{"id":"https://openalex.org/W2166599556","doi":"https://doi.org/10.1109/isqed.2004.1283722","title":"Scan BIST targeting transition faults using a Markov source","display_name":"Scan BIST targeting transition faults using a Markov source","publication_year":2004,"publication_date":"2004-05-06","ids":{"openalex":"https://openalex.org/W2166599556","doi":"https://doi.org/10.1109/isqed.2004.1283722","mag":"2166599556"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2004.1283722","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2004.1283722","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103050214","display_name":"Han Yong Lee","orcid":"https://orcid.org/0000-0001-8833-7430"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"H. Lee","raw_affiliation_strings":["School of ECE, Purdue University, West Lafayette, IN, USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032651920","display_name":"Irith Pomeranz","orcid":"https://orcid.org/0000-0002-5491-7282"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"I. Pomeranz","raw_affiliation_strings":["School of ECE, Purdue University, West Lafayette, IN, USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Purdue University, West Lafayette, IN, USA","institution_ids":["https://openalex.org/I219193219"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077101123","display_name":"S.M. Reddy","orcid":"https://orcid.org/0000-0001-9208-8262"},"institutions":[{"id":"https://openalex.org/I126307644","display_name":"University of Iowa","ror":"https://ror.org/036jqmy94","country_code":"US","type":"education","lineage":["https://openalex.org/I126307644"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.M. Reddy","raw_affiliation_strings":["ECE Department, University of Iowa, Iowa, IA, USA"],"affiliations":[{"raw_affiliation_string":"ECE Department, University of Iowa, Iowa, IA, USA","institution_ids":["https://openalex.org/I126307644"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5103050214"],"corresponding_institution_ids":["https://openalex.org/I219193219"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.19056926,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"497","last_page":"502"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.683513343334198},{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.628180205821991},{"id":"https://openalex.org/keywords/random-testing","display_name":"Random testing","score":0.5840283632278442},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5806172490119934},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5364599227905273},{"id":"https://openalex.org/keywords/transition","display_name":"Transition (genetics)","score":0.5184333324432373},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.5032350420951843},{"id":"https://openalex.org/keywords/markov-process","display_name":"Markov process","score":0.4640905261039734},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.44230642914772034},{"id":"https://openalex.org/keywords/markov-model","display_name":"Markov model","score":0.4325951635837555},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.308143675327301},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24178335070610046},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.2398262619972229},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.23092418909072876},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.22151151299476624},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.19920241832733154},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.13835102319717407}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.683513343334198},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.628180205821991},{"id":"https://openalex.org/C106159264","wikidata":"https://www.wikidata.org/wiki/Q17146789","display_name":"Random testing","level":4,"score":0.5840283632278442},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5806172490119934},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5364599227905273},{"id":"https://openalex.org/C194232998","wikidata":"https://www.wikidata.org/wiki/Q1606712","display_name":"Transition (genetics)","level":3,"score":0.5184333324432373},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.5032350420951843},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.4640905261039734},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.44230642914772034},{"id":"https://openalex.org/C163836022","wikidata":"https://www.wikidata.org/wiki/Q6771326","display_name":"Markov model","level":3,"score":0.4325951635837555},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.308143675327301},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24178335070610046},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2398262619972229},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.23092418909072876},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.22151151299476624},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.19920241832733154},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.13835102319717407},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/isqed.2004.1283722","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2004.1283722","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720)","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.499.6364","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.499.6364","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/2004/isqed04/pdffiles/p497.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1554885925","https://openalex.org/W1806107097","https://openalex.org/W2024212907","https://openalex.org/W2030106932","https://openalex.org/W2061946964","https://openalex.org/W2096667381","https://openalex.org/W2104563825","https://openalex.org/W2104892071","https://openalex.org/W2105173909","https://openalex.org/W2115815757","https://openalex.org/W2124629389","https://openalex.org/W2126926159","https://openalex.org/W2133288230","https://openalex.org/W2133482355","https://openalex.org/W2134427430","https://openalex.org/W2137549092","https://openalex.org/W2144033909","https://openalex.org/W2144898259","https://openalex.org/W2147661134","https://openalex.org/W2147710469","https://openalex.org/W2157111192","https://openalex.org/W2163765212","https://openalex.org/W2171003579","https://openalex.org/W2427394675","https://openalex.org/W4233054966","https://openalex.org/W4246972245","https://openalex.org/W4251073495","https://openalex.org/W4252072603","https://openalex.org/W6679754462","https://openalex.org/W6681008240"],"related_works":["https://openalex.org/W2989159162","https://openalex.org/W2153201966","https://openalex.org/W2122754719","https://openalex.org/W2139513292","https://openalex.org/W1982569681","https://openalex.org/W776711554","https://openalex.org/W1874778078","https://openalex.org/W2536854812","https://openalex.org/W2005858638","https://openalex.org/W3147816099"],"abstract_inverted_index":{"We":[0,20],"propose":[1,55],"a":[2,13,37,56,105],"new":[3,57],"scan":[4],"BIST":[5],"method":[6,11,23,58,92],"for":[7,16,24,30,40,50,59,80],"transition":[8,41,72,81,89,99],"faults.":[9,52,73,90],"The":[10,91],"uses":[12],"Markov":[14,38],"source":[15,39],"test":[17],"pattern":[18],"generation.":[19],"develop":[21],"this":[22],"skewed-load":[25],"testing":[26],"as":[27,29],"well":[28],"broadside":[31],"testing.":[32],"In":[33],"the":[34,86],"design":[35],"of":[36,47,62,78,97,108],"faults,":[42,82],"we":[43,54,83],"first":[44],"use":[45],"statistics":[46,66,77],"deterministic":[48],"tests":[49,64,79],"stuck-at":[51,63],"Then,":[53],"identifying":[60],"subsets":[61],"whose":[65],"are":[67],"useful":[68],"in":[69,101],"detecting":[70],"hard-to-detect":[71],"Finally,":[74],"by":[75],"using":[76,104],"detect":[84],"all":[85],"remaining":[87],"detectable":[88,98],"reported":[93],"achieves":[94],"complete":[95],"coverage":[96],"faults":[100],"benchmark":[102],"circuits":[103],"limited":[106],"number":[107],"pseudo-random":[109],"tests.":[110]},"counts_by_year":[{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}