{"id":"https://openalex.org/W2735162286","doi":"https://doi.org/10.1109/ispass.2017.7975296","title":"SASSIFI: An architecture-level fault injection tool for GPU application resilience evaluation","display_name":"SASSIFI: An architecture-level fault injection tool for GPU application resilience evaluation","publication_year":2017,"publication_date":"2017-04-01","ids":{"openalex":"https://openalex.org/W2735162286","doi":"https://doi.org/10.1109/ispass.2017.7975296","mag":"2735162286"},"language":"en","primary_location":{"id":"doi:10.1109/ispass.2017.7975296","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ispass.2017.7975296","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054590774","display_name":"Siva Kumar Sastry Hari","orcid":"https://orcid.org/0000-0001-8346-7981"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Siva Kumar Sastry Hari","raw_affiliation_strings":["NVIDIA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NVIDIA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027550136","display_name":"Timothy Tsai","orcid":"https://orcid.org/0000-0001-8190-675X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Timothy Tsai","raw_affiliation_strings":["NVIDIA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NVIDIA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015391591","display_name":"Mark W. Stephenson","orcid":"https://orcid.org/0000-0002-1350-0165"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mark Stephenson","raw_affiliation_strings":["NVIDIA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NVIDIA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063354509","display_name":"Stephen W. Keckler","orcid":"https://orcid.org/0000-0001-6701-6099"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Stephen W. Keckler","raw_affiliation_strings":["NVIDIA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NVIDIA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024384625","display_name":"Joel Emer","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Joel Emer","raw_affiliation_strings":["NVIDIA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NVIDIA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":172,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"249","last_page":"258"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8459950685501099},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.6570393443107605},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.6225953698158264},{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.6184953451156616},{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.5529754161834717},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.4497300982475281},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.44620177149772644},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.42805570363998413},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4042869508266449},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.23291394114494324},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.20216599106788635}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8459950685501099},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.6570393443107605},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.6225953698158264},{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.6184953451156616},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.5529754161834717},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.4497300982475281},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.44620177149772644},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.42805570363998413},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4042869508266449},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.23291394114494324},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.20216599106788635},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ispass.2017.7975296","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ispass.2017.7975296","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7300000190734863,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1965936844","https://openalex.org/W1972649107","https://openalex.org/W2027716782","https://openalex.org/W2031533321","https://openalex.org/W2053248871","https://openalex.org/W2080592089","https://openalex.org/W2094446102","https://openalex.org/W2098290747","https://openalex.org/W2112029501","https://openalex.org/W2115194678","https://openalex.org/W2123379964","https://openalex.org/W2123907700","https://openalex.org/W2144512449","https://openalex.org/W2150267144","https://openalex.org/W2267020949","https://openalex.org/W2337485678","https://openalex.org/W2411279070","https://openalex.org/W2526744699","https://openalex.org/W2588464298","https://openalex.org/W4231474137","https://openalex.org/W4232837724","https://openalex.org/W4244241786","https://openalex.org/W4249144718","https://openalex.org/W6663799699","https://openalex.org/W6693642690","https://openalex.org/W7055119176"],"related_works":["https://openalex.org/W2044069930","https://openalex.org/W2078707653","https://openalex.org/W3196277062","https://openalex.org/W4224229821","https://openalex.org/W2079643259","https://openalex.org/W2969553121","https://openalex.org/W2593605297","https://openalex.org/W2782341877","https://openalex.org/W3014207222","https://openalex.org/W2485576852"],"abstract_inverted_index":{"As":[0],"GPUs":[1],"become":[2],"more":[3],"pervasive":[4],"in":[5,119],"both":[6],"scalable":[7],"high-performance":[8],"computing":[9],"systems":[10],"and":[11,16,37,56,87,103,127,137,150],"safety-critical":[12],"embedded":[13],"systems,":[14],"evaluating":[15],"analyzing":[17],"their":[18],"resilience":[19,65],"to":[20,39,60,85,97,107,153,163],"soft":[21,45,63],"errors":[22,46,118,134],"caused":[23],"by":[24,93],"high-energy":[25],"particle":[26],"strikes":[27],"will":[28],"grow":[29],"increasingly":[30],"important.":[31],"GPU":[32,102,122],"designers":[33],"must":[34],"develop":[35],"tools":[36],"techniques":[38],"understand":[40],"the":[41,62,101,105,145,157],"effect":[42],"of":[43,66,156],"these":[44],"on":[47,71,100],"applications.":[48],"This":[49],"paper":[50],"presents":[51],"an":[52],"error":[53,64],"injection-based":[54],"methodology":[55],"tool":[57,82],"called":[58,83],"SASSIFI":[59,115,130,146,159],"study":[61],"massively":[67],"parallel":[68],"applications":[69],"running":[70],"state-of-the-art":[72],"NVIDIA":[73],"GPUs.":[74],"Our":[75],"approach":[76],"uses":[77],"a":[78],"low-level":[79],"assembly-language":[80],"instrumentation":[81,95],"SASSI":[84,90],"profile":[86],"inject":[88,108,117,133],"errors.":[89],"provides":[91,104],"efficiency":[92],"allowing":[94],"code":[96,125],"execute":[98],"entirely":[99],"ability":[106],"into":[109,135],"different":[110],"architecture-visible":[111],"state.":[112],"For":[113],"example,":[114],"can":[116,131,160],"general-purpose":[120],"registers,":[121,126],"memory,":[123],"condition":[124],"predicate":[128],"registers.":[129],"also":[132],"addresses":[136],"register":[138],"indices.":[139],"In":[140],"this":[141],"paper,":[142],"we":[143],"describe":[144],"tool,":[147],"its":[148],"capabilities,":[149],"present":[151],"experiments":[152],"illustrate":[154],"some":[155],"analyses":[158],"be":[161],"used":[162],"perform.":[164]},"counts_by_year":[{"year":2026,"cited_by_count":7},{"year":2025,"cited_by_count":11},{"year":2024,"cited_by_count":13},{"year":2023,"cited_by_count":22},{"year":2022,"cited_by_count":22},{"year":2021,"cited_by_count":23},{"year":2020,"cited_by_count":23},{"year":2019,"cited_by_count":23},{"year":2018,"cited_by_count":23},{"year":2017,"cited_by_count":5}],"updated_date":"2026-07-17T09:13:05.818461","created_date":"2025-10-10T00:00:00"}