{"id":"https://openalex.org/W4281738615","doi":"https://doi.org/10.1109/isoen54820.2022.9789643","title":"Optimal Bias Conditions for FET-type Gas Sensors to Minimize Current Fluctuations","display_name":"Optimal Bias Conditions for FET-type Gas Sensors to Minimize Current Fluctuations","publication_year":2022,"publication_date":"2022-05-29","ids":{"openalex":"https://openalex.org/W4281738615","doi":"https://doi.org/10.1109/isoen54820.2022.9789643"},"language":"en","primary_location":{"id":"doi:10.1109/isoen54820.2022.9789643","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isoen54820.2022.9789643","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Olfaction and Electronic Nose (ISOEN)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057392027","display_name":"Gyuweon Jung","orcid":"https://orcid.org/0000-0003-0357-0933"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Gyuweon Jung","raw_affiliation_strings":["Seoul National University,Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center,Seoul,Korea,08826"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Seoul National University,Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center,Seoul,Korea,08826","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101800060","display_name":"Jaehyeon Kim","orcid":"https://orcid.org/0000-0002-0712-1628"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaehyeon Kim","raw_affiliation_strings":["Seoul National University,Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center,Seoul,Korea,08826"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Seoul National University,Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center,Seoul,Korea,08826","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003829010","display_name":"Wonjun Shin","orcid":"https://orcid.org/0000-0001-9122-2458"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Wonjun Shin","raw_affiliation_strings":["Seoul National University,Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center,Seoul,Korea,08826"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Seoul National University,Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center,Seoul,Korea,08826","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046403430","display_name":"Seongbin Hong","orcid":"https://orcid.org/0000-0002-6719-7608"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seongbin Hong","raw_affiliation_strings":["Seoul National University,Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center,Seoul,Korea,08826"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Seoul National University,Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center,Seoul,Korea,08826","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003092782","display_name":"Yujeong Jeong","orcid":"https://orcid.org/0009-0001-4462-0266"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yujeong Jeong","raw_affiliation_strings":["Seoul National University,Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center,Seoul,Korea,08826"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Seoul National University,Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center,Seoul,Korea,08826","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100330080","display_name":"Jinwoo Park","orcid":"https://orcid.org/0000-0001-9074-2152"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jinwoo Park","raw_affiliation_strings":["Seoul National University,Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center,Seoul,Korea,08826"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Seoul National University,Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center,Seoul,Korea,08826","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100414809","display_name":"Donghee Kim","orcid":"https://orcid.org/0000-0003-1779-0419"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Donghee Kim","raw_affiliation_strings":["Seoul National University,Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center,Seoul,Korea,08826"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Seoul National University,Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center,Seoul,Korea,08826","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037130341","display_name":"Kangwook Choi","orcid":null},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kangwook Choi","raw_affiliation_strings":["Seoul National University,Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center,Seoul,Korea,08826"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Seoul National University,Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center,Seoul,Korea,08826","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100423381","display_name":"Jong\u2010Ho Lee","orcid":"https://orcid.org/0000-0003-3559-9802"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jong-Ho Lee","raw_affiliation_strings":["Seoul National University,Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center,Seoul,Korea,08826"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Seoul National University,Department of Electrical and Computer Engineering and Inter-University Semiconductor Research Center,Seoul,Korea,08826","institution_ids":["https://openalex.org/I139264467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0923,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.390502,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"17","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11667","display_name":"Advanced Chemical Sensor Technologies","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.452523410320282},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.39680635929107666},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3886089622974396},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.35695981979370117},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3477248549461365},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3096718490123749},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.21361595392227173},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14165890216827393}],"concepts":[{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.452523410320282},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.39680635929107666},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3886089622974396},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.35695981979370117},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3477248549461365},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3096718490123749},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.21361595392227173},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14165890216827393}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/isoen54820.2022.9789643","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isoen54820.2022.9789643","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Olfaction and Electronic Nose (ISOEN)","raw_type":"proceedings-article"},{"id":"pmh:oai:s-space.snu.ac.kr:10371/185786","is_oa":false,"landing_page_url":"https://hdl.handle.net/10371/185786","pdf_url":null,"source":{"id":"https://openalex.org/S4306401345","display_name":"Seoul National University Open Repository (Seoul National University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139264467","host_organization_name":"Seoul National University","host_organization_lineage":["https://openalex.org/I139264467"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5299999713897705,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G7405235365","display_name":null,"funder_award_id":"2021R1A2C3009069","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2319969158","https://openalex.org/W2754359629","https://openalex.org/W2997220363","https://openalex.org/W3015477481","https://openalex.org/W3037085950","https://openalex.org/W3131039411","https://openalex.org/W3132064819"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2935759653","https://openalex.org/W3105167352","https://openalex.org/W54078636","https://openalex.org/W2954470139","https://openalex.org/W1501425562","https://openalex.org/W2902782467","https://openalex.org/W3084825885","https://openalex.org/W2298861036"],"abstract_inverted_index":{"In":[0],"this":[1,50],"work,":[2],"we":[3],"introduce":[4],"a":[5,29,46,74],"method":[6],"to":[7,52,60],"improve":[8],"gas":[9,14,61,68,71],"detection":[10],"characteristics":[11],"of":[12,80,182,186],"FET-type":[13],"sensors":[15],"by":[16,193],"using":[17],"optimal":[18],"operation":[19],"bias":[20],"conditions":[21],"while":[22],"maintaining":[23],"the":[24,33,40,53,77,81,90,95,98,101,105,111,113,119,121,127,129,134,137,161,179,183,187],"same":[25],"sensing":[26,30,41],"material.":[27,42],"When":[28],"material":[31],"chemisorbs":[32],"gas,":[34],"effective":[35],"charges":[36,44],"are":[37],"formed":[38],"on":[39,89],"These":[43],"induce":[45],"potential":[47],"change,":[48],"transmitting":[49],"change":[51,58,75],"Si":[54],"channel.":[55],"The":[56,70,93],"current":[57,64,86,96,130,188],"due":[59],"reaction":[62,72],"and":[63,83,118],"fluctuations":[65,87],"both":[66],"affect":[67],"detection.":[69],"causes":[73,84],"in":[76,136],"threshold":[78],"voltage":[79],"sensor":[82,102,135],"different":[85],"depending":[88],"operating":[91,133],"region.":[92],"smaller":[94,120,128],"fluctuation,":[97],"more":[99],"accurately":[100],"can":[103,190],"detect":[104],"gas.":[106],"It":[107],"is":[108],"observed":[109],"that":[110],"larger":[112],"V":[114,122,145,152,172],"<inf":[115,123,141,146,153,165,173],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[116,124,142,147,154,166,174],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">CG</inf>":[117,143,167],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DS</inf>":[125,155,175],",":[126],"fluctuation.":[131],"By":[132],"linear":[138],"region":[139,163],"(V":[140,164],"=":[144,156,168,176],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">th</inf>":[148],"+":[149],"1.2":[150],"V,":[151,171],"0.1":[157,177],"V)":[158],"rather":[159],"than":[160],"subthreshold":[162],"Vth-":[169],"0.3":[170],"V),":[178],"standard":[180],"deviation":[181],"Gaussian":[184],"distribution":[185],"fluctuation":[189],"be":[191],"reduced":[192],"~100":[194],"times.":[195]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}