{"id":"https://openalex.org/W2103576593","doi":"https://doi.org/10.1109/isqed.2004.1283707","title":"Automated test generation and test point selection for specification test of analog circuits","display_name":"Automated test generation and test point selection for specification test of analog circuits","publication_year":2004,"publication_date":"2004-05-06","ids":{"openalex":"https://openalex.org/W2103576593","doi":"https://doi.org/10.1109/isqed.2004.1283707","mag":"2103576593"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2004.1283707","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2004.1283707","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067831800","display_name":"Arnab Halder","orcid":"https://orcid.org/0000-0003-3606-3532"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"A. Halder","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology, Atlanta, GA, USA","Sch. of Electr. & Comput. Eng.,, Georgia Inst. of Technol., Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Sch. of Electr. & Comput. Eng.,, Georgia Inst. of Technol., Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069579193","display_name":"Abhijit Chatterjee","orcid":"https://orcid.org/0000-0003-1553-4470"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Chatterjee","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology, Atlanta, GA, USA","Sch. of Electr. & Comput. Eng.,, Georgia Inst. of Technol., Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Sch. of Electr. & Comput. Eng.,, Georgia Inst. of Technol., Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5067831800"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":0.5293,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.66235035,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"401","last_page":"406"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.646180272102356},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6414670944213867},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.5650964975357056},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.489955335855484},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.48952019214630127},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.4729565978050232},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.4271664023399353},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.41871178150177},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.41687893867492676},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.337743878364563},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.22187119722366333},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16430523991584778}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.646180272102356},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6414670944213867},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.5650964975357056},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.489955335855484},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.48952019214630127},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.4729565978050232},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.4271664023399353},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.41871178150177},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.41687893867492676},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.337743878364563},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.22187119722366333},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16430523991584778},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/isqed.2004.1283707","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2004.1283707","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"SCS 2003. International Symposium on Signals, Circuits and Systems. Proceedings (Cat. No.03EX720)","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.487.6687","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.487.6687","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/2004/isqed04/pdffiles/p401.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.660.5946","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.660.5946","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.pld.ttu.ee/%7Eraiub/files/aaaaa_pulk/julia/dft_jonkop/new_papers/chatterjee04.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1530415237","https://openalex.org/W1531491886","https://openalex.org/W1555400249","https://openalex.org/W1924227955","https://openalex.org/W2084128131","https://openalex.org/W2096120821","https://openalex.org/W2100852066","https://openalex.org/W2102201073","https://openalex.org/W2102378583","https://openalex.org/W2116080338","https://openalex.org/W2122770098","https://openalex.org/W2129463449","https://openalex.org/W2131374318","https://openalex.org/W2133137536","https://openalex.org/W2133952565","https://openalex.org/W2136491990","https://openalex.org/W2145650242","https://openalex.org/W4242225258","https://openalex.org/W6631530179"],"related_works":["https://openalex.org/W1588361197","https://openalex.org/W2091533492","https://openalex.org/W1991935474","https://openalex.org/W1953724919","https://openalex.org/W2134369540","https://openalex.org/W2408214455","https://openalex.org/W2082561435","https://openalex.org/W1950483953","https://openalex.org/W2110962837","https://openalex.org/W4319302805"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3,30,58,66],"new":[4],"automated":[5],"test":[6,10,33,43,55,73,85,88,105],"generation":[7,86],"and":[8,35,87],"concurrent":[9],"point":[11,89],"selection":[12,37,90],"algorithm":[13],"for":[14],"specification":[15,98],"based":[16,64,69],"testing":[17],"of":[18,29,38,42,71,79,97,118],"analog":[19],"circuits":[20],"is":[21,63],"presented.":[22],"The":[23,47,84],"proposed":[24,120],"approach":[25],"co-optimizes":[26],"the":[27,36,39,54,72,77,80,95,101,110,119],"construction":[28],"multi-tone":[31],"sinusoidal":[32],"stimulus":[34],"best":[40],"set":[41],"response":[44,56,74],"observation":[45],"points.":[46],"circuit":[48,81],"specifications":[49,78],"are":[50,107],"predicted":[51,111],"accurately":[52],"from":[53],"using":[57,100,109],"prior":[59],"algorithm.":[60],"This":[61],"prediction":[62,99],"on":[65],"statistical":[67],"regression":[68],"mapping":[70],"waveform":[75],"to":[76,93],"under":[82],"test.":[83],"process":[91],"tries":[92],"maximize":[94],"accuracy":[96],"above":[102],"mapping.":[103],"Pass/fail":[104],"decisions":[106],"made":[108],"specifications.":[112],"Simulation":[113],"results":[114],"show":[115],"excellent":[116],"performance":[117],"algorithms.":[121]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}