{"id":"https://openalex.org/W2107265146","doi":"https://doi.org/10.1109/isqed.2008.4479717","title":"A Statistical Characterization of CMOS Process Fluctuations in Subthreshold Current Mirrors","display_name":"A Statistical Characterization of CMOS Process Fluctuations in Subthreshold Current Mirrors","publication_year":2008,"publication_date":"2008-03-01","ids":{"openalex":"https://openalex.org/W2107265146","doi":"https://doi.org/10.1109/isqed.2008.4479717","mag":"2107265146"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2008.4479717","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2008.4479717","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th International Symposium on Quality Electronic Design (isqed 2008)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101846632","display_name":"Lei Zhang","orcid":"https://orcid.org/0009-0000-9916-9348"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Zhang","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China","[Tsinghua University, Beijing]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I99065089"]},{"raw_affiliation_string":"[Tsinghua University, Beijing]","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100433433","display_name":"Zhiping Yu","orcid":"https://orcid.org/0000-0001-8701-8438"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiping Yu","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China","[Tsinghua University, Beijing]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I99065089"]},{"raw_affiliation_string":"[Tsinghua University, Beijing]","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100886080","display_name":"Xiangqing He","orcid":null},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiangqing He","raw_affiliation_strings":["Institute of Microelectronics, Tsinghua University, Beijing, China","[Tsinghua University, Beijing]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I99065089"]},{"raw_affiliation_string":"[Tsinghua University, Beijing]","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.3849,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.91616858,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"2","issue":null,"first_page":"152","last_page":"155"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.8470592498779297},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7205342054367065},{"id":"https://openalex.org/keywords/correctness","display_name":"Correctness","score":0.5996257066726685},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.549111545085907},{"id":"https://openalex.org/keywords/semiconductor-device-modeling","display_name":"Semiconductor device modeling","score":0.5346205830574036},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5103599429130554},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.4948274493217468},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43925657868385315},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4259246587753296},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3593898415565491},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.30066657066345215},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2869423031806946},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2572822570800781},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2543327808380127},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2346423864364624},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.12909802794456482}],"concepts":[{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.8470592498779297},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7205342054367065},{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.5996257066726685},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.549111545085907},{"id":"https://openalex.org/C4775677","wikidata":"https://www.wikidata.org/wiki/Q7449393","display_name":"Semiconductor device modeling","level":3,"score":0.5346205830574036},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5103599429130554},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.4948274493217468},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43925657868385315},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4259246587753296},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3593898415565491},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.30066657066345215},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2869423031806946},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2572822570800781},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2543327808380127},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2346423864364624},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.12909802794456482},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isqed.2008.4479717","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2008.4479717","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th International Symposium on Quality Electronic Design (isqed 2008)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1836095245","https://openalex.org/W1887705073","https://openalex.org/W1894738766","https://openalex.org/W1999678910","https://openalex.org/W2068871408","https://openalex.org/W2094273527","https://openalex.org/W2122045896","https://openalex.org/W2128853849","https://openalex.org/W2138101809","https://openalex.org/W2153378565","https://openalex.org/W6639709881"],"related_works":["https://openalex.org/W2806295079","https://openalex.org/W2144789955","https://openalex.org/W2147392939","https://openalex.org/W2113058922","https://openalex.org/W2031341053","https://openalex.org/W2124774379","https://openalex.org/W1981776476","https://openalex.org/W2066132080","https://openalex.org/W2124196078","https://openalex.org/W2154332626"],"abstract_inverted_index":{"A":[0],"novel":[1],"method":[2,89],"to":[3,29,120,180],"characterize":[4],"CMOS":[5,39,102],"process":[6,40,106,155],"fluctuations":[7,41],"in":[8,15,23,98,134],"subthreshold":[9,184],"current":[10],"mirrors":[11],"(SCM)":[12],"is":[13,21,90],"reported":[14,31],"this":[16],"paper.":[17],"The":[18,54,85,123,165],"proposed":[19,88,124],"model":[20,55],"succinct":[22],"methodology":[24],"and":[25,72,136,170,191],"calculation":[26],"complexity":[27],"comparing":[28],"the":[30,43,78,128,139,154,159,163],"statistical":[32],"models,":[33],"however,":[34],"provides":[35],"favorable":[36],"estimations":[37],"of":[38,87,111,130,143],"on":[42,62],"SCM":[44,95],"circuit,":[45],"which":[46,60,152],"makes":[47],"it":[48],"being":[49],"promising":[50],"for":[51],"engineering":[52],"applications.":[53],"statistically":[56],"abstracts":[57],"physical":[58],"parameters,":[59],"depend":[61],"IC":[63],"process,":[64],"into":[65,81],"random":[66,79],"variables":[67],"with":[68,107],"certain":[69],"mean":[70],"values":[71],"standard":[73,146],"deviations,":[74],"while":[75],"aggregating":[76],"all":[77],"impacts":[80],"a":[82,108,149],"discrete":[83],"martingale.":[84],"correctness":[86],"experimentally":[91],"verified":[92],"by":[93,158],"an":[94,114],"circuit":[96],"implemented":[97],"SMIC":[99],"0.18":[100],"mum":[101],"1P6M":[103],"mixed":[104],"signal":[105],"conversion":[109],"factor":[110],"100":[112,118],"over":[113,148],"input":[115],"range":[116],"from":[117,162],"pA":[119],"1":[121,141],"muA.":[122],"theory":[125],"successfully":[126],"predicted":[127],"~plusmn10%":[129],"die-to-die":[131],"fluctuation":[132,182],"measured":[133,171],"experiment,":[135],"also":[137,189],"suggested":[138,157],"~":[140],"mV":[142],"threshold":[144],"voltage":[145],"deviation":[147],"single":[150],"die,":[151],"meets":[153],"parameters":[156],"design":[160,187],"kit":[161],"foundry.":[164],"deviations":[166],"between":[167],"calculated":[168],"probabilities":[169],"data":[172],"are":[173,188],"less":[174],"than":[175],"8%.":[176],"Meanwhile,":[177],"pertinent":[178],"suggestions":[179],"high":[181],"tolerance":[183],"analog":[185],"circuits":[186],"made":[190],"discussed.":[192]},"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}