{"id":"https://openalex.org/W4391216892","doi":"https://doi.org/10.1109/ispec58282.2023.10402973","title":"Intelligent Switching Line Device for Temperature Rise Test of Power Distribution Equipment","display_name":"Intelligent Switching Line Device for Temperature Rise Test of Power Distribution Equipment","publication_year":2023,"publication_date":"2023-11-28","ids":{"openalex":"https://openalex.org/W4391216892","doi":"https://doi.org/10.1109/ispec58282.2023.10402973"},"language":"en","primary_location":{"id":"doi:10.1109/ispec58282.2023.10402973","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/ispec58282.2023.10402973","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE Sustainable Power and Energy Conference (iSPEC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101491024","display_name":"Jian Fang","orcid":"https://orcid.org/0000-0003-1672-4807"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jian Fang","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100332091","display_name":"Hongbin Wang","orcid":"https://orcid.org/0000-0002-9828-9054"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hongbin Wang","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100402892","display_name":"Min Zhang","orcid":"https://orcid.org/0000-0002-2225-8024"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Min Zhang","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111118156","display_name":"Haicheng Hong","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Haicheng Hong","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049496485","display_name":"Xiang Lin","orcid":"https://orcid.org/0000-0002-7811-5583"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Xiang Lin","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108809071","display_name":"Yan Tian","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yan Tian","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5011613331","display_name":"Fengxiang Zhou","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Fengxiang Zhou","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17795763,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5714741945266724},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5497642755508423},{"id":"https://openalex.org/keywords/test-equipment","display_name":"Test equipment","score":0.5261637568473816},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.4611618220806122},{"id":"https://openalex.org/keywords/power-grid","display_name":"Power grid","score":0.4482989013195038},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4369880259037018},{"id":"https://openalex.org/keywords/electrical-equipment","display_name":"Electrical equipment","score":0.42124953866004944},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.400737464427948},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39230817556381226},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.3715389370918274}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5714741945266724},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5497642755508423},{"id":"https://openalex.org/C2983725658","wikidata":"https://www.wikidata.org/wiki/Q7705768","display_name":"Test equipment","level":2,"score":0.5261637568473816},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.4611618220806122},{"id":"https://openalex.org/C2983254600","wikidata":"https://www.wikidata.org/wiki/Q1096907","display_name":"Power grid","level":3,"score":0.4482989013195038},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4369880259037018},{"id":"https://openalex.org/C162175671","wikidata":"https://www.wikidata.org/wiki/Q3749263","display_name":"Electrical equipment","level":2,"score":0.42124953866004944},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.400737464427948},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39230817556381226},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.3715389370918274},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ispec58282.2023.10402973","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/ispec58282.2023.10402973","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE Sustainable Power and Energy Conference (iSPEC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8700000047683716,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320323192","display_name":"China Southern Power Grid","ror":"https://ror.org/03hkh9419"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2888335329","https://openalex.org/W4214522794","https://openalex.org/W4223426943","https://openalex.org/W4293255169"],"related_works":["https://openalex.org/W2143294572","https://openalex.org/W4250651147","https://openalex.org/W4231859554","https://openalex.org/W1570780063","https://openalex.org/W2010684848","https://openalex.org/W2374190127","https://openalex.org/W2145792104","https://openalex.org/W4200081634","https://openalex.org/W1539818450","https://openalex.org/W2886943583"],"abstract_inverted_index":{"The":[0],"safe":[1],"operation":[2],"of":[3,12,19,42,56,97],"power":[4,14],"distribution":[5,21,26,58,67,98],"equipment":[6,23,28,60,69],"is":[7],"crucial":[8],"to":[9,52,94],"the":[10,13,16,20,25,36,54,57,66,74],"stability":[11],"grid,":[15],"operating":[17],"conditions":[18],"network":[22,27,59,68],"on":[24],"detection":[29,39],"test":[30,72,82],"efficiency":[31],"put":[32],"forward":[33],"higher":[34],"requirements,":[35],"current":[37],"traditional":[38],"methods":[40],"flow":[41],"cumbersome":[43],"procedures,":[44],"manpower,":[45],"and":[46,79,84],"material":[47],"costs,":[48],"has":[49],"been":[50],"unable":[51],"meet":[53],"requirements":[55],"testing.":[61],"Therefore,":[62],"this":[63],"paper":[64],"considered":[65],"temperature":[70],"rise":[71],"in":[73],"load":[75],"test,":[76,78],"no-load":[77],"other":[80],"specific":[81],"types,":[83],"designed":[85],"an":[86],"intelligent":[87],"switching":[88],"device,":[89],"which":[90],"could":[91],"be":[92],"applied":[93],"different":[95],"tests":[96],"equipment.":[99]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}