{"id":"https://openalex.org/W2111388007","doi":"https://doi.org/10.1109/isqed.2008.4479718","title":"Robust Estimation of Timing Yield with Partial Statistical Information on Process Variations","display_name":"Robust Estimation of Timing Yield with Partial Statistical Information on Process Variations","publication_year":2008,"publication_date":"2008-03-01","ids":{"openalex":"https://openalex.org/W2111388007","doi":"https://doi.org/10.1109/isqed.2008.4479718","mag":"2111388007"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2008.4479718","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2008.4479718","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th International Symposium on Quality Electronic Design (isqed 2008)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022189337","display_name":"Lin Xie","orcid":"https://orcid.org/0000-0002-8850-6764"},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Lin Xie","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Wisconsin, Madison, USA","Univ. of Wisconsin at Madison, Madison#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Wisconsin, Madison, USA","institution_ids":["https://openalex.org/I135310074"]},{"raw_affiliation_string":"Univ. of Wisconsin at Madison, Madison#TAB#","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5072204999","display_name":"Azadeh Davoodi","orcid":"https://orcid.org/0000-0001-5213-2556"},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Azadeh Davoodi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Wisconsin, Madison, USA","Univ. of Wisconsin at Madison, Madison#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Wisconsin, Madison, USA","institution_ids":["https://openalex.org/I135310074"]},{"raw_affiliation_string":"Univ. of Wisconsin at Madison, Madison#TAB#","institution_ids":["https://openalex.org/I135310074"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5022189337"],"corresponding_institution_ids":["https://openalex.org/I135310074"],"apc_list":null,"apc_paid":null,"fwci":0.6769,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.73727322,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"156","last_page":"161"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.781676173210144},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.6266292333602905},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4803958237171173},{"id":"https://openalex.org/keywords/estimation-theory","display_name":"Estimation theory","score":0.45422083139419556},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.44987550377845764},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.44596803188323975},{"id":"https://openalex.org/keywords/probability-distribution","display_name":"Probability distribution","score":0.41828683018684387},{"id":"https://openalex.org/keywords/marginal-distribution","display_name":"Marginal distribution","score":0.41448473930358887},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.39529693126678467},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.38796159625053406},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.37077346444129944},{"id":"https://openalex.org/keywords/random-variable","display_name":"Random variable","score":0.36318135261535645}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.781676173210144},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.6266292333602905},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4803958237171173},{"id":"https://openalex.org/C167928553","wikidata":"https://www.wikidata.org/wiki/Q1376021","display_name":"Estimation theory","level":2,"score":0.45422083139419556},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.44987550377845764},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.44596803188323975},{"id":"https://openalex.org/C149441793","wikidata":"https://www.wikidata.org/wiki/Q200726","display_name":"Probability distribution","level":2,"score":0.41828683018684387},{"id":"https://openalex.org/C165216359","wikidata":"https://www.wikidata.org/wiki/Q670653","display_name":"Marginal distribution","level":3,"score":0.41448473930358887},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.39529693126678467},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.38796159625053406},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.37077346444129944},{"id":"https://openalex.org/C122123141","wikidata":"https://www.wikidata.org/wiki/Q176623","display_name":"Random variable","level":2,"score":0.36318135261535645},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2008.4479718","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2008.4479718","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th International Symposium on Quality Electronic Design (isqed 2008)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1511688816","https://openalex.org/W1846979026","https://openalex.org/W2018044188","https://openalex.org/W2024332750","https://openalex.org/W2059193309","https://openalex.org/W2064975723","https://openalex.org/W2095730148","https://openalex.org/W2095754833","https://openalex.org/W2104785869","https://openalex.org/W2128306262","https://openalex.org/W2129883611","https://openalex.org/W2136328167","https://openalex.org/W2142213725","https://openalex.org/W2143698245","https://openalex.org/W2161914245","https://openalex.org/W2163262735","https://openalex.org/W2163982770","https://openalex.org/W2165740397","https://openalex.org/W2168519801","https://openalex.org/W2168908441","https://openalex.org/W2296319761","https://openalex.org/W4241987548","https://openalex.org/W6641884055","https://openalex.org/W6680337182","https://openalex.org/W6681458892"],"related_works":["https://openalex.org/W2080140894","https://openalex.org/W2156831707","https://openalex.org/W2154802582","https://openalex.org/W4378551395","https://openalex.org/W2122857041","https://openalex.org/W4288910996","https://openalex.org/W2334602205","https://openalex.org/W2032285496","https://openalex.org/W173377860","https://openalex.org/W154625338"],"abstract_inverted_index":{"This":[0],"paper":[1],"illustrates":[2],"the":[3,11,22,32,35,61,64,73,103],"application":[4],"of":[5,15,25,34,41,63,98,102,107,127],"distributional":[6,65],"robustness":[7,66],"theory":[8,67],"to":[9,50,68,81,124],"compute":[10],"worst-case":[12,74],"timing":[13,75,116],"yield":[14,76,117],"a":[16],"circuit.":[17],"Our":[18],"assumption":[19],"is":[20,113,121],"that":[21,58],"probability":[23],"distribution":[24,105],"process":[26,36,91,108],"variables":[27,37,92],"are":[28,43],"unknown":[29],"and":[30,38,70,93],"only":[31],"intervals":[33],"their":[39],"class":[40],"distributions":[42],"available.":[44],"We":[45,54],"consider":[46],"two":[47],"practical":[48],"classes":[49],"group":[51],"potential":[52],"distributions.":[53],"then":[55],"derive":[56],"conditions":[57],"allow":[59],"applying":[60],"results":[62],"efficiently":[69],"accurately":[71],"estimate":[72],"for":[77],"each":[78],"class.":[79],"Compared":[80],"other":[82,125],"recent":[83],"works,":[84],"our":[85,111,119],"approach":[86,120],"can":[87],"model":[88],"correlations":[89],"among":[90],"does":[94],"not":[95],"require":[96],"knowledge":[97],"exact":[99],"function":[100,106],"form":[101],"joint":[104],"variables.":[109],"While":[110],"emphasis":[112],"on":[114],"robust":[115],"estimation,":[118],"also":[122],"applicable":[123],"types":[126],"parametric":[128],"yield.":[129]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-03-25T13:04:00.132906","created_date":"2025-10-10T00:00:00"}