,114],"(no":[112],"dedicated":[113,121],"pin),":[115],"mode":[117,123,138],"latching":[118],"with":[119],"no":[120],"pins,":[124],"IDDQ":[125],"measurement":[126],"power":[130],"supply,":[131],"indirect":[133],"method":[134],"verifying":[136],"correct":[137],"entry,":[139],"multiplexing":[142],"that":[143],"combines":[144],"signals":[146],"required":[147],"testing.":[150]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}