{"id":"https://openalex.org/W2105842244","doi":"https://doi.org/10.1109/isqed.2008.4479701","title":"Output Remapping Technique for Soft-Error Rate Reduction in Critical Paths","display_name":"Output Remapping Technique for Soft-Error Rate Reduction in Critical Paths","publication_year":2008,"publication_date":"2008-03-01","ids":{"openalex":"https://openalex.org/W2105842244","doi":"https://doi.org/10.1109/isqed.2008.4479701","mag":"2105842244"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2008.4479701","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2008.4479701","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th International Symposium on Quality Electronic Design (isqed 2008)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101794128","display_name":"Qian Ding","orcid":"https://orcid.org/0000-0001-7434-8075"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qian Ding","raw_affiliation_strings":["Department of EE, Tsinghua University, Beijing, China","[Tsinghua University, Beijing]"],"affiliations":[{"raw_affiliation_string":"Department of EE, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"[Tsinghua University, Beijing]","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100445061","display_name":"Yu Wang","orcid":"https://orcid.org/0000-0001-6108-5157"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Wang","raw_affiliation_strings":["Department of EE, Tsinghua University, Beijing, China","[Tsinghua University, Beijing]"],"affiliations":[{"raw_affiliation_string":"Department of EE, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"[Tsinghua University, Beijing]","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100460768","display_name":"Hui Wang","orcid":"https://orcid.org/0000-0002-3394-1531"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Wang","raw_affiliation_strings":["Department of EE, Tsinghua University, Beijing, China","[Tsinghua University, Beijing]"],"affiliations":[{"raw_affiliation_string":"Department of EE, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"[Tsinghua University, Beijing]","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101846193","display_name":"Rong Luo","orcid":"https://orcid.org/0000-0003-1062-598X"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rong Luo","raw_affiliation_strings":["Department of EE, Tsinghua University, Beijing, China","[Tsinghua University, Beijing]"],"affiliations":[{"raw_affiliation_string":"Department of EE, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"[Tsinghua University, Beijing]","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023755254","display_name":"Huazhong Yang","orcid":"https://orcid.org/0000-0003-2421-353X"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huazhong Yang","raw_affiliation_strings":["Department of EE, Tsinghua University, Beijing, China","[Tsinghua University, Beijing]"],"affiliations":[{"raw_affiliation_string":"Department of EE, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"[Tsinghua University, Beijing]","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101794128"],"corresponding_institution_ids":["https://openalex.org/I99065089"],"apc_list":null,"apc_paid":null,"fwci":1.6952,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.8492201,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"299","issue":null,"first_page":"74","last_page":"77"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/glitch","display_name":"Glitch","score":0.844281792640686},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.7100291848182678},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6964877843856812},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.6849797368049622},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.650216817855835},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.5377472043037415},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5365604758262634},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5212709903717041},{"id":"https://openalex.org/keywords/word-error-rate","display_name":"Word error rate","score":0.4840647280216217},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4517658054828644},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.40164679288864136},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.21748614311218262},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19838684797286987},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.12584710121154785},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11998391151428223},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10625502467155457},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08022692799568176}],"concepts":[{"id":"https://openalex.org/C191287063","wikidata":"https://www.wikidata.org/wiki/Q543281","display_name":"Glitch","level":3,"score":0.844281792640686},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.7100291848182678},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6964877843856812},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.6849797368049622},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.650216817855835},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.5377472043037415},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5365604758262634},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5212709903717041},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.4840647280216217},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4517658054828644},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.40164679288864136},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.21748614311218262},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19838684797286987},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.12584710121154785},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11998391151428223},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10625502467155457},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08022692799568176},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/isqed.2008.4479701","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2008.4479701","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th International Symposium on Quality Electronic Design (isqed 2008)","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.610.7070","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.610.7070","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://nics.ee.tsinghua.edu.cn/people/wangyu/conference/Qian Ding_ISQED2008.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.710.6902","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.710.6902","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://nicsefc.ee.tsinghua.edu.cn/media/publications/2008/ISQED08_89.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1519198589","https://openalex.org/W1541483005","https://openalex.org/W2071068906","https://openalex.org/W2104122494","https://openalex.org/W2105460788","https://openalex.org/W2117115814","https://openalex.org/W2123715815","https://openalex.org/W2142358791","https://openalex.org/W2154941994","https://openalex.org/W2155275285","https://openalex.org/W2155603569","https://openalex.org/W2169213530","https://openalex.org/W2889024928","https://openalex.org/W3172772885","https://openalex.org/W4253238850"],"related_works":["https://openalex.org/W2531550288","https://openalex.org/W2149041233","https://openalex.org/W2102708050","https://openalex.org/W2171347834","https://openalex.org/W2066042903","https://openalex.org/W3040935927","https://openalex.org/W1993206924","https://openalex.org/W2518564956","https://openalex.org/W2066664769","https://openalex.org/W2168546702"],"abstract_inverted_index":{"It":[0],"is":[1,63,77,85],"expected":[2],"that":[3,96],"the":[4,61],"soft":[5,19],"error":[6],"rate":[7],"(SER)":[8],"of":[9,43],"combinational":[10,22],"logic":[11,23],"will":[12],"increase":[13,53],"significantly.":[14,65],"Previous":[15],"solutions":[16],"to":[17,40,50],"mitigate":[18],"errors":[20],"in":[21,54],"suffer":[24],"from":[25],"delay":[26,72],"penalty":[27],"or":[28],"area/power":[29,75],"overhead.":[30],"In":[31],"this":[32],"paper,":[33],"we":[34],"proposed":[35],"an":[36],"output":[37,82,97],"remapping":[38,83,98],"technique":[39,99],"reduce":[41],"SER":[42,62],"critical":[44],"paths.":[45],"Experimental":[46],"results":[47],"show":[48],"up":[49],"about":[51],"20X":[52],"Q":[55],"<sub":[56],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[57],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">critical</sub>":[58],".":[59],"So":[60],"reduced":[64],"This":[66],"method":[67,84],"does":[68],"not":[69],"introduce":[70],"any":[71],"penalty.":[73],"The":[74,81,93],"overhead":[76],"limited":[78],"as":[79],"well.":[80],"based":[86],"on":[87],"our":[88],"novel":[89],"glitch":[90],"width":[91],"model.":[92],"analysis":[94],"shows":[95],"works":[100],"well":[101],"along":[102],"with":[103],"technology":[104],"scaling.":[105]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}