{"id":"https://openalex.org/W2153097515","doi":"https://doi.org/10.1109/isqed.2003.1194722","title":"System and framework for QA of process design kits","display_name":"System and framework for QA of process design kits","publication_year":2004,"publication_date":"2004-03-22","ids":{"openalex":"https://openalex.org/W2153097515","doi":"https://doi.org/10.1109/isqed.2003.1194722","mag":"2153097515"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2003.1194722","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2003.1194722","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fourth International Symposium on Quality Electronic Design, 2003. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026545985","display_name":"Marg Scott","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"M.C. Scott","raw_affiliation_strings":["Design Automation Group, Texas Instrumenits, Inc., Tucson, AZ, USA"],"affiliations":[{"raw_affiliation_string":"Design Automation Group, Texas Instrumenits, Inc., Tucson, AZ, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017252138","display_name":"Maxime Peralta","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.O. Peralta","raw_affiliation_strings":["Device Modeling Laboratory, Texas Instrumenits, Inc., Tucson, AZ, USA"],"affiliations":[{"raw_affiliation_string":"Device Modeling Laboratory, Texas Instrumenits, Inc., Tucson, AZ, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053466959","display_name":"J.D. Carothers","orcid":null},"institutions":[{"id":"https://openalex.org/I138006243","display_name":"University of Arizona","ror":"https://ror.org/03m2x1q45","country_code":"US","type":"education","lineage":["https://openalex.org/I138006243"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.D. Carothers","raw_affiliation_strings":["ECE Dept, University of Arizona Tucson, Tucson, AZ, USA"],"affiliations":[{"raw_affiliation_string":"ECE Dept, University of Arizona Tucson, Tucson, AZ, USA","institution_ids":["https://openalex.org/I138006243"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5026545985"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.1828095,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"138","last_page":"143"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7155988812446594},{"id":"https://openalex.org/keywords/schematic","display_name":"Schematic","score":0.5883529186248779},{"id":"https://openalex.org/keywords/chaining","display_name":"Chaining","score":0.5729577541351318},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.5525439381599426},{"id":"https://openalex.org/keywords/parasitic-extraction","display_name":"Parasitic extraction","score":0.5158156752586365},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.49310824275016785},{"id":"https://openalex.org/keywords/inference-engine","display_name":"Inference engine","score":0.4614594578742981},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.45625218749046326},{"id":"https://openalex.org/keywords/constraint-satisfaction-problem","display_name":"Constraint satisfaction problem","score":0.45567047595977783},{"id":"https://openalex.org/keywords/inference","display_name":"Inference","score":0.31590497493743896},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.20267334580421448},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17846331000328064},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.1670166254043579}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7155988812446594},{"id":"https://openalex.org/C192328126","wikidata":"https://www.wikidata.org/wiki/Q4514647","display_name":"Schematic","level":2,"score":0.5883529186248779},{"id":"https://openalex.org/C49020025","wikidata":"https://www.wikidata.org/wiki/Q1059099","display_name":"Chaining","level":2,"score":0.5729577541351318},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.5525439381599426},{"id":"https://openalex.org/C159818811","wikidata":"https://www.wikidata.org/wiki/Q7135947","display_name":"Parasitic extraction","level":2,"score":0.5158156752586365},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.49310824275016785},{"id":"https://openalex.org/C46743427","wikidata":"https://www.wikidata.org/wiki/Q1341685","display_name":"Inference engine","level":3,"score":0.4614594578742981},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.45625218749046326},{"id":"https://openalex.org/C199622910","wikidata":"https://www.wikidata.org/wiki/Q1128326","display_name":"Constraint satisfaction problem","level":3,"score":0.45567047595977783},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.31590497493743896},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.20267334580421448},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17846331000328064},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.1670166254043579},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/isqed.2003.1194722","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2003.1194722","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fourth International Symposium on Quality Electronic Design, 2003. Proceedings.","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.408.9539","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.408.9539","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/2003/isqed03/pdffiles/2b_4.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5299999713897705,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W4789806","https://openalex.org/W1979564935","https://openalex.org/W2121770624","https://openalex.org/W4233538641","https://openalex.org/W6600187994","https://openalex.org/W6678115194"],"related_works":["https://openalex.org/W1905216755","https://openalex.org/W2104218257","https://openalex.org/W2117417104","https://openalex.org/W2534619547","https://openalex.org/W1923048618","https://openalex.org/W2114012716","https://openalex.org/W2096970714","https://openalex.org/W2051886008","https://openalex.org/W2110634429","https://openalex.org/W2035081722"],"abstract_inverted_index":{"In":[0,83],"this":[1],"paper,":[2],"we":[3],"evaluate":[4],"the":[5,23,26,32,76,81,96,107,118],"dependencies":[6],"between":[7],"tools,":[8],"data":[9],"and":[10,16,29,60,71,105,125,132],"environment":[11],"in":[12,47,95],"process":[13],"design":[14,27,33,123,133],"kits.":[15],"present":[17],"a":[18,39,48],"framework":[19,36,119],"for":[20,128],"systematically":[21],"analyzing":[22],"quality":[24],"of":[25,38,45],"tools":[28],"libraries":[30],"through":[31],"flow.":[34],"The":[35],"consists":[37],"regression":[40],"engine":[41],"which":[42],"executes":[43],"sets":[44],"tests":[46,53,63,73],"distributed":[49],"computing":[50],"environment.":[51],"These":[52],"vary":[54],"from":[55],"simulations":[56],"to":[57,62,74,92,103,116,120],"validate":[58,75],"models":[59],"simulators,":[61],"on":[64],"layout":[65],"versus":[66],"schematics,":[67],"parasitics":[68],"extraction":[69],"accuracy,":[70],"ultimately,":[72],"extracted":[77],"circuit":[78],"integrity":[79],"against":[80],"ideal.":[82],"particular,":[84],"it":[85],"is":[86,90,102,114],"shown":[87],"that":[88],"test-chaining":[89],"required":[91],"obtain":[93],"confidence":[94],"simulation-to-silicon":[97],"equivalence.":[98],"A":[99],"secondary":[100],"objective":[101],"identify":[104],"quantify":[106],"peak-error":[108],"injection":[109],"points.":[110],"Finally,":[111],"future":[112],"work":[113],"outlined":[115],"extend":[117],"automate":[121],"entire":[122],"flows":[124],"provide":[126],"capability":[127],"inter-tool":[129],"constraint":[130],"satisfaction":[131],"optimization.":[134]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}