{"id":"https://openalex.org/W2118970729","doi":"https://doi.org/10.1109/isqed.2003.1194718","title":"Automated synthesis of configurable two-dimensional linear feedback shifter registers for random/embedded test patterns","display_name":"Automated synthesis of configurable two-dimensional linear feedback shifter registers for random/embedded test patterns","publication_year":2004,"publication_date":"2004-03-22","ids":{"openalex":"https://openalex.org/W2118970729","doi":"https://doi.org/10.1109/isqed.2003.1194718","mag":"2118970729"},"language":"en","primary_location":{"id":"doi:10.1109/isqed.2003.1194718","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2003.1194718","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fourth International Symposium on Quality Electronic Design, 2003. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113018814","display_name":"C.-I.H. Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I19648265","display_name":"Wright State University","ror":"https://ror.org/04qk6pt94","country_code":"US","type":"education","lineage":["https://openalex.org/I19648265"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"C.-I.H. Chen","raw_affiliation_strings":["Department of Electrical Engineering, Wright State University, Dayton, OH, USA","Dept. of Electr. Eng., Wright State Univ., Dayton, OH, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Wright State University, Dayton, OH, USA","institution_ids":["https://openalex.org/I19648265"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Wright State Univ., Dayton, OH, USA","institution_ids":["https://openalex.org/I19648265"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109052390","display_name":"Kiran George","orcid":null},"institutions":[{"id":"https://openalex.org/I19648265","display_name":"Wright State University","ror":"https://ror.org/04qk6pt94","country_code":"US","type":"education","lineage":["https://openalex.org/I19648265"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. George","raw_affiliation_strings":["Department of Electrical Engineering, Wright State University, Dayton, OH, USA","Dept. of Electr. Eng., Wright State Univ., Dayton, OH, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Wright State University, Dayton, OH, USA","institution_ids":["https://openalex.org/I19648265"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Wright State Univ., Dayton, OH, USA","institution_ids":["https://openalex.org/I19648265"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5113018814"],"corresponding_institution_ids":["https://openalex.org/I19648265"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15770828,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"111","last_page":"116"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9878000020980835,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.7993387579917908},{"id":"https://openalex.org/keywords/shift-register","display_name":"Shift register","score":0.7323221564292908},{"id":"https://openalex.org/keywords/linear-feedback-shift-register","display_name":"Linear feedback shift register","score":0.7241376042366028},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6503323912620544},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6374245285987854},{"id":"https://openalex.org/keywords/digital-pattern-generator","display_name":"Digital pattern generator","score":0.6262366771697998},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5773527026176453},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5737940669059753},{"id":"https://openalex.org/keywords/pseudorandom-number-generator","display_name":"Pseudorandom number generator","score":0.5683311223983765},{"id":"https://openalex.org/keywords/random-number-generation","display_name":"Random number generation","score":0.4783291816711426},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.4577542543411255},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.4569265842437744},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.446493536233902},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.42020362615585327},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3451067805290222},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3202248215675354},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20694506168365479},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.1012285053730011},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.0992647111415863}],"concepts":[{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.7993387579917908},{"id":"https://openalex.org/C49654631","wikidata":"https://www.wikidata.org/wiki/Q746165","display_name":"Shift register","level":3,"score":0.7323221564292908},{"id":"https://openalex.org/C159862308","wikidata":"https://www.wikidata.org/wiki/Q681101","display_name":"Linear feedback shift register","level":4,"score":0.7241376042366028},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6503323912620544},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6374245285987854},{"id":"https://openalex.org/C151346624","wikidata":"https://www.wikidata.org/wiki/Q5276129","display_name":"Digital pattern generator","level":3,"score":0.6262366771697998},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5773527026176453},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5737940669059753},{"id":"https://openalex.org/C140642157","wikidata":"https://www.wikidata.org/wiki/Q1623338","display_name":"Pseudorandom number generator","level":2,"score":0.5683311223983765},{"id":"https://openalex.org/C201866948","wikidata":"https://www.wikidata.org/wiki/Q228206","display_name":"Random number generation","level":2,"score":0.4783291816711426},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4577542543411255},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.4569265842437744},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.446493536233902},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.42020362615585327},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3451067805290222},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3202248215675354},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20694506168365479},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.1012285053730011},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0992647111415863},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/isqed.2003.1194718","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isqed.2003.1194718","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Fourth International Symposium on Quality Electronic Design, 2003. Proceedings.","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.409.4693","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.409.4693","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/2003/isqed03/pdffiles/2a_4.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W260727648","https://openalex.org/W1515082873","https://openalex.org/W2046314918","https://openalex.org/W2104563825","https://openalex.org/W2105377767","https://openalex.org/W2118767489","https://openalex.org/W2122857933","https://openalex.org/W2125837930","https://openalex.org/W2127181941","https://openalex.org/W2135931142","https://openalex.org/W2138530143","https://openalex.org/W2144792149","https://openalex.org/W2293394215","https://openalex.org/W3146394386","https://openalex.org/W4230587734","https://openalex.org/W4297159816","https://openalex.org/W6675772948","https://openalex.org/W6843276737"],"related_works":["https://openalex.org/W2101477403","https://openalex.org/W2104563825","https://openalex.org/W2761125259","https://openalex.org/W2188176208","https://openalex.org/W2119351822","https://openalex.org/W2080947141","https://openalex.org/W4288754393","https://openalex.org/W2118970729","https://openalex.org/W2761883387","https://openalex.org/W1182583055"],"abstract_inverted_index":{"A":[0],"new":[1],"approach":[2],"to":[3],"optimize":[4],"a":[5,38],"configurable":[6,29,56,88,108],"two-dimensional":[7],"(2-D)":[8],"linear":[9],"feedback":[10],"shift":[11],"registers":[12],"(LFSR)":[13],"for":[14,44,52,82,123],"both":[15],"embedded":[16],"and":[17,47,73],"random":[18,50],"test":[19,33,42,59],"pattern":[20,34],"generation":[21],"in":[22,64,133],"built-in":[23],"self-test":[24],"(BIST)":[25],"is":[26,97,111],"proposed.":[27],"This":[28],"2-D":[30,57,95,109],"LFSR":[31,58,96,110],"based":[32],"generator":[35,60],"generates:":[36],"1)":[37],"deterministic":[39],"sequence":[40],"of":[41,79,92,94,104,120,129],"patterns":[43,51],"random-pattern-resistant":[45],"faults,":[46],"then":[48],"2)":[49],"random-pattern-detectable":[53],"faults.":[54],"The":[55,101],"can":[61,138],"be":[62,139],"adopted":[63],"two":[65],"basic":[66],"BIST":[67,81,122],"execution":[68],"options:":[69],"test-per-clock":[70,80],"(parallel":[71],"BIST)":[72],"test-per-scan":[74,121],"(serial":[75],"BIST).":[76],"Experimental":[77,118],"results":[78,119],"benchmark":[83,124],"circuits":[84,125],"show":[85],"with":[86],"the":[87,90,115,127,130],"scheme":[89],"number":[91,103],"flip-flops":[93],"reduced":[98],"by":[99,107],"79%.":[100],"average":[102],"faults":[105],"detected":[106],"9.27%":[112],"higher":[113],"than":[114],"conventional":[116],"LFSR.":[117],"demonstrate":[126],"effectiveness":[128],"proposed":[131],"technique":[132],"which":[134],"high":[135],"fault":[136],"coverage":[137],"achieved.":[140]},"counts_by_year":[],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}