{"id":"https://openalex.org/W2168903458","doi":"https://doi.org/10.1109/isqed.2008.4479734","title":"Timing-Aware Multiple-Delay-Fault Diagnosis","display_name":"Timing-Aware Multiple-Delay-Fault Diagnosis","publication_year":2008,"publication_date":"2008-03-01","ids":{"openalex":"https://openalex.org/W2168903458","doi":"https://doi.org/10.1109/isqed.2008.4479734","mag":"2168903458"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2008.4479734","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2008.4479734","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th International Symposium on Quality Electronic Design (isqed 2008)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109179856","display_name":"Vishal Mehta","orcid":null},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Vishal J. Mehta","raw_affiliation_strings":["University of California, Santa Barbara, CA, USA"],"affiliations":[{"raw_affiliation_string":"University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063371595","display_name":"Malgorzata Marek-Sadowska","orcid":"https://orcid.org/0000-0002-3934-7031"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Malgorzata Marek-Sadowska","raw_affiliation_strings":["University of California, Santa Barbara, CA, USA"],"affiliations":[{"raw_affiliation_string":"University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064587514","display_name":"Kun-Han Tsai","orcid":"https://orcid.org/0000-0001-8919-8663"},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kun-Han Tsai","raw_affiliation_strings":["Mentor Graphics Corporation, Wilsonville, OR, USA"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corporation, Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110218833","display_name":"J. Rajski","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Janusz Rajski","raw_affiliation_strings":["Mentor Graphics Corporation, Wilsonville, OR, USA"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corporation, Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5109179856"],"corresponding_institution_ids":["https://openalex.org/I154570441"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.13898411,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"24","issue":null,"first_page":"246","last_page":"253"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.691627562046051},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6258182525634766},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5905598998069763},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5574467778205872},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4310709834098816},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.4297439455986023},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4070000648498535},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.16251924633979797},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1484314501285553}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.691627562046051},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6258182525634766},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5905598998069763},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5574467778205872},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4310709834098816},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.4297439455986023},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4070000648498535},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.16251924633979797},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1484314501285553},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2008.4479734","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2008.4479734","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th International Symposium on Quality Electronic Design (isqed 2008)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1493920760","https://openalex.org/W1583304273","https://openalex.org/W1595368737","https://openalex.org/W1864256460","https://openalex.org/W1934146305","https://openalex.org/W2061946964","https://openalex.org/W2083375832","https://openalex.org/W2101930218","https://openalex.org/W2110542678","https://openalex.org/W2113070789","https://openalex.org/W2113399863","https://openalex.org/W2120116751","https://openalex.org/W2120349980","https://openalex.org/W2120957918","https://openalex.org/W2127900569","https://openalex.org/W2132329711","https://openalex.org/W2135412235","https://openalex.org/W2138735239","https://openalex.org/W2139971665","https://openalex.org/W2141773759","https://openalex.org/W2152216671","https://openalex.org/W2153498338","https://openalex.org/W2162091502","https://openalex.org/W3145128584","https://openalex.org/W4210727445","https://openalex.org/W4251666015","https://openalex.org/W4254506919","https://openalex.org/W6671178702","https://openalex.org/W6680972464","https://openalex.org/W6682007028","https://openalex.org/W6682611479"],"related_works":["https://openalex.org/W2378757965","https://openalex.org/W4224903346","https://openalex.org/W1593262897","https://openalex.org/W2372869593","https://openalex.org/W2384194537","https://openalex.org/W2031011156","https://openalex.org/W2368745429","https://openalex.org/W3171126029","https://openalex.org/W2369984616","https://openalex.org/W911553556"],"abstract_inverted_index":{"With":[0],"feature":[1],"sizes":[2],"steadily":[3],"shrinking,":[4],"manufacturing":[5],"defects":[6],"and":[7,23,36],"parameter":[8],"variations":[9],"often":[10],"cause":[11],"design":[12],"timing":[13],"failures.":[14],"It":[15],"is":[16],"essential":[17],"that":[18],"these":[19],"errors":[20],"be":[21],"correctly":[22],"quickly":[24],"diagnosed.":[25],"In":[26],"this":[27],"paper,":[28],"we":[29],"analyze":[30],"the":[31,47],"multiple-delay":[32],"fault":[33],"diagnosis":[34,64],"problem":[35],"propose":[37],"a":[38],"novel,":[39],"simulation-based":[40],"approach":[41],"to":[42,68],"solve":[43],"it.":[44],"We":[45,60],"enhance":[46],"diagnostic":[48],"resolution":[49],"by":[50],"processing":[51],"failure":[52],"logs":[53],"at":[54],"various":[55],"slower-":[56],"than-nominal":[57],"clock":[58],"frequencies.":[59],"experimentally":[61],"determined":[62],"our":[63],"algorithm":[65],"s":[66],"sensitivity":[67],"delay":[69],"variations.":[70]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}