{"id":"https://openalex.org/W2110758947","doi":"https://doi.org/10.1109/isqed.2003.1194771","title":"Automatic repositioning technique for digital cell based window comparators and implementation within mixed-signal DfT schemes","display_name":"Automatic repositioning technique for digital cell based window comparators and implementation within mixed-signal DfT schemes","publication_year":2004,"publication_date":"2004-03-22","ids":{"openalex":"https://openalex.org/W2110758947","doi":"https://doi.org/10.1109/isqed.2003.1194771","mag":"2110758947"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2003.1194771","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2003.1194771","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fourth International Symposium on Quality Electronic Design, 2003. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029547724","display_name":"Daniela De Venuto","orcid":"https://orcid.org/0000-0003-4563-7614"},"institutions":[{"id":"https://openalex.org/I68618741","display_name":"Polytechnic University of Bari","ror":"https://ror.org/03c44v465","country_code":"IT","type":"education","lineage":["https://openalex.org/I68618741"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"D. De Venuto","raw_affiliation_strings":["DEE-Politecnico di Bari, Italy","DEE Politecnico di Bari, Italy"],"affiliations":[{"raw_affiliation_string":"DEE-Politecnico di Bari, Italy","institution_ids":["https://openalex.org/I68618741"]},{"raw_affiliation_string":"DEE Politecnico di Bari, Italy","institution_ids":["https://openalex.org/I68618741"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077848693","display_name":"M.J. Ohletz","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"M.J. Ohletz","raw_affiliation_strings":["AMI Semiconductors, Inc., Belgium","[AMI Semiconductors, Inc., Belgium]"],"affiliations":[{"raw_affiliation_string":"AMI Semiconductors, Inc., Belgium","institution_ids":[]},{"raw_affiliation_string":"[AMI Semiconductors, Inc., Belgium]","institution_ids":["https://openalex.org/I4210110772"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075717071","display_name":"B. Ricc\u00f2","orcid":null},"institutions":[{"id":"https://openalex.org/I9360294","display_name":"University of Bologna","ror":"https://ror.org/01111rn36","country_code":"IT","type":"education","lineage":["https://openalex.org/I9360294"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"B. Ricco","raw_affiliation_strings":["DEIS, Universit\u00e0 di Bologna, Italy","DEIS Universita di Bologna, Italy#TAB#"],"affiliations":[{"raw_affiliation_string":"DEIS, Universit\u00e0 di Bologna, Italy","institution_ids":["https://openalex.org/I9360294"]},{"raw_affiliation_string":"DEIS Universita di Bologna, Italy#TAB#","institution_ids":["https://openalex.org/I9360294"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5029547724"],"corresponding_institution_ids":["https://openalex.org/I68618741"],"apc_list":null,"apc_paid":null,"fwci":2.117,"has_fulltext":false,"cited_by_count":28,"citation_normalized_percentile":{"value":0.86537992,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"14","issue":null,"first_page":"431","last_page":"437"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.975054919719696},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7536384463310242},{"id":"https://openalex.org/keywords/window","display_name":"Window (computing)","score":0.7190816402435303},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44311487674713135},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.40165114402770996},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18802443146705627},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16897183656692505},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14490431547164917}],"concepts":[{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.975054919719696},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7536384463310242},{"id":"https://openalex.org/C2778751112","wikidata":"https://www.wikidata.org/wiki/Q835016","display_name":"Window (computing)","level":2,"score":0.7190816402435303},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44311487674713135},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.40165114402770996},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18802443146705627},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16897183656692505},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14490431547164917},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/isqed.2003.1194771","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2003.1194771","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fourth International Symposium on Quality Electronic Design, 2003. Proceedings.","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.324.4639","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.324.4639","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cecs.uci.edu/~papers/compendium94-03/papers/2003/isqed03/pdffiles/6b_3.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1548883899","https://openalex.org/W1857366665","https://openalex.org/W1973814300","https://openalex.org/W2095860706","https://openalex.org/W2153746676","https://openalex.org/W2161134518","https://openalex.org/W2162332030","https://openalex.org/W2166053532"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2034349229","https://openalex.org/W4366783034","https://openalex.org/W1972415042","https://openalex.org/W4313221225","https://openalex.org/W2150642609","https://openalex.org/W2010766010","https://openalex.org/W2922086473","https://openalex.org/W4385452214"],"abstract_inverted_index":{"The":[0,50],"possibility":[1],"of":[2,10,25,32,69,84],"using":[3],"window":[4,38,48],"comparators":[5,62],"for":[6,52],"the":[7,13,26,29,33,47,53,60,67,70,79,85,89,106],"on-chip":[8],"evaluation":[9,61,86],"signals":[11],"in":[12,105],"analogue":[14],"circuit":[15],"part":[16],"has":[17],"been":[18],"demonstrated":[19],"and":[20,59],"is":[21,28,41,73],"shortly":[22],"summarized.":[23],"One":[24],"problems":[27],"lot-to-lot":[30],"variation":[31],"comparator":[34,58],"window.":[35],"An":[36],"automatic":[37,80],"repositioning":[39],"technique":[40,77,90],"detailed":[42],"that":[43,75,101],"allows":[44,78],"to":[45,96,110],"compensate":[46],"shift.":[49],"components":[51],"implementation":[54,68],"comprising":[55],"a":[56],"reference":[57],"are":[63],"described":[64],"along":[65],"with":[66],"technique.":[71],"It":[72],"shown,":[74],"this":[76],"lot":[81,93],"condition":[82],"adjustment":[83],"comparators.":[87],"Furthermore":[88],"can":[91,102],"provide":[92],"specific":[94],"information":[95],"an":[97],"automated":[98],"test":[99,107],"equipment":[100],"be":[103],"documented":[104],"results":[108],"due":[109],"its":[111],"diagnosis":[112],"capability.":[113]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":2}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}