{"id":"https://openalex.org/W2120837683","doi":"https://doi.org/10.1109/isqed.2003.1194732","title":"Assessment of the OpenAccess Standard: insights on the new EDA industry standard from Hewlett-Packard, a Beta partner and contributing developer","display_name":"Assessment of the OpenAccess Standard: insights on the new EDA industry standard from Hewlett-Packard, a Beta partner and contributing developer","publication_year":2004,"publication_date":"2004-03-22","ids":{"openalex":"https://openalex.org/W2120837683","doi":"https://doi.org/10.1109/isqed.2003.1194732","mag":"2120837683"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2003.1194732","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2003.1194732","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fourth International Symposium on Quality Electronic Design, 2003. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078507487","display_name":"Troy C. Blanchard","orcid":null},"institutions":[{"id":"https://openalex.org/I1324840837","display_name":"Hewlett-Packard (United States)","ror":"https://ror.org/059rn9488","country_code":"US","type":"company","lineage":["https://openalex.org/I1324840837"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"T. Blanchard","raw_affiliation_strings":["Hewlett Packard Company, USA","Hewlett-Packard, Co., USA"],"affiliations":[{"raw_affiliation_string":"Hewlett Packard Company, USA","institution_ids":["https://openalex.org/I1324840837"]},{"raw_affiliation_string":"Hewlett-Packard, Co., USA","institution_ids":["https://openalex.org/I1324840837"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5078507487"],"corresponding_institution_ids":["https://openalex.org/I1324840837"],"apc_list":null,"apc_paid":null,"fwci":0.8466,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.79786154,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"203","last_page":"207"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.986299991607666,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.986299991607666,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9818000197410583,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9761999845504761,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/standardization","display_name":"Standardization","score":0.8374764323234558},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6011365652084351},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.5783774852752686},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.4773688018321991},{"id":"https://openalex.org/keywords/application-programming-interface","display_name":"Application programming interface","score":0.4647618532180786},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.4450044631958008},{"id":"https://openalex.org/keywords/database","display_name":"Database","score":0.32713237404823303},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.2667689919471741}],"concepts":[{"id":"https://openalex.org/C188087704","wikidata":"https://www.wikidata.org/wiki/Q369577","display_name":"Standardization","level":2,"score":0.8374764323234558},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6011365652084351},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.5783774852752686},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.4773688018321991},{"id":"https://openalex.org/C99613125","wikidata":"https://www.wikidata.org/wiki/Q165194","display_name":"Application programming interface","level":2,"score":0.4647618532180786},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.4450044631958008},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.32713237404823303},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.2667689919471741},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/isqed.2003.1194732","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2003.1194732","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fourth International Symposium on Quality Electronic Design, 2003. Proceedings.","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.409.2471","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.409.2471","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/2003/isqed03/pdffiles/3b_1.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6399999856948853,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2101769039"],"related_works":["https://openalex.org/W2378767206","https://openalex.org/W1540871478","https://openalex.org/W328308450","https://openalex.org/W282641168","https://openalex.org/W2376963063","https://openalex.org/W2066396794","https://openalex.org/W2366734808","https://openalex.org/W2002476357","https://openalex.org/W2391444248","https://openalex.org/W2390716080"],"abstract_inverted_index":{"The":[0,31,64],"rapidly":[1],"increasing":[2],"complexity":[3],"and":[4,43,68,92,123,132],"quality":[5],"requirements":[6],"of":[7,27],"integrated":[8],"circuit":[9],"design":[10,18,29,62],"can":[11],"only":[12],"be":[13,76,129],"addressed":[14],"effectively":[15],"by":[16],"a":[17,51,96],"system":[19],"architecture":[20],"that":[21,47],"supports":[22],"very":[23],"efficient,":[24],"high-quality":[25],"sharing":[26],"IC":[28,61],"data.":[30],"OpenAccess":[32,65,88,112],"Coalition":[33],"is":[34],"delivering":[35],"an":[36,55],"industry":[37,80,103],"standard":[38],"application":[39],"programming":[40],"interface":[41],"(API)":[42],"information":[44],"model":[45],"(IM)":[46],"provides":[48],"access":[49],"to":[50,78],"shared":[52],"database":[53],"as":[54,95,115,117],"essential":[56],"infrastructure":[57],"component":[58],"for":[59,100],"modern":[60],"systems.":[63],"Standard":[66,122],"IM":[67],"API,":[69],"along":[70],"with":[71],"its":[72,124],"reference":[73,125],"implementation":[74],"will":[75,128],"released":[77],"the":[79,90,111,120,138,141],"early":[81],"in":[82,87,134],"2003.":[83],"Hewlett-Packard":[84],"has":[85,106],"participated":[86],"from":[89],"outset":[91],"most":[93],"recently":[94],"Beta":[97],"evaluation":[98],"partner":[99],"this":[101],"OA":[102],"release.":[104],"HP":[105],"discovered":[107],"many":[108],"insights":[109],"about":[110,119],"standardization":[113],"process":[114],"well":[116],"specifically":[118],"IM/API":[121],"implementation,":[126],"which":[127],"summarized":[130],"herein,":[131],"explained":[133],"more":[135],"detail":[136],"during":[137],"presentation":[139],"at":[140],"ISQED":[142],"Conference.":[143]},"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}