{"id":"https://openalex.org/W2109087211","doi":"https://doi.org/10.1109/isqed.2003.1194772","title":"On structural vs. functional testing for delay faults","display_name":"On structural vs. functional testing for delay faults","publication_year":2004,"publication_date":"2004-03-22","ids":{"openalex":"https://openalex.org/W2109087211","doi":"https://doi.org/10.1109/isqed.2003.1194772","mag":"2109087211"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2003.1194772","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2003.1194772","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fourth International Symposium on Quality Electronic Design, 2003. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111934210","display_name":"A. Krsti\u0107","orcid":null},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"A. Krstic","raw_affiliation_strings":["Department of ECE, University of California, Santa Barbara, USA","Dept. of Electr. & Comput. Eng., California Univ. Santa Barbara, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of ECE, University of California, Santa Barbara, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., California Univ. Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110204273","display_name":"Jing-Jia Liou","orcid":null},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]},{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Jing-Jia Liou","raw_affiliation_strings":["Department of ECE, University of California, Santa Barbara, USA","National Tsing Hua University"],"affiliations":[{"raw_affiliation_string":"Department of ECE, University of California, Santa Barbara, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"National Tsing Hua University","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077687075","display_name":"Kwang\u2010Ting Cheng","orcid":"https://orcid.org/0000-0002-3885-4912"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kwang-Ting Cheng","raw_affiliation_strings":["Department of ECE, University of California, Santa Barbara, USA","University of California,Santa Barbara,"],"affiliations":[{"raw_affiliation_string":"Department of ECE, University of California, Santa Barbara, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"University of California,Santa Barbara,","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100369642","display_name":"Li-C. Wang","orcid":"https://orcid.org/0000-0003-4851-8004"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L.-C. Wang","raw_affiliation_strings":["Department of ECE, University of California, Santa Barbara, USA","University of California,Santa Barbara,"],"affiliations":[{"raw_affiliation_string":"Department of ECE, University of California, Santa Barbara, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"University of California,Santa Barbara,","institution_ids":["https://openalex.org/I154570441"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5111934210"],"corresponding_institution_ids":["https://openalex.org/I154570441"],"apc_list":null,"apc_paid":null,"fwci":4.0906,"has_fulltext":false,"cited_by_count":31,"citation_normalized_percentile":{"value":0.93574752,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"438","last_page":"441"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6005460023880005},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.48569831252098083},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.44827908277511597},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.44659629464149475},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.442681223154068},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.42495957016944885},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4167885482311249},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15360495448112488},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.09952238202095032},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.09840512275695801}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6005460023880005},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.48569831252098083},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.44827908277511597},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.44659629464149475},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.442681223154068},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.42495957016944885},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4167885482311249},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15360495448112488},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.09952238202095032},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.09840512275695801},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/isqed.2003.1194772","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2003.1194772","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fourth International Symposium on Quality Electronic Design, 2003. Proceedings.","raw_type":"proceedings-article"},{"id":"pmh:oai:repository.hkust.edu.hk:1783.1-77852","is_oa":false,"landing_page_url":"http://repository.hkust.edu.hk/ir/Record/1783.1-77852","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference paper"},{"id":"pmh:oai:repository.ust.hk:1783.1-77852","is_oa":false,"landing_page_url":"http://gateway.isiknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=LinksAMR&SrcApp=PARTNER_APP&DestLinkType=FullRecord&DestApp=WOS&KeyUT=000182249900063","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference paper"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W10686556","https://openalex.org/W1511398680","https://openalex.org/W1525885020","https://openalex.org/W1583304273","https://openalex.org/W1980985044","https://openalex.org/W2058969148","https://openalex.org/W2077470597","https://openalex.org/W2079769980","https://openalex.org/W2098961935","https://openalex.org/W2110164501","https://openalex.org/W2115795793","https://openalex.org/W2120349591","https://openalex.org/W2127676287","https://openalex.org/W2128627202","https://openalex.org/W2137279507","https://openalex.org/W2141985270","https://openalex.org/W2164754947","https://openalex.org/W3148660165","https://openalex.org/W4300535269","https://openalex.org/W6630589821","https://openalex.org/W6678977941"],"related_works":["https://openalex.org/W2131559056","https://openalex.org/W4254560580","https://openalex.org/W2127167802","https://openalex.org/W2080984854","https://openalex.org/W2323083271","https://openalex.org/W2019500818","https://openalex.org/W2767970036","https://openalex.org/W2009690023","https://openalex.org/W2167385408","https://openalex.org/W4246342274"],"abstract_inverted_index":{"A":[0],"structurally":[1,37],"testable":[2,40],"delay":[3,41,93,103],"fault":[4],"might":[5,90],"become":[6],"untestable":[7],"in":[8,33],"the":[9,13,34,92,102],"functional":[10,87],"mode":[11],"of":[12,36,101],"circuit":[14],"due":[15],"to":[16,81],"logic":[17,52],"or":[18,21],"timing":[19,63,73],"constraints":[20,64],"both.":[22],"Experimental":[23],"data":[24],"suggests":[25],"that":[26],"there":[27],"could":[28],"be":[29],"a":[30],"large":[31],"difference":[32,45,59],"number":[35],"and":[38,86,96],"functionally":[39],"faults.":[42],"However,":[43],"this":[44,58,76],"is":[46,55,80],"usually":[47],"calculated":[48],"based":[49],"only":[50],"on":[51],"constraints.":[53],"It":[54],"unclear":[56],"how":[57,84],"would":[60],"change":[61,98],"if":[62],"were":[65],"taken":[66],"into":[67],"consideration,":[68],"especially":[69],"when":[70],"using":[71],"statistical":[72],"models.":[74],"In":[75],"paper,":[77],"our":[78,99],"goal":[79],"better":[82],"understand":[83],"structural":[85],"test":[88,94,104],"strategies":[89],"affect":[91],"quality":[95],"consequently,":[97],"perception":[100],"results.":[105]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}