{"id":"https://openalex.org/W2088773460","doi":"https://doi.org/10.1109/ispacs.2013.6704581","title":"Design of a floating-type impedance scaling circuit for large capacitances","display_name":"Design of a floating-type impedance scaling circuit for large capacitances","publication_year":2013,"publication_date":"2013-11-01","ids":{"openalex":"https://openalex.org/W2088773460","doi":"https://doi.org/10.1109/ispacs.2013.6704581","mag":"2088773460"},"language":"en","primary_location":{"id":"doi:10.1109/ispacs.2013.6704581","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ispacs.2013.6704581","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 International Symposium on Intelligent Signal Processing and Communication Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108248192","display_name":"Fujihiko Matsumoto","orcid":null},"institutions":[{"id":"https://openalex.org/I443798","display_name":"National Defense Academy of Japan","ror":"https://ror.org/05xszy717","country_code":"JP","type":"education","lineage":["https://openalex.org/I443798"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Fujihiko Matsumoto","raw_affiliation_strings":["Department of Applied Physics, National Defense Academy, Yokosuka, Japan","Dept. of Appl. Phys., National Defense Acad., Yokosuka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Applied Physics, National Defense Academy, Yokosuka, Japan","institution_ids":["https://openalex.org/I443798"]},{"raw_affiliation_string":"Dept. of Appl. Phys., National Defense Acad., Yokosuka, Japan","institution_ids":["https://openalex.org/I443798"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102323740","display_name":"Tatsuya Fujii","orcid":null},"institutions":[{"id":"https://openalex.org/I443798","display_name":"National Defense Academy of Japan","ror":"https://ror.org/05xszy717","country_code":"JP","type":"education","lineage":["https://openalex.org/I443798"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tatsuya Fujii","raw_affiliation_strings":["Department of Applied Physics, National Defense Academy, Yokosuka, Japan","Dept. of Appl. Phys., National Defense Acad., Yokosuka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Applied Physics, National Defense Academy, Yokosuka, Japan","institution_ids":["https://openalex.org/I443798"]},{"raw_affiliation_string":"Dept. of Appl. Phys., National Defense Acad., Yokosuka, Japan","institution_ids":["https://openalex.org/I443798"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045532381","display_name":"Syuzo Nishioka","orcid":null},"institutions":[{"id":"https://openalex.org/I443798","display_name":"National Defense Academy of Japan","ror":"https://ror.org/05xszy717","country_code":"JP","type":"education","lineage":["https://openalex.org/I443798"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Syuzo Nishioka","raw_affiliation_strings":["Department of Applied Physics, National Defense Academy, Yokosuka, Japan","Dept. of Appl. Phys., National Defense Acad., Yokosuka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Applied Physics, National Defense Academy, Yokosuka, Japan","institution_ids":["https://openalex.org/I443798"]},{"raw_affiliation_string":"Dept. of Appl. Phys., National Defense Acad., Yokosuka, Japan","institution_ids":["https://openalex.org/I443798"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041395444","display_name":"Tomomi Abe","orcid":null},"institutions":[{"id":"https://openalex.org/I443798","display_name":"National Defense Academy of Japan","ror":"https://ror.org/05xszy717","country_code":"JP","type":"education","lineage":["https://openalex.org/I443798"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tomomi Abe","raw_affiliation_strings":["Department of Applied Physics, National Defense Academy, Yokosuka, Japan","Dept. of Appl. Phys., National Defense Acad., Yokosuka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Applied Physics, National Defense Academy, Yokosuka, Japan","institution_ids":["https://openalex.org/I443798"]},{"raw_affiliation_string":"Dept. of Appl. Phys., National Defense Acad., Yokosuka, Japan","institution_ids":["https://openalex.org/I443798"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017802591","display_name":"Takeshi Ohbuchi","orcid":"https://orcid.org/0000-0002-4174-5987"},"institutions":[{"id":"https://openalex.org/I443798","display_name":"National Defense Academy of Japan","ror":"https://ror.org/05xszy717","country_code":"JP","type":"education","lineage":["https://openalex.org/I443798"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takeshi Ohbuchi","raw_affiliation_strings":["Department of Applied Physics, National Defense Academy, Yokosuka, Japan","Dept. of Appl. Phys., National Defense Acad., Yokosuka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Applied Physics, National Defense Academy, Yokosuka, Japan","institution_ids":["https://openalex.org/I443798"]},{"raw_affiliation_string":"Dept. of Appl. Phys., National Defense Acad., Yokosuka, Japan","institution_ids":["https://openalex.org/I443798"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6155,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.70999161,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"391","last_page":"396"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9871000051498413,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9871000051498413,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11034","display_name":"Digital Filter Design and Implementation","score":0.9391000270843506,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9042999744415283,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/digital-biquad-filter","display_name":"Digital biquad filter","score":0.6599810719490051},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6409269571304321},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6089231967926025},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.548905611038208},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.5149813294410706},{"id":"https://openalex.org/keywords/high-impedance","display_name":"High impedance","score":0.5095203518867493},{"id":"https://openalex.org/keywords/low-pass-filter","display_name":"Low-pass filter","score":0.4770890176296234},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44358348846435547},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.4392244219779968},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.42167648673057556},{"id":"https://openalex.org/keywords/output-impedance","display_name":"Output impedance","score":0.4163356423377991},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.4120689034461975},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.40810006856918335},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2804400622844696},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14162737131118774},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11249884963035583},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.07754293084144592}],"concepts":[{"id":"https://openalex.org/C14455310","wikidata":"https://www.wikidata.org/wiki/Q5276043","display_name":"Digital biquad filter","level":4,"score":0.6599810719490051},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6409269571304321},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6089231967926025},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.548905611038208},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.5149813294410706},{"id":"https://openalex.org/C174268685","wikidata":"https://www.wikidata.org/wiki/Q769127","display_name":"High impedance","level":3,"score":0.5095203518867493},{"id":"https://openalex.org/C44682112","wikidata":"https://www.wikidata.org/wiki/Q918242","display_name":"Low-pass filter","level":3,"score":0.4770890176296234},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44358348846435547},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.4392244219779968},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.42167648673057556},{"id":"https://openalex.org/C58112919","wikidata":"https://www.wikidata.org/wiki/Q631203","display_name":"Output impedance","level":3,"score":0.4163356423377991},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.4120689034461975},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.40810006856918335},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2804400622844696},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14162737131118774},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11249884963035583},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.07754293084144592},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ispacs.2013.6704581","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ispacs.2013.6704581","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 International Symposium on Intelligent Signal Processing and Communication Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7599999904632568}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2115856895","https://openalex.org/W2144694654","https://openalex.org/W2147737645"],"related_works":["https://openalex.org/W2133624256","https://openalex.org/W2124339642","https://openalex.org/W3149709731","https://openalex.org/W3000365547","https://openalex.org/W2350683098","https://openalex.org/W1547838047","https://openalex.org/W2313215289","https://openalex.org/W4361829833","https://openalex.org/W3049237463","https://openalex.org/W2386783477"],"abstract_inverted_index":{"Impedance":[0],"scaling":[1,38],"technique":[2,22],"is":[3,58],"known":[4],"as":[5],"a":[6,32,35,63],"method":[7],"to":[8,46],"reduce":[9],"chip":[10],"area":[11],"of":[12,34,54,62],"large":[13],"capacitances":[14],"for":[15],"low":[16,26,48],"frequency":[17,49],"integrated":[18],"filters.":[19],"The":[20,40,52],"conventional":[21],"realizes":[23],"only":[24],"grounded":[25],"impedance":[27,37],"components.":[28],"This":[29],"paper":[30],"proposes":[31],"construction":[33],"floating-type":[36],"circuit.":[39,69],"proposed":[41,56,68],"circuit":[42,57],"can":[43],"be":[44],"applied":[45],"various":[47],"analog":[50],"circuits.":[51],"validity":[53],"the":[55,67],"confirmed":[59],"by":[60],"simulation":[61],"biquad":[64],"filter":[65],"employing":[66]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}